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Recent progress in computer‐aided materials design for compound semiconductors
J. Appl. Phys. 77, 4845–4886 (1995)
https://doi.org/10.1063/1.359360
Collection of athermal phonons into doped Ge thermistors using quasiparticle trapping
J. Appl. Phys. 77, 4887–4891 (1995)
https://doi.org/10.1063/1.359292
Lifetime measurement of the B2∑+u level of N+2 by laser‐induced fluorescence
J. Appl. Phys. 77, 4899–4902 (1995)
https://doi.org/10.1063/1.359294
Gain and current‐density calculation in IV–VI quantum well lasers
J. Appl. Phys. 77, 4927–4930 (1995)
https://doi.org/10.1063/1.359298
Polarization dependence of the absorption coefficient for an array of strained quantum wires
J. Appl. Phys. 77, 4931–4934 (1995)
https://doi.org/10.1063/1.359553
Complex electro‐optic constants of dye‐doped polymer films determined with a Mach–Zehnder interferometer
J. Appl. Phys. 77, 4935–4940 (1995)
https://doi.org/10.1063/1.359299
Effects of walk‐off and group velocity difference on the optical parametric generation in KTiOPO4 crystals
J. Appl. Phys. 77, 4941–4947 (1995)
https://doi.org/10.1063/1.359300
Study of C2F6 overetch induced damage and the effects of overetch on subsequent SiCl4 etch of GaAs/AlGaAs
J. Appl. Phys. 77, 4961–4966 (1995)
https://doi.org/10.1063/1.359303
X‐ray diagnostics of plasma focus DPF‐78 discharge with heavy‐gas admixtures
J. Appl. Phys. 77, 4973–4978 (1995)
https://doi.org/10.1063/1.359305
Measurements of reduced‐density air channels produced by a double‐pulsed electron beam
J. Appl. Phys. 77, 4979–4983 (1995)
https://doi.org/10.1063/1.359306
Photoconductivity evolution due to carrier trapping by defects in 17 MeV‐proton irradiated silicon
J. Appl. Phys. 77, 4984–4992 (1995)
https://doi.org/10.1063/1.359307
Amorphous alloy formation by mechanical alloying and consecutive heat treatment in Fe50B50 powder mixture
J. Appl. Phys. 77, 4997–5003 (1995)
https://doi.org/10.1063/1.359522
X‐ray study of elastic and plastic strains in Na+‐implanted (001) monocrystalline MgO
J. Appl. Phys. 77, 5004–5007 (1995)
https://doi.org/10.1063/1.359309
Radiation hardening of pure‐silica‐core optical fibers by ultra‐high‐dose γ‐ray pre‐irradiation
J. Appl. Phys. 77, 5008–5013 (1995)
https://doi.org/10.1063/1.359310
Gettering effects in BF2‐implanted Si(100) by ion‐beam defect engineering
J. Appl. Phys. 77, 5014–5019 (1995)
https://doi.org/10.1063/1.359311
Nucleation of crystalline phases in plastically deformed amorphous NiZr
J. Appl. Phys. 77, 5020–5025 (1995)
https://doi.org/10.1063/1.359598
Study of deep levels in alpha‐irradiated silver‐doped p‐type silicon
J. Appl. Phys. 77, 5050–5059 (1995)
https://doi.org/10.1063/1.359313
Yielding and phase transition under shock compression of yttria‐doped cubic zirconia single crystal and polycrystal
J. Appl. Phys. 77, 5060–5068 (1995)
https://doi.org/10.1063/1.359314
Shock wave mechanics in porous ceramic assemblies
J. Appl. Phys. 77, 5077–5085 (1995)
https://doi.org/10.1063/1.359316
Phase stability and transformations in pure and lanthanum modified lead zirconate ceramics
J. Appl. Phys. 77, 5086–5094 (1995)
https://doi.org/10.1063/1.359317
Radiation of acoustic phonons from quantum wires
J. Appl. Phys. 77, 5095–5097 (1995)
https://doi.org/10.1063/1.359318
Novel oscillating cup viscometer–application to molten HgTe and Hg0.8Cd0.2Te
J. Appl. Phys. 77, 5098–5102 (1995)
https://doi.org/10.1063/1.359319
Diffusion of boron, lithium, oxygen, hydrogen, and nitrogen in type IIa natural diamond
J. Appl. Phys. 77, 5103–5106 (1995)
https://doi.org/10.1063/1.359320
Stability of C54 titanium germanosilicide on a silicon‐germanium alloy substrate
J. Appl. Phys. 77, 5107–5114 (1995)
https://doi.org/10.1063/1.359321
Effect of H2 dilution on the growth of low temperature as‐deposited poly‐Si films using SiF4/SiH4/H2 plasma
J. Appl. Phys. 77, 5115–5118 (1995)
https://doi.org/10.1063/1.359554
Bias induced diamond nucleation studies on refractory metal substrates
J. Appl. Phys. 77, 5119–5124 (1995)
https://doi.org/10.1063/1.359322
Oxidation of H‐terminated Si(100) surfaces studied by high‐resolution electron energy loss spectroscopy
J. Appl. Phys. 77, 5125–5129 (1995)
https://doi.org/10.1063/1.359323
Control of composition and structure for molybdenum nitride films synthesized using ion beam assisted deposition
J. Appl. Phys. 77, 5138–5143 (1995)
https://doi.org/10.1063/1.359257
Investigation of titanium silicide formation in Ti+Si reactions using infrared spectroscopy and x‐ray diffraction
J. Appl. Phys. 77, 5156–5159 (1995)
https://doi.org/10.1063/1.359260
Solid‐phase epitaxial regrowth and dopant activation of P‐implanted metastable pseudomorphic Ge0.12Si0.88 on Si(100)
J. Appl. Phys. 77, 5160–5166 (1995)
https://doi.org/10.1063/1.359261
Desorption of ultraviolet‐ozone oxides from InP under phosphorus and arsenic overpressures
J. Appl. Phys. 77, 5167–5172 (1995)
https://doi.org/10.1063/1.359262
Polycrystalline interlayer formed by deposition of thin‐film iridium on silicon
J. Appl. Phys. 77, 5173–5175 (1995)
https://doi.org/10.1063/1.359263
The adhesion of metallic films to laser‐irradiated alumina
J. Appl. Phys. 77, 5176–5179 (1995)
https://doi.org/10.1063/1.359264
Electrostatic deformation in band profiles of InP‐based strained‐layer quantum‐well lasers
J. Appl. Phys. 77, 5180–5184 (1995)
https://doi.org/10.1063/1.359265
Photoconductivity of gallium arsenide epitaxial layers
J. Appl. Phys. 77, 5185–5190 (1995)
https://doi.org/10.1063/1.359266
Space charges of different mobilities: A novel data processing method
J. Appl. Phys. 77, 5195–5200 (1995)
https://doi.org/10.1063/1.359267
Detailed investigation of a nonradiative recombination center in Si by electrically detected magnetic resonance
J. Appl. Phys. 77, 5201–5207 (1995)
https://doi.org/10.1063/1.359268
Supralinear photoconductivity of copper doped semi‐insulating gallium arsenide
J. Appl. Phys. 77, 5208–5214 (1995)
https://doi.org/10.1063/1.359269
Transport mechanism of spray pyrolytic‐grown indium tin oxide/indium phosphide junctions
J. Appl. Phys. 77, 5220–5224 (1995)
https://doi.org/10.1063/1.359271
A materials study of PtTiGePd ohmic contacts to p+‐AlGaAs as a function of annealing temperature
J. Appl. Phys. 77, 5225–5230 (1995)
https://doi.org/10.1063/1.359272
Fabrication of inherently stable and adjustable contacts of atomic size
J. Appl. Phys. 77, 5231–5236 (1995)
https://doi.org/10.1063/1.359273
Electrical and metallurgical behavior of Au/Zn contacts to p‐type indium phosphide
J. Appl. Phys. 77, 5241–5247 (1995)
https://doi.org/10.1063/1.359275
Optical intervalence‐subband transitions in strained p‐type In1−xGaxAs/InP quantum wells
J. Appl. Phys. 77, 5256–5262 (1995)
https://doi.org/10.1063/1.359277
Epitaxial nucleation and growth of chemically derived Ba2YCu3O7−x thin films on (001) SrTiO3
J. Appl. Phys. 77, 5263–5272 (1995)
https://doi.org/10.1063/1.359278
Magnetic and transport measurements of Tl‐1223 superconductors
D. N. Zheng; J. D. Johnson; A. R. Jones; A. M. Campbell; W. Y. Liang; T. Doi; M. Okada; K. Higashyama
J. Appl. Phys. 77, 5287–5292 (1995)
https://doi.org/10.1063/1.359282
Rapid thermal annealing of amorphous and nanocrystalline soft‐magnetic alloys in a static magnetic field
J. Appl. Phys. 77, 5293–5297 (1995)
https://doi.org/10.1063/1.359283
Method of measuring anisotropy field of a recording medium investigated by computer simulation
J. Appl. Phys. 77, 5303–5308 (1995)
https://doi.org/10.1063/1.359285
The dielectric dispersion of insulating films with long‐range movements of charge carriers
J. Appl. Phys. 77, 5314–5321 (1995)
https://doi.org/10.1063/1.359287
Piezoresistivity modeling of grain‐boundary junctions in positive temperature coefficient of resistivity BaTiO3
J. Appl. Phys. 77, 5322–5334 (1995)
https://doi.org/10.1063/1.359288
Dielectric spectroscopy of Ba(B1/2′B1/2″)O3 complex perovskite ceramics: Correlations between ionic parameters and microwave dielectric properties. I. Infrared reflectivity study (1012–1014 Hz)
Rudolf Zurmühlen; Jan Petzelt; Stanislav Kamba; Valentin V. Voitsekhovskii; Enrico Colla; Nava Setter
J. Appl. Phys. 77, 5341–5350 (1995)
https://doi.org/10.1063/1.359597
Dielectric spectroscopy of Ba(B1/2′B1/2″)O3 complex perovskite ceramics: Correlations between ionic parameters and microwave dielectric properties. II. Studies below the phonon eigenfrequencies (102–1012 Hz)
Rudolf Zurmühlen; Jan Petzelt; Stanislav Kamba; Gennadii Kozlov; Alexander Volkov; Boris Gorshunov; Dinesh Dube; Alexander Tagantsev; Nava Setter
J. Appl. Phys. 77, 5351–5364 (1995)
https://doi.org/10.1063/1.359290
Evolution of photoluminescence of porous silicon under light exposure
J. Appl. Phys. 77, 5365–5368 (1995)
https://doi.org/10.1063/1.359291
A spectroscopic ellipsometry study of cerium dioxide thin films grown on sapphire by rf magnetron sputtering
J. Appl. Phys. 77, 5369–5376 (1995)
https://doi.org/10.1063/1.359225
Optical properties of Zn1−xMgxSySe1−y epitaxial layers for blue‐green laser applications
J. Appl. Phys. 77, 5377–5380 (1995)
https://doi.org/10.1063/1.359226
Luminescent Sr1−xErxF2+x thin films grown on InP(100) substrates. I. Growth and physico‐chemical characterizations
J. Appl. Phys. 77, 5381–5387 (1995)
https://doi.org/10.1063/1.359227
Luminescent Sr1−xErxF2+x thin films grown on InP(100) substrates. II. Optical properties
J. Appl. Phys. 77, 5388–5393 (1995)
https://doi.org/10.1063/1.359228
Effect of hydrogenation and thermal annealing on the photoluminescence of p‐InP
J. Appl. Phys. 77, 5398–5405 (1995)
https://doi.org/10.1063/1.359230
Velocity distributions of ions in the ablation plume of a Y1Ba2Cu3Ox target
J. Appl. Phys. 77, 5406–5410 (1995)
https://doi.org/10.1063/1.359231
Photon‐assisted oxidation of the GaAs(100) surface using water at 90 K
J. Appl. Phys. 77, 5411–5417 (1995)
https://doi.org/10.1063/1.359232
Atomic force microscopy and Raman spectroscopy studies on the oxidation of Cu thin films
J. Appl. Phys. 77, 5422–5425 (1995)
https://doi.org/10.1063/1.359234
Formation of amorphous Zr‐Al‐Cu‐Ni with a large supercooled liquid region by mechanical alloying
J. Appl. Phys. 77, 5446–5448 (1995)
https://doi.org/10.1063/1.359239
Epitaxial thin films and heterostructures of a copper‐oxide‐based isotropic metallic oxide (La8−xSrxCu8O20)
J. Appl. Phys. 77, 5449–5451 (1995)
https://doi.org/10.1063/1.359240
Investigation of thermomagnetic recording on MnBiAl films and observation of their recorded domains
J. Appl. Phys. 77, 5452–5454 (1995)
https://doi.org/10.1063/1.359241
Identification of plasma‐sheath resonances in a parallel‐plate plasma reactor
J. Appl. Phys. 77, 5455–5457 (1995)
https://doi.org/10.1063/1.359242
CdTe nanostructures prepared by thermal annealing
J. Appl. Phys. 77, 5461–5463 (1995)
https://doi.org/10.1063/1.359244
Laser induced pyrolytic deposition of copper from (hexafluoroacetylacetonate)(trimethylvinylsilane) copper
J. Appl. Phys. 77, 5464–5466 (1995)
https://doi.org/10.1063/1.359245
1.5 MeV ion‐channel guided x‐band free‐electron laser amplifier
J. Appl. Phys. 77, 5467–5469 (1995)
https://doi.org/10.1063/1.359246
Effects of excess oxygen on the properties of reactively sputtered RuOx thin films
J. Appl. Phys. 77, 5473–5475 (1995)
https://doi.org/10.1063/1.359595
Empirical temperature dependence of the refractive index of semiconductors
J. Appl. Phys. 77, 5476–5477 (1995)
https://doi.org/10.1063/1.359248
Effects of an impurity sheet in the well on resonant tunneling in double‐barrier structures
J. Appl. Phys. 77, 5478–5480 (1995)
https://doi.org/10.1063/1.359249
LiTaO3 crystal periodically poled by applying an external pulsed field
Shi‐ning Zhu; Yong‐yuan Zhu; Zhi‐yong Zhang; Hong Shu; Hai‐feng Wang; Jing‐fen Hong; Chuan‐zhen Ge; Nai‐ben Ming
J. Appl. Phys. 77, 5481–5483 (1995)
https://doi.org/10.1063/1.359250
A step-by-step guide to perform x-ray photoelectron spectroscopy
Grzegorz Greczynski, Lars Hultman
Scaling effects on the microstructure and thermomechanical response of through silicon vias (TSVs)
Shuhang Lyu, Thomas Beechem, et al.