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Characterization of x rays emitted from 351‐nm laser‐produced plasmas for x‐ray shadowgraphy
J. Appl. Phys. 67, 2693–2699 (1990)
https://doi.org/10.1063/1.345486
Range profiles of Xe+ and Xe2+ of energy 50 to 400 keV in quartz crystal
J. Appl. Phys. 67, 2700–2703 (1990)
https://doi.org/10.1063/1.345487
Three‐dimensional analysis of a heat‐spreading phenomenon in phase‐locked arrays of oxide‐isolated diode lasers
J. Appl. Phys. 67, 2711–2715 (1990)
https://doi.org/10.1063/1.345459
Mixture‐dependent electron densities in x‐ray preionized Ne‐Xe‐HCl mixtures
J. Appl. Phys. 67, 2716–2724 (1990)
https://doi.org/10.1063/1.345460
Transverse effects in optical bistability with the nonlinear Fabry–Pérot étalon: A new theoretical approach
J. Appl. Phys. 67, 2725–2730 (1990)
https://doi.org/10.1063/1.345436
Three‐dimensional analysis of overwritable phase‐change optical disks
J. Appl. Phys. 67, 2731–2735 (1990)
https://doi.org/10.1063/1.345437
Optimal determination of the elastic constants of composite materials from ultrasonic wave‐speed measurements
J. Appl. Phys. 67, 2753–2761 (1990)
https://doi.org/10.1063/1.345441
Defect creation by 10‐keV electron irradiation in phosphorous‐doped a‐Si:H
J. Appl. Phys. 67, 2800–2805 (1990)
https://doi.org/10.1063/1.345446
Thermal redistribution of iron implanted in Czochralski silicon
J. Appl. Phys. 67, 2806–2809 (1990)
https://doi.org/10.1063/1.345447
Monte Carlo simulation for the ion implantation of silicide heterostructures
J. Appl. Phys. 67, 2810–2814 (1990)
https://doi.org/10.1063/1.345448
Properties and mechanism of photochromism in reduced calcium aluminate glasses
J. Appl. Phys. 67, 2840–2847 (1990)
https://doi.org/10.1063/1.345453
Mg implant activation and diffusion in GaAs during rapid thermal annealing in arsine ambient
J. Appl. Phys. 67, 2857–2861 (1990)
https://doi.org/10.1063/1.345456
The effective thermal conductivity of composites reinforced by coated cylindrically orthotropic fibers
J. Appl. Phys. 67, 2878–2884 (1990)
https://doi.org/10.1063/1.345463
Preparation of diamondlike carbon films by electron cyclotron resonance chemical vapor deposition
J. Appl. Phys. 67, 2890–2893 (1990)
https://doi.org/10.1063/1.345428
Explosive silicidation in nickel/amorphous‐silicon multilayer thin films
J. Appl. Phys. 67, 2894–2898 (1990)
https://doi.org/10.1063/1.345429
Solid phase reactions and change in stress of TiN/Ti/Si for a diffusion barrier
J. Appl. Phys. 67, 2899–2903 (1990)
https://doi.org/10.1063/1.345430
High‐temperature ion beam synthesis of cubic SiC
J. Appl. Phys. 67, 2908–2912 (1990)
https://doi.org/10.1063/1.346092
Zn diffusion‐enhanced disordering and ordering of InGaAsP/InP quantum well structures
J. Appl. Phys. 67, 2919–2926 (1990)
https://doi.org/10.1063/1.345410
X‐ray diffraction determination of the effect of various passivations on stress in metal films and patterned lines
J. Appl. Phys. 67, 2927–2931 (1990)
https://doi.org/10.1063/1.345411
Electrical transport properties of Au‐doped polycrystalline silicon: Hole trapping effect
J. Appl. Phys. 67, 2965–2968 (1990)
https://doi.org/10.1063/1.345416
Hole drift mobility in organopolysilane doped with trap‐forming organic compounds
J. Appl. Phys. 67, 2974–2979 (1990)
https://doi.org/10.1063/1.345418
Impact ionization avalanche breakdown in short crystal regions of p‐Ge
J. Appl. Phys. 67, 2980–2984 (1990)
https://doi.org/10.1063/1.345419
The self‐biased heterojunction effect of ferroelectric thin film on silicon substrate
J. Appl. Phys. 67, 2985–2991 (1990)
https://doi.org/10.1063/1.345420
Study of resonant tunneling structures: A hybrid incremental Airy function plane‐wave approach
J. Appl. Phys. 67, 3011–3017 (1990)
https://doi.org/10.1063/1.345423
Plasma nitridation process for the fabrication of all‐refractory Josephson junctions
J. Appl. Phys. 67, 3038–3042 (1990)
https://doi.org/10.1063/1.345432
Optical response of nongranular high‐Tc Y1Ba2Cu3O7−x superconducting thin films
J. Appl. Phys. 67, 3054–3068 (1990)
https://doi.org/10.1063/1.345435
CO2‐laser ablation of Bi‐Sr‐Ca‐Cu oxide by millisecond pulse lengths
J. Appl. Phys. 67, 3069–3071 (1990)
https://doi.org/10.1063/1.345406
Interparticle correlations in Fe3O4 ferrofluids, studied by the small‐angle neutron scattering technique
J. Appl. Phys. 67, 3072–3080 (1990)
https://doi.org/10.1063/1.345407
Ferromagnetic resonance of single‐crystal YIG/gadolinium gallium garnet/YIG layers
J. Appl. Phys. 67, 3088–3092 (1990)
https://doi.org/10.1063/1.345383
Optical properties of submicrometer‐size silver spheroids formed on a graphite substrate
J. Appl. Phys. 67, 3093–3096 (1990)
https://doi.org/10.1063/1.345384
Transport properties and infrared spectra of CuCl thin films
J. Appl. Phys. 67, 3097–3101 (1990)
https://doi.org/10.1063/1.345385
Optical determination of Si conduction‐band nonparabolicity
J. Appl. Phys. 67, 3102–3106 (1990)
https://doi.org/10.1063/1.345386
Doping and crystallographic effects in Cl‐atom etching of silicon
J. Appl. Phys. 67, 3115–3120 (1990)
https://doi.org/10.1063/1.345388
Phase determination and spatial distribution of an ion‐beam mixed internal interface: Fe/Sn
J. Appl. Phys. 67, 3121–3131 (1990)
https://doi.org/10.1063/1.345389
An analytical charge control model for AlGaAs modulation‐doped field effect transistors
J. Appl. Phys. 67, 3141–3147 (1990)
https://doi.org/10.1063/1.345392
Ultrasonic motor operation using the unidirectional surface displacement of a cylindrical piezoelectric vibrator
J. Appl. Phys. 67, 3148–3151 (1990)
https://doi.org/10.1063/1.345393
Surface sensitivity and bias dependence of narrow‐gap metal‐semiconductor‐metal photodetectors
J. Appl. Phys. 67, 3152–3162 (1990)
https://doi.org/10.1063/1.345394
Room‐temperature reaction of a Ni/Bi2Sr2CaCu2O8 interface
P. S. Asoka Kumar; Shailaja Mahumuni; Pramada Kulkarni; I. S. Mulla; M. Chandrachood; A. P. B. Sinha; A. S. Nigavekar; S. K. Kulkarni
J. Appl. Phys. 67, 3184–3187 (1990)
https://doi.org/10.1063/1.345400
Optical nonlinear effects in GaAs/GaAlAs Bragg reflectors
J. Appl. Phys. 67, 3190–3191 (1990)
https://doi.org/10.1063/1.345402
Lateral‐mode discrimination in broad‐area semiconductor lasers with a smooth spatially filtering output facet
J. Appl. Phys. 67, 3192–3194 (1990)
https://doi.org/10.1063/1.345403
Dielectric waveguide with a YBa2Cu3O6+x boundary layer at 94 GHz
J. Appl. Phys. 67, 3194–3196 (1990)
https://doi.org/10.1063/1.345404
The effect of concentration‐dependent defect recombination reactions on phosphorus diffusion in silicon
J. Appl. Phys. 67, 3197–3199 (1990)
https://doi.org/10.1063/1.345405
An experimental and theoretical investigation of electrostatically charged, falling droplet pairs
J. Appl. Phys. 67, 3201–3204 (1990)
https://doi.org/10.1063/1.345376
A step-by-step guide to perform x-ray photoelectron spectroscopy
Grzegorz Greczynski, Lars Hultman
Piezoelectric thin films and their applications in MEMS: A review
Jinpeng Liu, Hua Tan, et al.
Decoding diffraction and spectroscopy data with machine learning: A tutorial
D. Vizoso, R. Dingreville