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Nd:LNA laser optical pumping of 4He: Application to space magnetometers
J. Appl. Phys. 64, 6615–6617 (1988)
https://doi.org/10.1063/1.342042
Current multiplication during relativistic electron‐beam propagation in a subTorr‐pressure gas
J. Appl. Phys. 64, 6626–6630 (1988)
https://doi.org/10.1063/1.342044
Effects of stress on threshold, wavelength, and polarization of the output of InGaAsP semiconductor diode lasers
J. Appl. Phys. 64, 6631–6638 (1988)
https://doi.org/10.1063/1.342045
Investigation of collisional effects in the plasma erosion opening switch
J. Appl. Phys. 64, 6646–6653 (1988)
https://doi.org/10.1063/1.342050
Characterization of layer‐tilted state in ferroelectric liquid‐crystal cells by electro‐optical switchings
J. Appl. Phys. 64, 6654–6661 (1988)
https://doi.org/10.1063/1.342019
An investigation of magnesium in indium phosphide grown by molecular‐beam epitaxy
J. Appl. Phys. 64, 6662–6667 (1988)
https://doi.org/10.1063/1.342020
The effects of gas ambients on the formation of surface and bulk defects in silicon
J. Appl. Phys. 64, 6673–6678 (1988)
https://doi.org/10.1063/1.342022
Photorefractive measurement of photoionization and recombination cross sections in InP:Fe
J. Appl. Phys. 64, 6684–6689 (1988)
https://doi.org/10.1063/1.342024
Stress relaxation during thermal cycling in metal/polyimide layered films
J. Appl. Phys. 64, 6690–6698 (1988)
https://doi.org/10.1063/1.341999
The contrastive behavior of Fe and Cr during the intrinsic gettering of silicon
J. Appl. Phys. 64, 6716–6720 (1988)
https://doi.org/10.1063/1.342002
The high‐temperature stability of chemically vapor‐deposited tungsten‐silicon couples rapid thermal annealed in ammonia and argon
E. K. Broadbent; A. E. Morgan; J. M. Flanner; B. Coulman; D. K. Sadana; B. J. Burrow; R. C. Ellwanger
J. Appl. Phys. 64, 6721–6726 (1988)
https://doi.org/10.1063/1.342003
Effects of misfit dislocations and thermally induced strain on the film properties of heteroepitaxial GaAs on Si
J. Appl. Phys. 64, 6727–6732 (1988)
https://doi.org/10.1063/1.342004
X‐ray and Raman characterization of AlSb/GaSb strained layer superlattices and quasiperiodic Fibonacci lattices
J. Appl. Phys. 64, 6733–6745 (1988)
https://doi.org/10.1063/1.342005
Thickness‐dependent formation of Gd‐silicide compounds
J. Appl. Phys. 64, 6746–6749 (1988)
https://doi.org/10.1063/1.342006
Homoepitaxial growth of ZnTe by low‐pressure metalorganic vapor phase epitaxy
J. Appl. Phys. 64, 6750–6753 (1988)
https://doi.org/10.1063/1.342007
Substituting low‐energy (<30 eV) ion bombardment for elevated temperature in silicon epitaxy
J. Appl. Phys. 64, 6754–6760 (1988)
https://doi.org/10.1063/1.342008
Domination of the thermionic‐field emission in the reverse I‐V characteristics of n‐type GaAs Schottky contacts
J. Appl. Phys. 64, 6780–6784 (1988)
https://doi.org/10.1063/1.342012
In situ x‐ray photoemission studies of the oxidation of Y‐Ba‐Cu films
J. Appl. Phys. 64, 6799–6802 (1988)
https://doi.org/10.1063/1.342016
Effects of deposition angle on perpendicular anisotropy and internal stress in evaporated TbFeCo films
J. Appl. Phys. 64, 6803–6805 (1988)
https://doi.org/10.1063/1.342017
Electroreflectance and wavelength‐modulated reflectivity measurements of Zn1−xMnxTe mixed crystals
J. Appl. Phys. 64, 6815–6818 (1988)
https://doi.org/10.1063/1.341995
Light wave interference during laser drilling of polymer coatings
J. Appl. Phys. 64, 6819–6822 (1988)
https://doi.org/10.1063/1.342510
Temporal contraction of solitons in a nonuniform transmission line
J. Appl. Phys. 64, 6836–6838 (1988)
https://doi.org/10.1063/1.341998
Raman scattering characterization of high‐quality Cd1−xMnxTe films grown by metalorganic chemical vapor deposition
J. Appl. Phys. 64, 6861–6863 (1988)
https://doi.org/10.1063/1.341977
Analysis of mechanism for resonant tunneling via localized states in thin SiO2 films
J. Appl. Phys. 64, 6867–6870 (1988)
https://doi.org/10.1063/1.341980
Atom diffusion and impurity‐induced layer disordering in quantum well III‐V semiconductor heterostructures
J. Appl. Phys. 64, R93–R113 (1988)
https://doi.org/10.1063/1.341981
A step-by-step guide to perform x-ray photoelectron spectroscopy
Grzegorz Greczynski, Lars Hultman
Piezoelectric thin films and their applications in MEMS: A review
Jinpeng Liu, Hua Tan, et al.
Decoding diffraction and spectroscopy data with machine learning: A tutorial
D. Vizoso, R. Dingreville