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Dielectric relaxation studies in n‐butyl‐4,5,7‐trinitrofluorenone‐2‐carboxylate/LexanR polycarbonate solid solutions
J. Appl. Phys. 47, 4245–4250 (1976)
https://doi.org/10.1063/1.322448
Thermally stimulated discharge in polymer electrets: Compatibility and impurity effects
J. Appl. Phys. 47, 4251–4254 (1976)
https://doi.org/10.1063/1.322449
Time dependence of small‐angle x‐ray measurements on segmented polyurethanes following thermal treatment
J. Appl. Phys. 47, 4261–4264 (1976)
https://doi.org/10.1063/1.322451
Rayleigh‐Brillouin light‐scattering studies on atactic polystrene
J. Appl. Phys. 47, 4271–4277 (1976)
https://doi.org/10.1063/1.322453
Application of the Dugdale model to crazing and fracture in rubber‐modified polystyrene
J. Appl. Phys. 47, 4289–4294 (1976)
https://doi.org/10.1063/1.322455
Iterative approaches describing atomic diffusion in finite single‐ and two‐phase systems
J. Appl. Phys. 47, 4325–4335 (1976)
https://doi.org/10.1063/1.322434
Acoustic characteristics of twinning in indium
J. Appl. Phys. 47, 4343–4348 (1976)
https://doi.org/10.1063/1.322436
Detection and origins of crystal defects in GaAs/GaAlAs LPE layers
J. Appl. Phys. 47, 4349–4352 (1976)
https://doi.org/10.1063/1.322437
Nucleation and growth of an epitaxial monolayer of Cd on Ge(111): A simultaneous RHEED–molecular‐beam study
J. Appl. Phys. 47, 4359–4363 (1976)
https://doi.org/10.1063/1.322439
Grain‐boundary diffusion in thin films. II. Multiple grain boundaries and surface diffusion
J. Appl. Phys. 47, 4373–4380 (1976)
https://doi.org/10.1063/1.322441
Photoinduced discharge in sulfur single crystals using strongly and weakly absorbed light
J. Appl. Phys. 47, 4381–4383 (1976)
https://doi.org/10.1063/1.322442
Fast‐rising magnetic field with long pulse duration—a new technical concept for large plasma experiments
J. Appl. Phys. 47, 4430–4432 (1976)
https://doi.org/10.1063/1.322406
Interpretation of an optically thick resonance line emitted from laser‐heated spherical plasmas
J. Appl. Phys. 47, 4433–4436 (1976)
https://doi.org/10.1063/1.322407
Surface enrichment of copper due to keV Xe sputtering of an Al‐Cu mixture
J. Appl. Phys. 47, 4500–4503 (1976)
https://doi.org/10.1063/1.322420
Measurement and analysis of temperature‐dependent rf impedance of discontinuous metal films on glass substrates
J. Appl. Phys. 47, 4504–4508 (1976)
https://doi.org/10.1063/1.322421
Traveling‐wave corona excitation of high‐power uv nitrogen lasers operating at gas pressures ranging from 0 to 3 bar
J. Appl. Phys. 47, 4532–4534 (1976)
https://doi.org/10.1063/1.322424
Soft x‐ray population inversion by resonant photoexcitation in multicomponent laser plasmas
J. Appl. Phys. 47, 4535–4537 (1976)
https://doi.org/10.1063/1.322425
Electron temperature measurements in a copper chloride laser utilizing a microwave radiometer
J. Appl. Phys. 47, 4538–4542 (1976)
https://doi.org/10.1063/1.322426
Atmospheric‐pressure H2‐F2 laser initiated by electron‐beam‐irradiated discharge
J. Appl. Phys. 47, 4543–4545 (1976)
https://doi.org/10.1063/1.322427
Liquid‐phase epitaxial growth of 6H‐SiC by the dipping technique for preparation of blue‐light‐emitting diodes
J. Appl. Phys. 47, 4546–4550 (1976)
https://doi.org/10.1063/1.322428
Determination of interface and bulk‐trap states of IGFET’s using deep‐level transient spectroscopy
J. Appl. Phys. 47, 4574–4577 (1976)
https://doi.org/10.1063/1.322381
Comparison of experimental and theoretical carrier concentrations in heavily doped n‐type silicon
J. Appl. Phys. 47, 4590–4592 (1976)
https://doi.org/10.1063/1.322383
Interface state density and oxide charge measurements on the metal–anodic‐oxide‐InSb system
J. Appl. Phys. 47, 4605–4610 (1976)
https://doi.org/10.1063/1.322386
Thermally induced changes of CuxS films and effect on CdS‐CuxS solar‐cell response
J. Appl. Phys. 47, 4621–4626 (1976)
https://doi.org/10.1063/1.322388
Composition versus a0 and Tc relations in superconducting ’’Nb3Ge’’ thin films
J. Appl. Phys. 47, 4635–4642 (1976)
https://doi.org/10.1063/1.322391
Passive secondary magnetic damping for superconducting Maglev vehicles
J. Appl. Phys. 47, 4643–4648 (1976)
https://doi.org/10.1063/1.322392
Low‐field magnetic properties of Fe80B20 glass
J. Appl. Phys. 47, 4660–4662 (1976)
https://doi.org/10.1063/1.322395
Dependence of surface recombination velocity of InSb on temperature and α bombardment dose
J. Appl. Phys. 47, 4693–4696 (1976)
https://doi.org/10.1063/1.322364
Optimization of the statistical accuracy of the SANDYL transport code and comparison with an experiment by Motz
J. Appl. Phys. 47, 4697–4698 (1976)
https://doi.org/10.1063/1.322365
Optical absorption in semiconducting vanadium zinc borate glasses prepared by sputtering
J. Appl. Phys. 47, 4701–4702 (1976)
https://doi.org/10.1063/1.322367
The effect of oxygen adsorption on the thermionic emission properties of BaB6
J. Appl. Phys. 47, 4708 (1976)
https://doi.org/10.1063/1.322370
Erratum: Nondestructive inspection of transparent microtargets for laser fusion
J. Appl. Phys. 47, 4712 (1976)
https://doi.org/10.1063/1.322372
Re-examination of important defect complexes in silicon: From microelectronics to quantum computing
P. P. Filippatos, A. Chroneos, et al.
Tutorial: Simulating modern magnetic material systems in mumax3
Jonas J. Joos, Pedram Bassirian, et al.
Piezoelectric thin films and their applications in MEMS: A review
Jinpeng Liu, Hua Tan, et al.