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Correlation and convolution of bulk acoustic waves in nonpiezoelectric solids
J. Appl. Phys. 46, 2384–2389 (1975)
https://doi.org/10.1063/1.321918
Influence of surface energy anisotropy on morphological changes occurring by surface diffusion
J. Appl. Phys. 46, 2390–2397 (1975)
https://doi.org/10.1063/1.322222
Bleustein wave reflection and bulk wave generation by an electrode of finite dimensions
J. Appl. Phys. 46, 2406–2415 (1975)
https://doi.org/10.1063/1.321909
Photoemission electron microscopy of oxide fracture at slip steps on metals
J. Appl. Phys. 46, 2429–2432 (1975)
https://doi.org/10.1063/1.322224
Damping of elastic surface waves by density fluctuation on solid surfaces
J. Appl. Phys. 46, 2445–2447 (1975)
https://doi.org/10.1063/1.322227
Multi‐control‐volume analysis of elastic and plastic wave fronts in composite materials
J. Appl. Phys. 46, 2448–2455 (1975)
https://doi.org/10.1063/1.322228
Energy dissipation in a thin polymer film by electron beam scattering: Experiment
J. Appl. Phys. 46, 2528–2537 (1975)
https://doi.org/10.1063/1.321929
Reduction of cw laser melt‐through times in solid materials by transverse gas flow
J. Appl. Phys. 46, 2538–2543 (1975)
https://doi.org/10.1063/1.321930
Stored energy function and compressibility of compressible rubberlike materials under large strain
J. Appl. Phys. 46, 2599–2604 (1975)
https://doi.org/10.1063/1.321936
Mean free path of hot electrons at the surface of boron‐doped silicon
J. Appl. Phys. 46, 2612–2619 (1975)
https://doi.org/10.1063/1.321938
Effect of dislocations on green electroluminescence efficiency in GaP grown by liquid phase epitaxy
J. Appl. Phys. 46, 2629–2637 (1975)
https://doi.org/10.1063/1.321941
A correlation method for semiconductor transient signal measurements
J. Appl. Phys. 46, 2638–2644 (1975)
https://doi.org/10.1063/1.321896
Study on the anomalously high photovoltaic effect in germanium thin films
J. Appl. Phys. 46, 2650–2657 (1975)
https://doi.org/10.1063/1.321898
Temperature coefficient of resistance in ultrathin metal films
J. Appl. Phys. 46, 2658–2661 (1975)
https://doi.org/10.1063/1.321899
Theory and interpretation of the field‐effect conductance experiment in amorphous silicon
J. Appl. Phys. 46, 2662–2669 (1975)
https://doi.org/10.1063/1.321900
Temperature dependence of the band gap and comparison with the threshold frequency of pure GaAs lasers
J. Appl. Phys. 46, 2683–2689 (1975)
https://doi.org/10.1063/1.321903
Nondestructive inspection of transparent microtargets for laser fusion
J. Appl. Phys. 46, 2693–2700 (1975)
https://doi.org/10.1063/1.321905
Glow discharge optical spectroscopy for microvolume elemental analysis
J. Appl. Phys. 46, 2701–2709 (1975)
https://doi.org/10.1063/1.321906
A highly sensitive reversible and nonvolatile hybrid photoconductive/magneto‐optic storage material
J. Appl. Phys. 46, 2733–2736 (1975)
https://doi.org/10.1063/1.321947
Electron radiography using liquid absorbers
J. Appl. Phys. 46, 2766–2767 (1975)
https://doi.org/10.1063/1.321954
Calibration of the pressure dependence of the R1 ruby fluorescence line to 195 kbar
J. Appl. Phys. 46, 2774–2780 (1975)
https://doi.org/10.1063/1.321957
A spontaneous current from the metal(1) ‐polymer‐metal(2) system
J. Appl. Phys. 46, 2796–2798 (1975)
https://doi.org/10.1063/1.321920
Control of the uniaxial magnetic anisotropy in LPE‐grown iron garnet films by small ruthenium substitutions
J. Appl. Phys. 46, 2801–2803 (1975)
https://doi.org/10.1063/1.321922
Effect of elastic uniaxial strain on the electrical resistance of In2Bi single‐crystal whiskers
J. Appl. Phys. 46, 2806–2807 (1975)
https://doi.org/10.1063/1.321924
Erratum: Lorentz electron microscopy of domain walls in single‐crystal evaporated iron films
J. Appl. Phys. 46, 2813 (1975)
https://doi.org/10.1063/1.322283
Re-examination of important defect complexes in silicon: From microelectronics to quantum computing
P. P. Filippatos, A. Chroneos, et al.
Tutorial: Simulating modern magnetic material systems in mumax3
Jonas J. Joos, Pedram Bassirian, et al.
Piezoelectric thin films and their applications in MEMS: A review
Jinpeng Liu, Hua Tan, et al.