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Issues
November 1968
ISSN 0021-8979
EISSN 1089-7550
In this Issue
Chemical Bonding Studies of Silicates and Oxides by X‐Ray K‐Emission Spectroscopy
J. Appl. Phys. 39, 5377–5384 (1968)
https://doi.org/10.1063/1.1655986
Magnetic‐Field Dependence of Josephson Current Modified by Self‐Field
J. Appl. Phys. 39, 5396–5400 (1968)
https://doi.org/10.1063/1.1655988
The Rice and Walsh Equation of State for Water: Discussion, Limitations, and Extensions
J. Appl. Phys. 39, 5412–5421 (1968)
https://doi.org/10.1063/1.1655991
Thickness Estimation of Carbon Films by Electron Microscopy of Transverse Sections and Optical Density Measurements
J. Appl. Phys. 39, 5421–5424 (1968)
https://doi.org/10.1063/1.1655992
Impurity‐Dislocation Interaction and Repeated Yielding in a Commercial Al Alloy
J. Appl. Phys. 39, 5434–5440 (1968)
https://doi.org/10.1063/1.1655994
Effect of 50 MeV Electrons of the Ultimate Fermi Level in Germanium
J. Appl. Phys. 39, 5498–5502 (1968)
https://doi.org/10.1063/1.1656002
Three‐Dimensional Orientation Distribution Function of Crystals in Cold‐Rolled Copper
J. Appl. Phys. 39, 5503–5514 (1968)
https://doi.org/10.1063/1.1656003
Effects of an Electric Field on the Diffusion Flux of Argon‐40 from KCl and Microcline Feldspar
J. Appl. Phys. 39, 5515–5518 (1968)
https://doi.org/10.1063/1.1656004
Domain Structure and the Influence of Growth Defects in Single Crystals of Yttrium Iron Garnet
J. Appl. Phys. 39, 5521–5526 (1968)
https://doi.org/10.1063/1.1656006
Oxygen Surface‐Density Measurements Based on Characteristic X‐Ray Production by 100‐keV Protons
J. Appl. Phys. 39, 5538–5541 (1968)
https://doi.org/10.1063/1.1656009
Preparation, Structure, and Properties of Sputtered, Highly Nitrided Tantalum Films
J. Appl. Phys. 39, 5585–5593 (1968)
https://doi.org/10.1063/1.1656019
A Peak‐Stress Gauge for Determining the Yield of Underground Nuclear Detonations
J. Appl. Phys. 39, 5609–5612 (1968)
https://doi.org/10.1063/1.1656024
Optical Properties of the Group IV Elements Carbon and Silicon in Gallium Phosphide
J. Appl. Phys. 39, 5631–5646 (1968)
https://doi.org/10.1063/1.1656027
Surface‐Structure Analysis by Optical Simulation of LEED Patterns
J. Appl. Phys. 39, 5658–5668 (1968)
https://doi.org/10.1063/1.1656030
The Diffusion of Lead and Bismuth into Single Crystals of Undoped and Bismuth‐Doped Lead Sulfide at 700°C
J. Appl. Phys. 39, 5686–5693 (1968)
https://doi.org/10.1063/1.1656033
Orientation Dependence of Pitting and Blistering in Proton‐Irradiated Aluminum Crystals
J. Appl. Phys. 39, 5714–5717 (1968)
https://doi.org/10.1063/1.1656037
Anomalies of the Energy of Positive Ions Extracted from High‐Frequency Ion Sources. A Theoretical Study
J. Appl. Phys. 39, 5723–5726 (1968)
https://doi.org/10.1063/1.1656039
Elastic Constants of Molybdenum‐Rich Rhenium Alloys in the Temperature Range −190°C to +100°C
J. Appl. Phys. 39, 5768–5775 (1968)
https://doi.org/10.1063/1.1656047
Beam‐Induced Contrast in the Electron‐Microscope Images of Polymers as Observed in Ultrathin Sections
J. Appl. Phys. 39, 5776–5781 (1968)
https://doi.org/10.1063/1.1656048
Frequency Conversion in the Sheath Capacitance of a Glow Discharge Plasma
J. Appl. Phys. 39, 5782–5791 (1968)
https://doi.org/10.1063/1.1656049
COMMUNICATIONS
A step-by-step guide to perform x-ray photoelectron spectroscopy
Grzegorz Greczynski, Lars Hultman
Piezoelectric thin films and their applications in MEMS: A review
Jinpeng Liu, Hua Tan, et al.
Decoding diffraction and spectroscopy data with machine learning: A tutorial
D. Vizoso, R. Dingreville