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Issues
November 1966
ISSN 0021-8979
EISSN 1089-7550
In this Issue
Temperature Dependence of Dynamical Electron Diffraction Intensities of Polycrystalline Foils
J. Appl. Phys. 37, 4303–4308 (1966)
https://doi.org/10.1063/1.1708032
Injection of Intense, Large‐Diameter Ion Beams into Low‐Density Gases
J. Appl. Phys. 37, 4317–4319 (1966)
https://doi.org/10.1063/1.1708035
Dispersion and Damping of Oscillations in Maxwellian Plasmas with Nonuniform Zero‐Order Densities
J. Appl. Phys. 37, 4367–4372 (1966)
https://doi.org/10.1063/1.1708044
Role of Condensation Phenomena in the Measurement of Film Thickness by the Oscillating Quartz Crystal Method
J. Appl. Phys. 37, 4433–4436 (1966)
https://doi.org/10.1063/1.1708055
Effect of Deformation‐Induced Crystal Imperfections on Magnetocrystalline Anisotropy of Nickel Single Crystals
J. Appl. Phys. 37, 4443–4450 (1966)
https://doi.org/10.1063/1.1708058
Minimum‐Energy Trajectory Method for Constructing Hysteresis Loops for N Coupled Films
J. Appl. Phys. 37, 4451–4454 (1966)
https://doi.org/10.1063/1.1708059
Effect of Sample Thickness and Operating Voltage on the Contrast of Kossel Transmission Photographs
J. Appl. Phys. 37, 4455–4458 (1966)
https://doi.org/10.1063/1.1708060
Dislocation Etch Pits in Single‐Crystal and Poly crystalline Beryllium Oxide
J. Appl. Phys. 37, 4483–4486 (1966)
https://doi.org/10.1063/1.1708065
Comparison of Electron‐Radiation Damage Thresholds of Silver at Liquid‐Helium and Liquid‐Nitrogen Temperatures
J. Appl. Phys. 37, 4517–4518 (1966)
https://doi.org/10.1063/1.1708072
Cation Self‐Diffusion and Electrical Conductivity in Polycrystalline Beryllium Oxide
J. Appl. Phys. 37, 4543–4549 (1966)
https://doi.org/10.1063/1.1708077
Surface Wave Instability in Helicon Wave Propagation. III. Theory of Multilayered Structures
J. Appl. Phys. 37, 4551–4556 (1966)
https://doi.org/10.1063/1.1708079
COMMUNICATIONS
Flux Jumps in a Hard Superconductor in Superimposed ac and dc Magnetic Fields
J. Appl. Phys. 37, 4582–4583 (1966)
https://doi.org/10.1063/1.1708085
Domain Structure and Curie Temperature of Single‐Crystal Lithium Tantalate
J. Appl. Phys. 37, 4585–4586 (1966)
https://doi.org/10.1063/1.1708088
Measurement of the Distribution and Total Rate of Molecular Flow through High‐Vacuum Components
J. Appl. Phys. 37, 4594–4595 (1966)
https://doi.org/10.1063/1.1708097
A step-by-step guide to perform x-ray photoelectron spectroscopy
Grzegorz Greczynski, Lars Hultman
Tutorial: Simulating modern magnetic material systems in mumax3
Jonas J. Joos, Pedram Bassirian, et al.
Piezoelectric thin films and their applications in MEMS: A review
Jinpeng Liu, Hua Tan, et al.