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Issues
February 1962
ISSN 0021-8979
EISSN 1089-7550
In this Issue
Susceptibility of Ferromagnets in a Strong rf Magnetic Field Applied Parallel to the dc Field
J. Appl. Phys. 33, 535–537 (1962)
https://doi.org/10.1063/1.1702462
Point Defects in p‐Type Germanium as Introduced by Deformation, Quenching, and Electron Bombardment
J. Appl. Phys. 33, 600–605 (1962)
https://doi.org/10.1063/1.1702473
X‐Ray Diffraction Analysis of Crystallite Size and Lattice Strain in Tungsten Wire
J. Appl. Phys. 33, 708–712 (1962)
https://doi.org/10.1063/1.1702492
Theory of Extended Dislocations in Symmetry Directions in Anisotropic Infinite Crystals and Thin Plates
J. Appl. Phys. 33, 729–733 (1962)
https://doi.org/10.1063/1.1702496
Gaseous Optical Maser with External Concave Mirrors
J. Appl. Phys. 33, 743–744 (1962)
https://doi.org/10.1063/1.1702499
LETTERS TO THE EDITOR
Method for Measuring Thermal Diffusivities in Small Semiconducting Samples
J. Appl. Phys. 33, 765–766 (1962)
https://doi.org/10.1063/1.1702525
A step-by-step guide to perform x-ray photoelectron spectroscopy
Grzegorz Greczynski, Lars Hultman
Piezoelectric thin films and their applications in MEMS: A review
Jinpeng Liu, Hua Tan, et al.
Decoding diffraction and spectroscopy data with machine learning: A tutorial
D. Vizoso, R. Dingreville