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Issues
December 1961
ISSN 0021-8979
EISSN 1089-7550
In this Issue
Electron Microscope Investigation on the Nature of Tracks of Fission Products in Mica
J. Appl. Phys. 32, 2499–2503 (1961)
https://doi.org/10.1063/1.1728339
Magnetic Investigation of Pure Manganese and of Several of its Alloys
J. Appl. Phys. 32, 2506–2512 (1961)
https://doi.org/10.1063/1.1728341
Improved Representation of Calculated Surface Mobilities in Semiconductors. I. Minority Carriers
J. Appl. Phys. 32, 2538–2539 (1961)
https://doi.org/10.1063/1.1728347
Improved Representation of Calculated Surface Mobilities in Semiconductors. II. Majority Carriers
J. Appl. Phys. 32, 2540–2541 (1961)
https://doi.org/10.1063/1.1728348
A cw Solid State, Push‐Pull Maser in the 5 to 6 Millimeter Wavelength Region
J. Appl. Phys. 32, 2541–2542 (1961)
https://doi.org/10.1063/1.1728349
A Method for the Measurement of Short Minority Carrier Diffusion Lengths in Semiconductors
J. Appl. Phys. 32, 2550–2552 (1961)
https://doi.org/10.1063/1.1728351
Theory of the Potential Well Produced by Multipacting Electrons. I. Very Low‐Pressure Regime
J. Appl. Phys. 32, 2553–2558 (1961)
https://doi.org/10.1063/1.1728352
High‐Temperature Kilocycle Internal Friction in Al2O3 Single Crystals
J. Appl. Phys. 32, 2573–2579 (1961)
https://doi.org/10.1063/1.1728356
High‐Field Conductivity in Germanium and Silicon at Microwave Frequencies
J. Appl. Phys. 32, 2606–2611 (1961)
https://doi.org/10.1063/1.1728360
Space‐Charge Instabilities in Electron Diodes and Plasma Converters
J. Appl. Phys. 32, 2611–2618 (1961)
https://doi.org/10.1063/1.1728361
Voltage Dependence of Microplasma Density in p‐n Junctions in Silicon
J. Appl. Phys. 32, 2646–2650 (1961)
https://doi.org/10.1063/1.1728366
LETTERS TO THE EDITOR
A step-by-step guide to perform x-ray photoelectron spectroscopy
Grzegorz Greczynski, Lars Hultman
Distinct deformation mechanisms of silicate glasses under nanoindentation: The critical role of structure
Ziming Yan, Ranran Lu, et al.
Tutorial: Simulating modern magnetic material systems in mumax3
Jonas J. Joos, Pedram Bassirian, et al.