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Metal-assisted chemically etched silicon nanopillars hosting telecom photon emitters
Selective amorphization of SiGe in Si/SiGe nanostructures via high energy Si+ implant
Volumetric tri-modal imaging with combined photoacoustic, ultrasound, and shear wave elastography
Off-axis Raman spectroscopy for nanoscale stress metrology
The growth and nanothermite reaction of 2Al/3NiO multilayer thin films
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ARTICLES
Photonics, Plasmonics, Lasers, Optical Materials and Phenomena
Metal-assisted chemically etched silicon nanopillars hosting telecom photon emitters

Michael Hollenbach; Nagesh S. Jagtap; Ciarán Fowley; Juan Baratech; Verónica Guardia-Arce; Ulrich Kentsch; Anna Eichler-Volf; Nikolay V. Abrosimov; Artur Erbe; ChaeHo Shin; Hakseong Kim; Manfred Helm; Woo Lee; Georgy V. Astakhov; Yonder Berencén
J. Appl. Phys. 132, 033101 (2022)
https://doi.org/10.1063/5.0094715
Segmentation and accurate identification of large carious lesions on high quality x-ray images based on Attentional U-Net model. A proof of concept study
In Special Collection:
Non-Invasive and Non-Destructive Methods and Applications Part II
J. Appl. Phys. 132, 033103 (2022)
https://doi.org/10.1063/5.0084593
Dielectrics, Ferroelectrics, and Multiferroics
Physics of Nanoscale and Low-Dimensional Systems
Selective amorphization of SiGe in Si/SiGe nanostructures via high energy Si+ implant
In Special Collection:
Radiation Effects in Materials
Emily M. Turner; Quinn Campbell; Ibrahim Avci; William J. Weber; Ping Lu; George T. Wang; Kevin S. Jones
J. Appl. Phys. 132, 034301 (2022)
https://doi.org/10.1063/5.0094185
Modeling of a vertical tunneling transistor based on Gr-hBN-χ3 borophene heterostructure
J. Appl. Phys. 132, 034302 (2022)
https://doi.org/10.1063/5.0092647
Quantum Physics and Technology
Physics of Devices and Sensors
Soft Matter, Fluids, and Biophysics
Emerging, Interdisciplinary, and Other Fields of Applied Physics
Design and evaluation of a dual-beam read/write configuration for optical storage
J. Appl. Phys. 132, 034901 (2022)
https://doi.org/10.1063/5.0096274
Volumetric tri-modal imaging with combined photoacoustic, ultrasound, and shear wave elastography

In Special Collection:
Non-Invasive and Non-Destructive Methods and Applications Part I — Festschrift
J. Appl. Phys. 132, 034902 (2022)
https://doi.org/10.1063/5.0093619
Physics of Materials, Including Electrical, Thermal, Mechanical and Other Properties
Defect levels in CsPbCl3 single crystals determined by thermally stimulated current spectroscopy
J. Appl. Phys. 132, 035101 (2022)
https://doi.org/10.1063/5.0091519
Electrical and structural properties of binary Ga–Sb phase change memory alloys
Rubab Ume; Haibo Gong; Vadim Tokranov; Michael Yakimov; Kevin Brew; Guy Cohen; Christian Lavoie; Sandra Schujman; Jing Liu; Anatoly I. Frenkel; Karsten Beckmann; Nathaniel Cady; Serge Oktyabrsky
J. Appl. Phys. 132, 035103 (2022)
https://doi.org/10.1063/5.0096022
Off-axis Raman spectroscopy for nanoscale stress metrology
In Special Collection:
2022 Early Career Investigator Selection
J. Appl. Phys. 132, 035104 (2022)
https://doi.org/10.1063/5.0100602
Novel fractal acoustic metamaterials (FAMs) for multiple narrow-band near-perfect absorption
J. Appl. Phys. 132, 035105 (2022)
https://doi.org/10.1063/5.0093128
Thin Films, Interfaces, and Surfaces
Revisiting W–ZrC interfaces: A first principles study
J. Appl. Phys. 132, 035301 (2022)
https://doi.org/10.1063/5.0092008
Preferential sublimation along threading dislocations in InGaN/GaN single quantum well for improved photoluminescence
B. Damilano; S. Vézian; M. P. Chauvat; P. Ruterana; N. Amador-Mendez; S. Collin; M. Tchernycheva; P. Valvin; B. Gil
J. Appl. Phys. 132, 035302 (2022)
https://doi.org/10.1063/5.0089892
Surface segregation and relaxation in free-standing Ni1–xCux alloy nanofilms
J. Appl. Phys. 132, 035303 (2022)
https://doi.org/10.1063/5.0094921
Tailoring resistive switching in epitaxial SrCoO2.5 films by irradiation induced uniaxial strain
In Special Collection:
Radiation Effects in Materials
Xuepeng Xiang; Jingjing Rao; Zuyun He; Mengzhen Zhou; Qicheng Huang; Yuan Gao; Zhen Fan; Xinwei Wang; Yan Chen
J. Appl. Phys. 132, 035304 (2022)
https://doi.org/10.1063/5.0099200
The growth and nanothermite reaction of 2Al/3NiO multilayer thin films
Michael J. Abere; Matthew T. Beason; Robert V. Reeves; Mark A. Rodriguez; Paul G. Kotula; Catherine E. Sobczak; Steven F. Son; Cole D. Yarrington; David P. Adams
J. Appl. Phys. 132, 035305 (2022)
https://doi.org/10.1063/5.0096787
Physics of Semiconductors
Point defect creation by proton and carbon irradiation of α-Ga2O3
In Special Collection:
Radiation Effects in Materials
Alexander Y. Polyakov; Vladimir I. Nikolaev; Igor N. Meshkov; Krzysztof Siemek; Petr B. Lagov; Eugene B. Yakimov; Alexei I. Pechnikov; Oleg S. Orlov; Alexey A. Sidorin; Sergey I. Stepanov; Ivan V. Shchemerov; Anton A. Vasilev; Alexey V. Chernykh; Anton A. Losev; Alexandr D. Miliachenko; Igor A. Khrisanov; Yu.S. Pavlov; U. A. Kobets; Stephen J. Pearton
J. Appl. Phys. 132, 035701 (2022)
https://doi.org/10.1063/5.0100359
Model for elimination of lifetime-limiting carbon vacancy defects in SiC by thermal treatment
J. Appl. Phys. 132, 035702 (2022)
https://doi.org/10.1063/5.0094963
Physics of Matter under Extreme Conditions
Deviatoric stress driven transient melting below the glass transition temperature in shocked polymers
J. Appl. Phys. 132, 035901 (2022)
https://doi.org/10.1063/5.0095731
A step-by-step guide to perform x-ray photoelectron spectroscopy
Grzegorz Greczynski, Lars Hultman
Tutorial: Simulating modern magnetic material systems in mumax3
Jonas J. Joos, Pedram Bassirian, et al.
Piezoelectric thin films and their applications in MEMS: A review
Jinpeng Liu, Hua Tan, et al.