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PERSPECTIVES
Electrical spectroscopy methods for the characterization of defects in thin-film compound solar cells
J. Appl. Phys. 131, 240901 (2022)
https://doi.org/10.1063/5.0085963
TUTORIALS
Tutorial: Piezoelectric and magnetoelectric N/MEMS—Materials, devices, and applications
A. R. Will-Cole; Ahmed E. Hassanien; Sila Deniz Calisgan; Min-Gyo Jeong; Xianfeng Liang; Sungho Kang; Vageeswar Rajaram; Isabel Martos-Repath; Huaihao Chen; Antea Risso; Zhenyun Qian; Seyed Mahdi Seyed Abrishami; Nader Lobandi; Matteo Rinaldi; Songbin Gong; Nian X. Sun
J. Appl. Phys. 131, 241101 (2022)
https://doi.org/10.1063/5.0094364
ARTICLES
Photonics, Plasmonics, Lasers, Optical Materials and Phenomena
Exceptional point shifted by Kerr effect in anti-parity-time symmetry system
Tuoyu Chen; Zhisong Xiao; Shuo Jiang; Wenxiu Li; Jincheng Li; Yuefei Wang; Xiaochen Wang; Anping Huang; Hao Zhang
J. Appl. Phys. 131, 243101 (2022)
https://doi.org/10.1063/5.0094917
Electrical Discharges, Plasmas, and Plasma-Surface Interactions
Time-of-flight mass spectrometry diagnostics in deep oscillation magnetron sputtering (DOMS) of titanium
Masaomi Sanekata; Yuki Nakagomi; Mutsuki Hirayama; Hiroshi Nishida; Nobuo Nishimiya; Masahide Tona; Hiroaki Yamamoto; Keizo Tsukamoto; Kiyokazu Fuke; Keijiro Ohshimo; Kiichirou Koyasu; Fuminori Misaizu
J. Appl. Phys. 131, 243301 (2022)
https://doi.org/10.1063/5.0089592
Ion-induced charge emission from unpolished surfaces bombarded by an [Emim][BF4] electrospray plume
In Special Collection:
Physics of Electric Propulsion
J. Appl. Phys. 131, 243302 (2022)
https://doi.org/10.1063/5.0060615
Simulation of the microwave propagation through the plume of a Hall thruster integrated on small spacecraft
J. Appl. Phys. 131, 243303 (2022)
https://doi.org/10.1063/5.0095134
Energy, angle, and temperature dependencies of the sticking of D atoms on Li surfaces
J. Appl. Phys. 131, 243304 (2022)
https://doi.org/10.1063/5.0096816
Magnetism, Spintronics, and Superconductivity
Investigation of magnetic properties of Pt/CoFeB/MgO layers using angle-resolved spin-torque ferromagnetic resonance spectroscopy
In Special Collection:
2022 Early Career Investigator Selection
Deok Hyun Yun; TaeHyuk Kwon; Ki-Hyuk Han; Dong Joon Lee; Seokmin Hong; Hyun Cheol Koo; Byoung-Chul Min; Byeong-Kwon Ju; OukJae Lee
J. Appl. Phys. 131, 243904 (2022)
https://doi.org/10.1063/5.0087919
Dielectrics, Ferroelectrics, and Multiferroics
Physics of Nanoscale and Low-Dimensional Systems
Probabilistic description for quasiparticle heat transport in one-dimensional nanostructures
J. Appl. Phys. 131, 244302 (2022)
https://doi.org/10.1063/5.0093218
Physics of Devices and Sensors
A method for infrared sensing based on oscillating zero power microelectromechanical photoswitches
J. Appl. Phys. 131, 244501 (2022)
https://doi.org/10.1063/5.0092412
Acoustic superscatterer enables remote mitigation of underwater source radiation
J. Appl. Phys. 131, 244502 (2022)
https://doi.org/10.1063/5.0099846
Threshold voltage instability and hysteresis in gamma-rays irradiated 4H-SiC junction field effect transistors
In Special Collection:
Radiation Effects in Materials
J. Appl. Phys. 131, 244503 (2022)
https://doi.org/10.1063/5.0095841
Soft Matter, Fluids, and Biophysics
Asymmetric transmission and coherent perfect absorption in a periodic array of thermoacoustic cells
J. Appl. Phys. 131, 244701 (2022)
https://doi.org/10.1063/5.0089989
Emerging, Interdisciplinary, and Other Fields of Applied Physics
Classification of computed thermal tomography images with deep learning convolutional neural network
In Special Collection:
Non-Invasive and Non-Destructive Methods and Applications Part II
J. Appl. Phys. 131, 244901 (2022)
https://doi.org/10.1063/5.0089072
Physics of Materials, Including Electrical, Thermal, Mechanical and Other Properties
Processes related to phototransfer under blue- and green-light illumination in annealed Al2O3:C,Mg
J. Appl. Phys. 131, 245101 (2022)
https://doi.org/10.1063/5.0094547
Stress inversion in waveguides with arbitrary cross sections with acoustoelastic guided waves
J. Appl. Phys. 131, 245102 (2022)
https://doi.org/10.1063/5.0098025
Sensing depths in frequency domain thermoreflectance
J. Appl. Phys. 131, 245103 (2022)
https://doi.org/10.1063/5.0088594
Laser ultrasound imaging of mechanical stresses near holes and indented areas: Experimental results and theoretical model
In Special Collection:
Non-Invasive and Non-Destructive Methods and Applications Part I — Festschrift
J. Appl. Phys. 131, 245104 (2022)
https://doi.org/10.1063/5.0088327
Fracture energy of high-Poisson's ratio oxide glasses
In Special Collection:
Advances in Multi-Scale Mechanical Characterization
J. Appl. Phys. 131, 245105 (2022)
https://doi.org/10.1063/5.0096855
Growth of vanadium doped semi-insulating 4H-SiC epilayer with ultrahigh-resistivity
J. Appl. Phys. 131, 245107 (2022)
https://doi.org/10.1063/5.0095457
Large piezoelectric and elastic properties in B and Sc codoped wurtzite AlN
J. Appl. Phys. 131, 245108 (2022)
https://doi.org/10.1063/5.0090501
Thin Films, Interfaces, and Surfaces
Investigation of the Schoch effect based on acoustic collective surface oscillation
J. Appl. Phys. 131, 245302 (2022)
https://doi.org/10.1063/5.0092077
Organic-Inorganic Systems, including Organic Electronics
Modeling of thickness-dependent energy level alignment at organic and inorganic semiconductor interfaces
J. Appl. Phys. 131, 245501 (2022)
https://doi.org/10.1063/5.0096697
Physics of Semiconductors
Properties of AgBiI4 using high through-put DFT and machine learning methods
J. Appl. Phys. 131, 245701 (2022)
https://doi.org/10.1063/5.0088980
Physics of Matter under Extreme Conditions
Development of slurry targets for high repetition-rate x-ray free electron laser experiments
Raymond F. Smith; Vinay Rastogi; Amy E. Lazicki; Martin G. Gorman; Richard Briggs; Amy L. Coleman; Carol Davis; Saransh Singh; David McGonegle; Samantha M. Clarke; Travis Volz; Trevor Hutchinson; Christopher McGuire; Dayne E. Fratanduono; Damian C. Swift; Eric Folsom; Cynthia A. Bolme; Arianna E. Gleason; Federica Coppari; Hae Ja Lee; Bob Nagler; Eric Cunningham; Philip Heimann; Richard G. Kraus; Robert E. Rudd; Thomas S. Duffy; Jon H. Eggert; June K. Wicks
J. Appl. Phys. 131, 245901 (2022)
https://doi.org/10.1063/5.0095654
COMMENTS AND RESPONSES
ERRATA
Defects in semiconductors
Cyrus E. Dreyer, Anderson Janotti, et al.
A step-by-step guide to perform x-ray photoelectron spectroscopy
Grzegorz Greczynski, Lars Hultman
Experimental investigation of electron-impact reactions in the plasma discharge of a water-vapor Hall thruster
K. Shirasu, H. Koizumi, et al.