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APPLIED PHYSICS REVIEWS

J. Appl. Phys. 104, 081301 (2008) https://doi.org/10.1063/1.2977587

LASERS, OPTICS, AND OPTOELECTRONICS

J. Appl. Phys. 104, 083101 (2008) https://doi.org/10.1063/1.2996107
J. Appl. Phys. 104, 083102 (2008) https://doi.org/10.1063/1.2998909
J. Appl. Phys. 104, 083103 (2008) https://doi.org/10.1063/1.2993754
J. Appl. Phys. 104, 083104 (2008) https://doi.org/10.1063/1.2998981
J. Appl. Phys. 104, 083105 (2008) https://doi.org/10.1063/1.3000098
J. Appl. Phys. 104, 083106 (2008) https://doi.org/10.1063/1.3000456
J. Appl. Phys. 104, 083107 (2008) https://doi.org/10.1063/1.2999370
J. Appl. Phys. 104, 083108 (2008) https://doi.org/10.1063/1.3000444
J. Appl. Phys. 104, 083109 (2008) https://doi.org/10.1063/1.3005903

PLASMAS AND ELECTRICAL DISCHARGES

J. Appl. Phys. 104, 083301 (2008) https://doi.org/10.1063/1.2978369
J. Appl. Phys. 104, 083302 (2008) https://doi.org/10.1063/1.2999645
J. Appl. Phys. 104, 083303 (2008) https://doi.org/10.1063/1.3000667
J. Appl. Phys. 104, 083304 (2008) https://doi.org/10.1063/1.3000669
J. Appl. Phys. 104, 083305 (2008) https://doi.org/10.1063/1.3000446
J. Appl. Phys. 104, 083306 (2008) https://doi.org/10.1063/1.3000672
J. Appl. Phys. 104, 083307 (2008) https://doi.org/10.1063/1.3005902

STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER

J. Appl. Phys. 104, 083501 (2008) https://doi.org/10.1063/1.2992558
J. Appl. Phys. 104, 083502 (2008) https://doi.org/10.1063/1.2999391
J. Appl. Phys. 104, 083503 (2008) https://doi.org/10.1063/1.3000441
J. Appl. Phys. 104, 083504 (2008) https://doi.org/10.1063/1.2996292
J. Appl. Phys. 104, 083505 (2008) https://doi.org/10.1063/1.2996299
J. Appl. Phys. 104, 083506 (2008) https://doi.org/10.1063/1.2999369
J. Appl. Phys. 104, 083507 (2008) https://doi.org/10.1063/1.3000450
J. Appl. Phys. 104, 083508 (2008) https://doi.org/10.1063/1.3000483
J. Appl. Phys. 104, 083509 (2008) https://doi.org/10.1063/1.2990066
J. Appl. Phys. 104, 083510 (2008) https://doi.org/10.1063/1.2999564
J. Appl. Phys. 104, 083511 (2008) https://doi.org/10.1063/1.3000451
J. Appl. Phys. 104, 083512 (2008) https://doi.org/10.1063/1.3000564
J. Appl. Phys. 104, 083513 (2008) https://doi.org/10.1063/1.3000465
J. Appl. Phys. 104, 083514 (2008) https://doi.org/10.1063/1.3000622
J. Appl. Phys. 104, 083515 (2008) https://doi.org/10.1063/1.2977678
J. Appl. Phys. 104, 083516 (2008) https://doi.org/10.1063/1.3000601
J. Appl. Phys. 104, 083517 (2008) https://doi.org/10.1063/1.3000659
J. Appl. Phys. 104, 083518 (2008) https://doi.org/10.1063/1.3002913
J. Appl. Phys. 104, 083519 (2008) https://doi.org/10.1063/1.3003067
J. Appl. Phys. 104, 083520 (2008) https://doi.org/10.1063/1.3003325
J. Appl. Phys. 104, 083521 (2008) https://doi.org/10.1063/1.3000442
J. Appl. Phys. 104, 083522 (2008) https://doi.org/10.1063/1.3003079
J. Appl. Phys. 104, 083523 (2008) https://doi.org/10.1063/1.3003083
J. Appl. Phys. 104, 083524 (2008) https://doi.org/10.1063/1.2999639
J. Appl. Phys. 104, 083525 (2008) https://doi.org/10.1063/1.3000663
J. Appl. Phys. 104, 083526 (2008) https://doi.org/10.1063/1.3005883
J. Appl. Phys. 104, 083527 (2008) https://doi.org/10.1063/1.3000662

ELECTRONIC STRUCTURE AND TRANSPORT

J. Appl. Phys. 104, 083701 (2008) https://doi.org/10.1063/1.2996027
J. Appl. Phys. 104, 083702 (2008) https://doi.org/10.1063/1.2991135
J. Appl. Phys. 104, 083703 (2008) https://doi.org/10.1063/1.3000454
J. Appl. Phys. 104, 083704 (2008) https://doi.org/10.1063/1.3000105
J. Appl. Phys. 104, 083705 (2008) https://doi.org/10.1063/1.2996262
J. Appl. Phys. 104, 083706 (2008) https://doi.org/10.1063/1.2998908
J. Appl. Phys. 104, 083707 (2008) https://doi.org/10.1063/1.3000439
J. Appl. Phys. 104, 083708 (2008) https://doi.org/10.1063/1.3000458
J. Appl. Phys. 104, 083709 (2008) https://doi.org/10.1063/1.3000567
J. Appl. Phys. 104, 083710 (2008) https://doi.org/10.1063/1.3000455
J. Appl. Phys. 104, 083711 (2008) https://doi.org/10.1063/1.3000021
J. Appl. Phys. 104, 083712 (2008) https://doi.org/10.1063/1.3000051
J. Appl. Phys. 104, 083713 (2008) https://doi.org/10.1063/1.3000453
J. Appl. Phys. 104, 083714 (2008) https://doi.org/10.1063/1.3003086
J. Appl. Phys. 104, 083715 (2008) https://doi.org/10.1063/1.3006128
J. Appl. Phys. 104, 083716 (2008) https://doi.org/10.1063/1.3006690
J. Appl. Phys. 104, 083717 (2008) https://doi.org/10.1063/1.3000443
J. Appl. Phys. 104, 083718 (2008) https://doi.org/10.1063/1.3005875

MAGNETISM AND SUPERCONDUCTIVITY

J. Appl. Phys. 104, 083901 (2008) https://doi.org/10.1063/1.2998973
J. Appl. Phys. 104, 083902 (2008) https://doi.org/10.1063/1.2999298
J. Appl. Phys. 104, 083903 (2008) https://doi.org/10.1063/1.2999337
J. Appl. Phys. 104, 083904 (2008) https://doi.org/10.1063/1.3000452
J. Appl. Phys. 104, 083905 (2008) https://doi.org/10.1063/1.3000611
J. Appl. Phys. 104, 083906 (2008) https://doi.org/10.1063/1.2992521
J. Appl. Phys. 104, 083907 (2008) https://doi.org/10.1063/1.3002419
J. Appl. Phys. 104, 083908 (2008) https://doi.org/10.1063/1.3003049
J. Appl. Phys. 104, 083909 (2008) https://doi.org/10.1063/1.3000479
J. Appl. Phys. 104, 083910 (2008) https://doi.org/10.1063/1.3000607
J. Appl. Phys. 104, 083911 (2008) https://doi.org/10.1063/1.3000617
J. Appl. Phys. 104, 083912 (2008) https://doi.org/10.1063/1.3000625
J. Appl. Phys. 104, 083913 (2008) https://doi.org/10.1063/1.3000627
J. Appl. Phys. 104, 083914 (2008) https://doi.org/10.1063/1.2999347
J. Appl. Phys. 104, 083915 (2008) https://doi.org/10.1063/1.3005879
J. Appl. Phys. 104, 083916 (2008) https://doi.org/10.1063/1.3005882
J. Appl. Phys. 104, 083917 (2008) https://doi.org/10.1063/1.3006014
J. Appl. Phys. 104, 083918 (2008) https://doi.org/10.1063/1.3005884
J. Appl. Phys. 104, 083919 (2008) https://doi.org/10.1063/1.3009321

DIELECTRICS AND FERROELECTRICITY

J. Appl. Phys. 104, 084101 (2008) https://doi.org/10.1063/1.2996111
J. Appl. Phys. 104, 084102 (2008) https://doi.org/10.1063/1.3000057
J. Appl. Phys. 104, 084103 (2008) https://doi.org/10.1063/1.3000560
J. Appl. Phys. 104, 084104 (2008) https://doi.org/10.1063/1.2999352
J. Appl. Phys. 104, 084105 (2008) https://doi.org/10.1063/1.2957077
J. Appl. Phys. 104, 084106 (2008) https://doi.org/10.1063/1.3000478
J. Appl. Phys. 104, 084107 (2008) https://doi.org/10.1063/1.3000459
J. Appl. Phys. 104, 084108 (2008) https://doi.org/10.1063/1.3006003

NANOSCALE SCIENCE AND DESIGN

J. Appl. Phys. 104, 084301 (2008) https://doi.org/10.1063/1.2999636
J. Appl. Phys. 104, 084302 (2008) https://doi.org/10.1063/1.2990774
J. Appl. Phys. 104, 084303 (2008) https://doi.org/10.1063/1.2996005
J. Appl. Phys. 104, 084304 (2008) https://doi.org/10.1063/1.2996016
J. Appl. Phys. 104, 084305 (2008) https://doi.org/10.1063/1.2999379
J. Appl. Phys. 104, 084306 (2008) https://doi.org/10.1063/1.3000482
J. Appl. Phys. 104, 084307 (2008) https://doi.org/10.1063/1.3000445
J. Appl. Phys. 104, 084308 (2008) https://doi.org/10.1063/1.3000657
J. Appl. Phys. 104, 084309 (2008) https://doi.org/10.1063/1.2996279
J. Appl. Phys. 104, 084310 (2008) https://doi.org/10.1063/1.2999644
J. Appl. Phys. 104, 084311 (2008) https://doi.org/10.1063/1.3003064
J. Appl. Phys. 104, 084312 (2008) https://doi.org/10.1063/1.3003081
J. Appl. Phys. 104, 084313 (2008) https://doi.org/10.1063/1.3003528
J. Appl. Phys. 104, 084314 (2008) https://doi.org/10.1063/1.3005881
J. Appl. Phys. 104, 084315 (2008) https://doi.org/10.1063/1.3005876
J. Appl. Phys. 104, 084316 (2008) https://doi.org/10.1063/1.3000666
J. Appl. Phys. 104, 084317 (2008) https://doi.org/10.1063/1.3006817
J. Appl. Phys. 104, 084318 (2008) https://doi.org/10.1063/1.3000566

DEVICE PHYSICS

J. Appl. Phys. 104, 084501 (2008) https://doi.org/10.1063/1.2999643
J. Appl. Phys. 104, 084502 (2008) https://doi.org/10.1063/1.2999344
J. Appl. Phys. 104, 084503 (2008) https://doi.org/10.1063/1.2999640
J. Appl. Phys. 104, 084504 (2008) https://doi.org/10.1063/1.2993618
J. Appl. Phys. 104, 084505 (2008) https://doi.org/10.1063/1.3000481
J. Appl. Phys. 104, 084506 (2008) https://doi.org/10.1063/1.3000602
J. Appl. Phys. 104, 084507 (2008) https://doi.org/10.1063/1.3002420
J. Appl. Phys. 104, 084508 (2008) https://doi.org/10.1063/1.2996319
J. Appl. Phys. 104, 084509 (2008) https://doi.org/10.1063/1.3000038
J. Appl. Phys. 104, 084510 (2008) https://doi.org/10.1063/1.2974100
J. Appl. Phys. 104, 084511 (2008) https://doi.org/10.1063/1.2978368
J. Appl. Phys. 104, 084512 (2008) https://doi.org/10.1063/1.3003082
J. Appl. Phys. 104, 084513 (2008) https://doi.org/10.1063/1.3003526
J. Appl. Phys. 104, 084514 (2008) https://doi.org/10.1063/1.3003568
J. Appl. Phys. 104, 084515 (2008) https://doi.org/10.1063/1.3005878
J. Appl. Phys. 104, 084516 (2008) https://doi.org/10.1063/1.3005885
J. Appl. Phys. 104, 084517 (2008) https://doi.org/10.1063/1.3006007
J. Appl. Phys. 104, 084518 (2008) https://doi.org/10.1063/1.3005886
J. Appl. Phys. 104, 084519 (2008) https://doi.org/10.1063/1.3006443
J. Appl. Phys. 104, 084520 (2008) https://doi.org/10.1063/1.3006890

APPLIED BIOPHYSICS

J. Appl. Phys. 104, 084701 (2008) https://doi.org/10.1063/1.3005966

INTERDISCIPLINARY AND GENERAL PHYSICS

J. Appl. Phys. 104, 084901 (2008) https://doi.org/10.1063/1.2978334
J. Appl. Phys. 104, 084902 (2008) https://doi.org/10.1063/1.3000055
J. Appl. Phys. 104, 084903 (2008) https://doi.org/10.1063/1.3000092
J. Appl. Phys. 104, 084904 (2008) https://doi.org/10.1063/1.3000462
J. Appl. Phys. 104, 084905 (2008) https://doi.org/10.1063/1.2996318
J. Appl. Phys. 104, 084906 (2008) https://doi.org/10.1063/1.3000463
J. Appl. Phys. 104, 084907 (2008) https://doi.org/10.1063/1.3000654
J. Appl. Phys. 104, 084908 (2008) https://doi.org/10.1063/1.3003527
J. Appl. Phys. 104, 084909 (2008) https://doi.org/10.1063/1.3000661
J. Appl. Phys. 104, 084910 (2008) https://doi.org/10.1063/1.3003130
J. Appl. Phys. 104, 084911 (2008) https://doi.org/10.1063/1.2998971
J. Appl. Phys. 104, 084912 (2008) https://doi.org/10.1063/1.2988145
J. Appl. Phys. 104, 084913 (2008) https://doi.org/10.1063/1.3009337
J. Appl. Phys. 104, 084914 (2008) https://doi.org/10.1063/1.3006017

COMMUNICATIONS

J. Appl. Phys. 104, 086101 (2008) https://doi.org/10.1063/1.3000656
J. Appl. Phys. 104, 086102 (2008) https://doi.org/10.1063/1.2992519
J. Appl. Phys. 104, 086103 (2008) https://doi.org/10.1063/1.3000565
J. Appl. Phys. 104, 086104 (2008) https://doi.org/10.1063/1.3006139
J. Appl. Phys. 104, 086105 (2008) https://doi.org/10.1063/1.3000664
J. Appl. Phys. 104, 086106 (2008) https://doi.org/10.1063/1.3000665
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