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APPLIED PHYSICS REVIEWS—FOCUSED REVIEW

J. Appl. Phys. 104, 071101 (2008) https://doi.org/10.1063/1.2981642

LASERS, OPTICS, AND OPTOELECTRONICS

J. Appl. Phys. 104, 073101 (2008) https://doi.org/10.1063/1.2977719
J. Appl. Phys. 104, 073102 (2008) https://doi.org/10.1063/1.2978210
J. Appl. Phys. 104, 073103 (2008) https://doi.org/10.1063/1.2986149
J. Appl. Phys. 104, 073104 (2008) https://doi.org/10.1063/1.2980014
J. Appl. Phys. 104, 073105 (2008) https://doi.org/10.1063/1.2989999
J. Appl. Phys. 104, 073106 (2008) https://doi.org/10.1063/1.2990055
J. Appl. Phys. 104, 073107 (2008) https://doi.org/10.1063/1.2990056
J. Appl. Phys. 104, 073108 (2008) https://doi.org/10.1063/1.2990063
J. Appl. Phys. 104, 073109 (2008) https://doi.org/10.1063/1.2985914
J. Appl. Phys. 104, 073110 (2008) https://doi.org/10.1063/1.2968248
J. Appl. Phys. 104, 073111 (2008) https://doi.org/10.1063/1.2993748
J. Appl. Phys. 104, 073112 (2008) https://doi.org/10.1063/1.2993751
J. Appl. Phys. 104, 073113 (2008) https://doi.org/10.1063/1.2993978
J. Appl. Phys. 104, 073114 (2008) https://doi.org/10.1063/1.2968552
J. Appl. Phys. 104, 073115 (2008) https://doi.org/10.1063/1.2969656
J. Appl. Phys. 104, 073116 (2008) https://doi.org/10.1063/1.2990769

PLASMAS AND ELECTRICAL DISCHARGES

J. Appl. Phys. 104, 073301 (2008) https://doi.org/10.1063/1.2986915
J. Appl. Phys. 104, 073302 (2008) https://doi.org/10.1063/1.2990070
J. Appl. Phys. 104, 073303 (2008) https://doi.org/10.1063/1.2988899
J. Appl. Phys. 104, 073304 (2008) https://doi.org/10.1063/1.2990059
J. Appl. Phys. 104, 073305 (2008) https://doi.org/10.1063/1.2990074
J. Appl. Phys. 104, 073306 (2008) https://doi.org/10.1063/1.2978222
J. Appl. Phys. 104, 073307 (2008) https://doi.org/10.1063/1.2991339
J. Appl. Phys. 104, 073308 (2008) https://doi.org/10.1063/1.2996272

STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER

J. Appl. Phys. 104, 073501 (2008) https://doi.org/10.1063/1.2982091
J. Appl. Phys. 104, 073502 (2008) https://doi.org/10.1063/1.2986140
J. Appl. Phys. 104, 073503 (2008) https://doi.org/10.1063/1.2986156
J. Appl. Phys. 104, 073504 (2008) https://doi.org/10.1063/1.2986280
J. Appl. Phys. 104, 073505 (2008) https://doi.org/10.1063/1.2955776
J. Appl. Phys. 104, 073506 (2008) https://doi.org/10.1063/1.2987036
J. Appl. Phys. 104, 073507 (2008) https://doi.org/10.1063/1.2987473
J. Appl. Phys. 104, 073508 (2008) https://doi.org/10.1063/1.2987477
J. Appl. Phys. 104, 073509 (2008) https://doi.org/10.1063/1.2988111
J. Appl. Phys. 104, 073510 (2008) https://doi.org/10.1063/1.2988140
J. Appl. Phys. 104, 073511 (2008) https://doi.org/10.1063/1.2988264
J. Appl. Phys. 104, 073512 (2008) https://doi.org/10.1063/1.2990050
J. Appl. Phys. 104, 073513 (2008) https://doi.org/10.1063/1.2980329
J. Appl. Phys. 104, 073514 (2008) https://doi.org/10.1063/1.2990058
J. Appl. Phys. 104, 073515 (2008) https://doi.org/10.1063/1.2977748
J. Appl. Phys. 104, 073516 (2008) https://doi.org/10.1063/1.2980344
J. Appl. Phys. 104, 073517 (2008) https://doi.org/10.1063/1.2981044
J. Appl. Phys. 104, 073518 (2008) https://doi.org/10.1063/1.2990068
J. Appl. Phys. 104, 073519 (2008) https://doi.org/10.1063/1.2981083
J. Appl. Phys. 104, 073520 (2008) https://doi.org/10.1063/1.2990062
J. Appl. Phys. 104, 073521 (2008) https://doi.org/10.1063/1.2990767
J. Appl. Phys. 104, 073522 (2008) https://doi.org/10.1063/1.2990770
J. Appl. Phys. 104, 073523 (2008) https://doi.org/10.1063/1.2990771
J. Appl. Phys. 104, 073524 (2008) https://doi.org/10.1063/1.2986142
J. Appl. Phys. 104, 073525 (2008) https://doi.org/10.1063/1.2988142
J. Appl. Phys. 104, 073526 (2008) https://doi.org/10.1063/1.2991151
J. Appl. Phys. 104, 073527 (2008) https://doi.org/10.1063/1.2991157
J. Appl. Phys. 104, 073528 (2008) https://doi.org/10.1063/1.2991436
J. Appl. Phys. 104, 073529 (2008) https://doi.org/10.1063/1.2993753
J. Appl. Phys. 104, 073530 (2008) https://doi.org/10.1063/1.2993976
J. Appl. Phys. 104, 073531 (2008) https://doi.org/10.1063/1.2991164
J. Appl. Phys. 104, 073532 (2008) https://doi.org/10.1063/1.2996031
J. Appl. Phys. 104, 073533 (2008) https://doi.org/10.1063/1.2987476
J. Appl. Phys. 104, 073534 (2008) https://doi.org/10.1063/1.2951622
J. Appl. Phys. 104, 073535 (2008) https://doi.org/10.1063/1.2996248
J. Appl. Phys. 104, 073536 (2008) https://doi.org/10.1063/1.2975338
J. Appl. Phys. 104, 073537 (2008) https://doi.org/10.1063/1.2993549

ELECTRONIC STRUCTURE AND TRANSPORT

J. Appl. Phys. 104, 073701 (2008) https://doi.org/10.1063/1.2985906
J. Appl. Phys. 104, 073702 (2008) https://doi.org/10.1063/1.2986137
J. Appl. Phys. 104, 073703 (2008) https://doi.org/10.1063/1.2986146
J. Appl. Phys. 104, 073704 (2008) https://doi.org/10.1063/1.2986637
J. Appl. Phys. 104, 073705 (2008) https://doi.org/10.1063/1.2987471
J. Appl. Phys. 104, 073706 (2008) https://doi.org/10.1063/1.2987472
J. Appl. Phys. 104, 073707 (2008) https://doi.org/10.1063/1.2988131
J. Appl. Phys. 104, 073708 (2008) https://doi.org/10.1063/1.2988139
J. Appl. Phys. 104, 073709 (2008) https://doi.org/10.1063/1.2988174
J. Appl. Phys. 104, 073710 (2008) https://doi.org/10.1063/1.2988294
J. Appl. Phys. 104, 073711 (2008) https://doi.org/10.1063/1.2988901
J. Appl. Phys. 104, 073712 (2008) https://doi.org/10.1063/1.2989116
J. Appl. Phys. 104, 073713 (2008) https://doi.org/10.1063/1.2979326
J. Appl. Phys. 104, 073714 (2008) https://doi.org/10.1063/1.2963358
J. Appl. Phys. 104, 073715 (2008) https://doi.org/10.1063/1.2980277
J. Appl. Phys. 104, 073716 (2008) https://doi.org/10.1063/1.2990053
J. Appl. Phys. 104, 073717 (2008) https://doi.org/10.1063/1.2990060
J. Appl. Phys. 104, 073718 (2008) https://doi.org/10.1063/1.2977670
J. Appl. Phys. 104, 073719 (2008) https://doi.org/10.1063/1.2990051
J. Appl. Phys. 104, 073720 (2008) https://doi.org/10.1063/1.2990061
J. Appl. Phys. 104, 073721 (2008) https://doi.org/10.1063/1.2990772
J. Appl. Phys. 104, 073722 (2008) https://doi.org/10.1063/1.2976353
J. Appl. Phys. 104, 073723 (2008) https://doi.org/10.1063/1.2996034
J. Appl. Phys. 104, 073724 (2008) https://doi.org/10.1063/1.2996036
J. Appl. Phys. 104, 073725 (2008) https://doi.org/10.1063/1.2968217
J. Appl. Phys. 104, 073726 (2008) https://doi.org/10.1063/1.2990065
J. Appl. Phys. 104, 073727 (2008) https://doi.org/10.1063/1.2996032

MAGNETISM AND SUPERCONDUCTIVITY

J. Appl. Phys. 104, 073901 (2008) https://doi.org/10.1063/1.2986150
J. Appl. Phys. 104, 073902 (2008) https://doi.org/10.1063/1.2987062
J. Appl. Phys. 104, 073903 (2008) https://doi.org/10.1063/1.2987474
J. Appl. Phys. 104, 073904 (2008) https://doi.org/10.1063/1.2990052
J. Appl. Phys. 104, 073905 (2008) https://doi.org/10.1063/1.2990006
J. Appl. Phys. 104, 073906 (2008) https://doi.org/10.1063/1.2988898
J. Appl. Phys. 104, 073907 (2008) https://doi.org/10.1063/1.2991167
J. Appl. Phys. 104, 073908 (2008) https://doi.org/10.1063/1.2991355
J. Appl. Phys. 104, 073909 (2008) https://doi.org/10.1063/1.2991439
J. Appl. Phys. 104, 073910 (2008) https://doi.org/10.1063/1.2992528
J. Appl. Phys. 104, 073911 (2008) https://doi.org/10.1063/1.2999501

DIELECTRICS AND FERROELECTRICITY

J. Appl. Phys. 104, 074101 (2008) https://doi.org/10.1063/1.2985908
J. Appl. Phys. 104, 074102 (2008) https://doi.org/10.1063/1.2978327
J. Appl. Phys. 104, 074103 (2008) https://doi.org/10.1063/1.2988179
J. Appl. Phys. 104, 074104 (2008) https://doi.org/10.1063/1.2988183
J. Appl. Phys. 104, 074105 (2008) https://doi.org/10.1063/1.2988269
J. Appl. Phys. 104, 074106 (2008) https://doi.org/10.1063/1.2990073
J. Appl. Phys. 104, 074107 (2008) https://doi.org/10.1063/1.2989124
J. Appl. Phys. 104, 074108 (2008) https://doi.org/10.1063/1.2976173
J. Appl. Phys. 104, 074109 (2008) https://doi.org/10.1063/1.2990768
J. Appl. Phys. 104, 074110 (2008) https://doi.org/10.1063/1.2979973
J. Appl. Phys. 104, 074111 (2008) https://doi.org/10.1063/1.2991182
J. Appl. Phys. 104, 074112 (2008) https://doi.org/10.1063/1.2996080
J. Appl. Phys. 104, 074113 (2008) https://doi.org/10.1063/1.2999637
J. Appl. Phys. 104, 074114 (2008) https://doi.org/10.1063/1.2976348
J. Appl. Phys. 104, 074115 (2008) https://doi.org/10.1063/1.2998906
J. Appl. Phys. 104, 074116 (2008) https://doi.org/10.1063/1.2999441
J. Appl. Phys. 104, 074117 (2008) https://doi.org/10.1063/1.2999534
J. Appl. Phys. 104, 074118 (2008) https://doi.org/10.1063/1.2999638

NANOSCALE SCIENCE AND DESIGN

J. Appl. Phys. 104, 074301 (2008) https://doi.org/10.1063/1.2977729
J. Appl. Phys. 104, 074302 (2008) https://doi.org/10.1063/1.2985915
J. Appl. Phys. 104, 074303 (2008) https://doi.org/10.1063/1.2986152
J. Appl. Phys. 104, 074304 (2008) https://doi.org/10.1063/1.2986154
J. Appl. Phys. 104, 074305 (2008) https://doi.org/10.1063/1.2987469
J. Appl. Phys. 104, 074306 (2008) https://doi.org/10.1063/1.2988136
J. Appl. Phys. 104, 074307 (2008) https://doi.org/10.1063/1.2988189
J. Appl. Phys. 104, 074308 (2008) https://doi.org/10.1063/1.2980321
J. Appl. Phys. 104, 074309 (2008) https://doi.org/10.1063/1.2980341
J. Appl. Phys. 104, 074310 (2008) https://doi.org/10.1063/1.2988274
J. Appl. Phys. 104, 074311 (2008) https://doi.org/10.1063/1.2990064
J. Appl. Phys. 104, 074312 (2008) https://doi.org/10.1063/1.2981070
J. Appl. Phys. 104, 074313 (2008) https://doi.org/10.1063/1.2990067
J. Appl. Phys. 104, 074314 (2008) https://doi.org/10.1063/1.2991153
J. Appl. Phys. 104, 074315 (2008) https://doi.org/10.1063/1.2965196
J. Appl. Phys. 104, 074316 (2008) https://doi.org/10.1063/1.2973665
J. Appl. Phys. 104, 074317 (2008) https://doi.org/10.1063/1.2959835
J. Appl. Phys. 104, 074318 (2008) https://doi.org/10.1063/1.2996033
J. Appl. Phys. 104, 074319 (2008) https://doi.org/10.1063/1.2996083
J. Appl. Phys. 104, 074320 (2008) https://doi.org/10.1063/1.2991301
J. Appl. Phys. 104, 074321 (2008) https://doi.org/10.1063/1.2981062

DEVICE PHYSICS

J. Appl. Phys. 104, 074501 (2008) https://doi.org/10.1063/1.2986158
J. Appl. Phys. 104, 074502 (2008) https://doi.org/10.1063/1.2988137
J. Appl. Phys. 104, 074503 (2008) https://doi.org/10.1063/1.2990057
J. Appl. Phys. 104, 074504 (2008) https://doi.org/10.1063/1.2990069
J. Appl. Phys. 104, 074505 (2008) https://doi.org/10.1063/1.2990003
J. Appl. Phys. 104, 074506 (2008) https://doi.org/10.1063/1.2990765
J. Appl. Phys. 104, 074507 (2008) https://doi.org/10.1063/1.2981203
J. Appl. Phys. 104, 074508 (2008) https://doi.org/10.1063/1.2993547
J. Appl. Phys. 104, 074509 (2008) https://doi.org/10.1063/1.2993742
J. Appl. Phys. 104, 074510 (2008) https://doi.org/10.1063/1.2996252
J. Appl. Phys. 104, 074511 (2008) https://doi.org/10.1063/1.2990071

APPLIED BIOPHYSICS

J. Appl. Phys. 104, 074701 (2008) https://doi.org/10.1063/1.2988297
J. Appl. Phys. 104, 074702 (2008) https://doi.org/10.1063/1.2990054

INTERDISCIPLINARY AND GENERAL PHYSICS

J. Appl. Phys. 104, 074901 (2008) https://doi.org/10.1063/1.2982277
J. Appl. Phys. 104, 074902 (2008) https://doi.org/10.1063/1.2985904
J. Appl. Phys. 104, 074903 (2008) https://doi.org/10.1063/1.2986443
J. Appl. Phys. 104, 074904 (2008) https://doi.org/10.1063/1.2986940
J. Appl. Phys. 104, 074905 (2008) https://doi.org/10.1063/1.2988276