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LASERS, OPTICS, AND OPTOELECTRONICS

J. Appl. Phys. 104, 063101 (2008) https://doi.org/10.1063/1.2980054
J. Appl. Phys. 104, 063102 (2008) https://doi.org/10.1063/1.2977666
J. Appl. Phys. 104, 063103 (2008) https://doi.org/10.1063/1.2977749
J. Appl. Phys. 104, 063104 (2008) https://doi.org/10.1063/1.2981054
J. Appl. Phys. 104, 063105 (2008) https://doi.org/10.1063/1.2978359
J. Appl. Phys. 104, 063106 (2008) https://doi.org/10.1063/1.2976337
J. Appl. Phys. 104, 063107 (2008) https://doi.org/10.1063/1.2980274
J. Appl. Phys. 104, 063108 (2008) https://doi.org/10.1063/1.2975832
J. Appl. Phys. 104, 063109 (2008) https://doi.org/10.1063/1.2980332
J. Appl. Phys. 104, 063110 (2008) https://doi.org/10.1063/1.2980340
J. Appl. Phys. 104, 063111 (2008) https://doi.org/10.1063/1.2976320
J. Appl. Phys. 104, 063112 (2008) https://doi.org/10.1063/1.2982093
J. Appl. Phys. 104, 063113 (2008) https://doi.org/10.1063/1.2982374
J. Appl. Phys. 104, 063114 (2008) https://doi.org/10.1063/1.2980320
J. Appl. Phys. 104, 063115 (2008) https://doi.org/10.1063/1.2981196

PLASMAS AND ELECTRICAL DISCHARGES

J. Appl. Phys. 104, 063301 (2008) https://doi.org/10.1063/1.2978226
J. Appl. Phys. 104, 063302 (2008) https://doi.org/10.1063/1.2979715
J. Appl. Phys. 104, 063303 (2008) https://doi.org/10.1063/1.2980336
J. Appl. Phys. 104, 063304 (2008) https://doi.org/10.1063/1.2978211
J. Appl. Phys. 104, 063305 (2008) https://doi.org/10.1063/1.2980278
J. Appl. Phys. 104, 063306 (2008) https://doi.org/10.1063/1.2980333
J. Appl. Phys. 104, 063307 (2008) https://doi.org/10.1063/1.2978190
J. Appl. Phys. 104, 063308 (2008) https://doi.org/10.1063/1.2982408
J. Appl. Phys. 104, 063309 (2008) https://doi.org/10.1063/1.2978184
J. Appl. Phys. 104, 063310 (2008) https://doi.org/10.1063/1.2981199
J. Appl. Phys. 104, 063311 (2008) https://doi.org/10.1063/1.2986572
J. Appl. Phys. 104, 063312 (2008) https://doi.org/10.1063/1.2986657

STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER

J. Appl. Phys. 104, 063501 (2008) https://doi.org/10.1063/1.2977682
J. Appl. Phys. 104, 063502 (2008) https://doi.org/10.1063/1.2978206
J. Appl. Phys. 104, 063503 (2008) https://doi.org/10.1063/1.2975992
J. Appl. Phys. 104, 063504 (2008) https://doi.org/10.1063/1.2976299
J. Appl. Phys. 104, 063505 (2008) https://doi.org/10.1063/1.2977608
J. Appl. Phys. 104, 063506 (2008) https://doi.org/10.1063/1.2973193
J. Appl. Phys. 104, 063507 (2008) https://doi.org/10.1063/1.2977752
J. Appl. Phys. 104, 063508 (2008) https://doi.org/10.1063/1.2978207
J. Appl. Phys. 104, 063509 (2008) https://doi.org/10.1063/1.2978215
J. Appl. Phys. 104, 063510 (2008) https://doi.org/10.1063/1.2978354
J. Appl. Phys. 104, 063511 (2008) https://doi.org/10.1063/1.2979716
J. Appl. Phys. 104, 063512 (2008) https://doi.org/10.1063/1.2977673
J. Appl. Phys. 104, 063513 (2008) https://doi.org/10.1063/1.2978208
J. Appl. Phys. 104, 063514 (2008) https://doi.org/10.1063/1.2976319
J. Appl. Phys. 104, 063515 (2008) https://doi.org/10.1063/1.2978214
J. Appl. Phys. 104, 063516 (2008) https://doi.org/10.1063/1.2980051
J. Appl. Phys. 104, 063517 (2008) https://doi.org/10.1063/1.2978185
J. Appl. Phys. 104, 063518 (2008) https://doi.org/10.1063/1.2980057
J. Appl. Phys. 104, 063519 (2008) https://doi.org/10.1063/1.2980325
J. Appl. Phys. 104, 063520 (2008) https://doi.org/10.1063/1.2942407
J. Appl. Phys. 104, 063521 (2008) https://doi.org/10.1063/1.2979324
J. Appl. Phys. 104, 063522 (2008) https://doi.org/10.1063/1.2975991
J. Appl. Phys. 104, 063523 (2008) https://doi.org/10.1063/1.2981072
J. Appl. Phys. 104, 063524 (2008) https://doi.org/10.1063/1.2981089
J. Appl. Phys. 104, 063525 (2008) https://doi.org/10.1063/1.2981191
J. Appl. Phys. 104, 063526 (2008) https://doi.org/10.1063/1.2982396
J. Appl. Phys. 104, 063527 (2008) https://doi.org/10.1063/1.2982417
J. Appl. Phys. 104, 063528 (2008) https://doi.org/10.1063/1.2980334
J. Appl. Phys. 104, 063529 (2008) https://doi.org/10.1063/1.2985907

ELECTRONIC STRUCTURE AND TRANSPORT

J. Appl. Phys. 104, 063701 (2008) https://doi.org/10.1063/1.2977718
J. Appl. Phys. 104, 063702 (2008) https://doi.org/10.1063/1.2978194
J. Appl. Phys. 104, 063703 (2008) https://doi.org/10.1063/1.2978324
J. Appl. Phys. 104, 063704 (2008) https://doi.org/10.1063/1.2975993
J. Appl. Phys. 104, 063705 (2008) https://doi.org/10.1063/1.2977721
J. Appl. Phys. 104, 063706 (2008) https://doi.org/10.1063/1.2977677
J. Appl. Phys. 104, 063707 (2008) https://doi.org/10.1063/1.2978374
J. Appl. Phys. 104, 063708 (2008) https://doi.org/10.1063/1.2980045
J. Appl. Phys. 104, 063709 (2008) https://doi.org/10.1063/1.2981190
J. Appl. Phys. 104, 063710 (2008) https://doi.org/10.1063/1.2981090
J. Appl. Phys. 104, 063711 (2008) https://doi.org/10.1063/1.2977758
J. Appl. Phys. 104, 063712 (2008) https://doi.org/10.1063/1.2979712
J. Appl. Phys. 104, 063713 (2008) https://doi.org/10.1063/1.2980279
J. Appl. Phys. 104, 063714 (2008) https://doi.org/10.1063/1.2982085
J. Appl. Phys. 104, 063715 (2008) https://doi.org/10.1063/1.2982275
J. Appl. Phys. 104, 063716 (2008) https://doi.org/10.1063/1.2985909
J. Appl. Phys. 104, 063717 (2008) https://doi.org/10.1063/1.2985910
J. Appl. Phys. 104, 063718 (2008) https://doi.org/10.1063/1.2986143
J. Appl. Phys. 104, 063719 (2008) https://doi.org/10.1063/1.2986151
J. Appl. Phys. 104, 063720 (2008) https://doi.org/10.1063/1.2986157

MAGNETISM AND SUPERCONDUCTIVITY

J. Appl. Phys. 104, 063901 (2008) https://doi.org/10.1063/1.2977592
J. Appl. Phys. 104, 063902 (2008) https://doi.org/10.1063/1.2978212
J. Appl. Phys. 104, 063903 (2008) https://doi.org/10.1063/1.2979675
J. Appl. Phys. 104, 063904 (2008) https://doi.org/10.1063/1.2977725
J. Appl. Phys. 104, 063905 (2008) https://doi.org/10.1063/1.2978366
J. Appl. Phys. 104, 063906 (2008) https://doi.org/10.1063/1.2979713
J. Appl. Phys. 104, 063907 (2008) https://doi.org/10.1063/1.2978351
J. Appl. Phys. 104, 063908 (2008) https://doi.org/10.1063/1.2980322
J. Appl. Phys. 104, 063909 (2008) https://doi.org/10.1063/1.2980343
J. Appl. Phys. 104, 063910 (2008) https://doi.org/10.1063/1.2976364
J. Appl. Phys. 104, 063911 (2008) https://doi.org/10.1063/1.2980275
J. Appl. Phys. 104, 063912 (2008) https://doi.org/10.1063/1.2980276
J. Appl. Phys. 104, 063913 (2008) https://doi.org/10.1063/1.2981074
J. Appl. Phys. 104, 063914 (2008) https://doi.org/10.1063/1.2978355
J. Appl. Phys. 104, 063915 (2008) https://doi.org/10.1063/1.2980040
J. Appl. Phys. 104, 063916 (2008) https://doi.org/10.1063/1.2981192
J. Appl. Phys. 104, 063917 (2008) https://doi.org/10.1063/1.2982088
J. Appl. Phys. 104, 063918 (2008) https://doi.org/10.1063/1.2982092
J. Appl. Phys. 104, 063919 (2008) https://doi.org/10.1063/1.2982370
J. Appl. Phys. 104, 063920 (2008) https://doi.org/10.1063/1.2982429
J. Appl. Phys. 104, 063921 (2008) https://doi.org/10.1063/1.2986230

DIELECTRICS AND FERROELECTRICITY

J. Appl. Phys. 104, 064101 (2008) https://doi.org/10.1063/1.2978220
J. Appl. Phys. 104, 064102 (2008) https://doi.org/10.1063/1.2978221
J. Appl. Phys. 104, 064103 (2008) https://doi.org/10.1063/1.2978233
J. Appl. Phys. 104, 064104 (2008) https://doi.org/10.1063/1.2978353
J. Appl. Phys. 104, 064105 (2008) https://doi.org/10.1063/1.2978376
J. Appl. Phys. 104, 064106 (2008) https://doi.org/10.1063/1.2978333
J. Appl. Phys. 104, 064107 (2008) https://doi.org/10.1063/1.2977684
J. Appl. Phys. 104, 064108 (2008) https://doi.org/10.1063/1.2978223
J. Appl. Phys. 104, 064109 (2008) https://doi.org/10.1063/1.2978225
J. Appl. Phys. 104, 064110 (2008) https://doi.org/10.1063/1.2978332
J. Appl. Phys. 104, 064111 (2008) https://doi.org/10.1063/1.2978360
J. Appl. Phys. 104, 064112 (2008) https://doi.org/10.1063/1.2981197
J. Appl. Phys. 104, 064113 (2008) https://doi.org/10.1063/1.2978209
J. Appl. Phys. 104, 064114 (2008) https://doi.org/10.1063/1.2978218
J. Appl. Phys. 104, 064115 (2008) https://doi.org/10.1063/1.2978216
J. Appl. Phys. 104, 064116 (2008) https://doi.org/10.1063/1.2978362
J. Appl. Phys. 104, 064117 (2008) https://doi.org/10.1063/1.2981198
J. Appl. Phys. 104, 064118 (2008) https://doi.org/10.1063/1.2982090
J. Appl. Phys. 104, 064119 (2008) https://doi.org/10.1063/1.2982406
J. Appl. Phys. 104, 064120 (2008) https://doi.org/10.1063/1.2975343
J. Appl. Phys. 104, 064121 (2008) https://doi.org/10.1063/1.2981193
J. Appl. Phys. 104, 064122 (2008) https://doi.org/10.1063/1.2986244
J. Appl. Phys. 104, 064123 (2008) https://doi.org/10.1063/1.2986470
J. Appl. Phys. 104, 064124 (2008) https://doi.org/10.1063/1.2986497
J. Appl. Phys. 104, 064125 (2008) https://doi.org/10.1063/1.2986520

NANOSCALE SCIENCE AND DESIGN

J. Appl. Phys. 104, 064301 (2008) https://doi.org/10.1063/1.2977753
J. Appl. Phys. 104, 064302 (2008) https://doi.org/10.1063/1.2977722
J. Appl. Phys. 104, 064303 (2008) https://doi.org/10.1063/1.2978217
J. Appl. Phys. 104, 064304 (2008) https://doi.org/10.1063/1.2975843
J. Appl. Phys. 104, 064305 (2008) https://doi.org/10.1063/1.2973155
J. Appl. Phys. 104, 064306 (2008) https://doi.org/10.1063/1.2978245
J. Appl. Phys. 104, 064307 (2008) https://doi.org/10.1063/1.2975182
J. Appl. Phys. 104, 064308 (2008) https://doi.org/10.1063/1.2973682
J. Appl. Phys. 104, 064309 (2008) https://doi.org/10.1063/1.2978382
J. Appl. Phys. 104, 064310 (2008) https://doi.org/10.1063/1.2975214
J. Appl. Phys. 104, 064311 (2008) https://doi.org/10.1063/1.2980335
J. Appl. Phys. 104, 064312 (2008) https://doi.org/10.1063/1.2976338
J. Appl. Phys. 104, 064313 (2008) https://doi.org/10.1063/1.2978224
J. Appl. Phys. 104, 064314 (2008) https://doi.org/10.1063/1.2968238
J. Appl. Phys. 104, 064315 (2008) https://doi.org/10.1063/1.2980042
J. Appl. Phys. 104, 064316 (2008) https://doi.org/10.1063/1.2982089
J. Appl. Phys. 104, 064317 (2008) https://doi.org/10.1063/1.2982278
J. Appl. Phys. 104, 064318 (2008) https://doi.org/10.1063/1.2982373
J. Appl. Phys. 104, 064319 (2008) https://doi.org/10.1063/1.2982411
J. Appl. Phys. 104, 064320 (2008) https://doi.org/10.1063/1.2981202
J. Appl. Phys. 104, 064321 (2008) https://doi.org/10.1063/1.2981204

DEVICE PHYSICS

J. Appl. Phys. 104, 064501 (2008) https://doi.org/10.1063/1.2978367
J. Appl. Phys. 104, 064502 (2008) https://doi.org/10.1063/1.2978364
J. Appl. Phys. 104, 064503 (2008) https://doi.org/10.1063/1.2980324
J. Appl. Phys. 104, 064504 (2008) https://doi.org/10.1063/1.2965189
J. Appl. Phys. 104, 064505 (2008) https://doi.org/10.1063/1.2975968
J. Appl. Phys. 104, 064506 (2008) https://doi.org/10.1063/1.2973466
J. Appl. Phys. 104, 064507 (2008) https://doi.org/10.1063/1.2979714
J. Appl. Phys. 104, 064508 (2008) https://doi.org/10.1063/1.2980038
J. Appl. Phys. 104, 064509 (2008) https://doi.org/10.1063/1.2981194
J. Appl. Phys. 104, 064510 (2008) https://doi.org/10.1063/1.2976317
J. Appl. Phys. 104, 064511 (2008) https://doi.org/10.1063/1.2981077
J. Appl. Phys. 104, 064512 (2008) https://doi.org/10.1063/1.2982095
J. Appl. Phys. 104, 064513 (2008) https://doi.org/10.1063/1.2982415
J. Appl. Phys. 104, 064514 (2008) https://doi.org/10.1063/1.2981088