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LASERS, OPTICS, AND OPTOELECTRONICS

J. Appl. Phys. 104, 023101 (2008) https://doi.org/10.1063/1.2955445
J. Appl. Phys. 104, 023102 (2008) https://doi.org/10.1063/1.2956331
J. Appl. Phys. 104, 023103 (2008) https://doi.org/10.1063/1.2955765
J. Appl. Phys. 104, 023104 (2008) https://doi.org/10.1063/1.2956687
J. Appl. Phys. 104, 023105 (2008) https://doi.org/10.1063/1.2957058
J. Appl. Phys. 104, 023106 (2008) https://doi.org/10.1063/1.2959336
J. Appl. Phys. 104, 023107 (2008) https://doi.org/10.1063/1.2952016
J. Appl. Phys. 104, 023108 (2008) https://doi.org/10.1063/1.2957079
J. Appl. Phys. 104, 023109 (2008) https://doi.org/10.1063/1.2955762
J. Appl. Phys. 104, 023110 (2008) https://doi.org/10.1063/1.2960536

PLASMAS AND ELECTRICAL DISCHARGES

J. Appl. Phys. 104, 023301 (2008) https://doi.org/10.1063/1.2956702
J. Appl. Phys. 104, 023302 (2008) https://doi.org/10.1063/1.2957059
J. Appl. Phys. 104, 023303 (2008) https://doi.org/10.1063/1.2955761
J. Appl. Phys. 104, 023304 (2008) https://doi.org/10.1063/1.2957054
J. Appl. Phys. 104, 023305 (2008) https://doi.org/10.1063/1.2959337

STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER

J. Appl. Phys. 104, 023501 (2008) https://doi.org/10.1063/1.2955707
J. Appl. Phys. 104, 023502 (2008) https://doi.org/10.1063/1.2955786
J. Appl. Phys. 104, 023503 (2008) https://doi.org/10.1063/1.2956594
J. Appl. Phys. 104, 023504 (2008) https://doi.org/10.1063/1.2948932
J. Appl. Phys. 104, 023505 (2008) https://doi.org/10.1063/1.2954959
J. Appl. Phys. 104, 023506 (2008) https://doi.org/10.1063/1.2955714
J. Appl. Phys. 104, 023507 (2008) https://doi.org/10.1063/1.2949266
J. Appl. Phys. 104, 023508 (2008) https://doi.org/10.1063/1.2956509
J. Appl. Phys. 104, 023509 (2008) https://doi.org/10.1063/1.2959598
J. Appl. Phys. 104, 023510 (2008) https://doi.org/10.1063/1.2955717
J. Appl. Phys. 104, 023511 (2008) https://doi.org/10.1063/1.2955768
J. Appl. Phys. 104, 023512 (2008) https://doi.org/10.1063/1.2956330
J. Appl. Phys. 104, 023513 (2008) https://doi.org/10.1063/1.2951451
J. Appl. Phys. 104, 023514 (2008) https://doi.org/10.1063/1.2956694
J. Appl. Phys. 104, 023515 (2008) https://doi.org/10.1063/1.2956741
J. Appl. Phys. 104, 023516 (2008) https://doi.org/10.1063/1.2957053
J. Appl. Phys. 104, 023517 (2008) https://doi.org/10.1063/1.2957070
J. Appl. Phys. 104, 023518 (2008) https://doi.org/10.1063/1.2956700
J. Appl. Phys. 104, 023519 (2008) https://doi.org/10.1063/1.2958324
J. Appl. Phys. 104, 023520 (2008) https://doi.org/10.1063/1.2955715
J. Appl. Phys. 104, 023521 (2008) https://doi.org/10.1063/1.2958088
J. Appl. Phys. 104, 023522 (2008) https://doi.org/10.1063/1.2958303
J. Appl. Phys. 104, 023523 (2008) https://doi.org/10.1063/1.2958326
J. Appl. Phys. 104, 023524 (2008) https://doi.org/10.1063/1.2959338
J. Appl. Phys. 104, 023525 (2008) https://doi.org/10.1063/1.2959354
J. Appl. Phys. 104, 023526 (2008) https://doi.org/10.1063/1.2956511
J. Appl. Phys. 104, 023527 (2008) https://doi.org/10.1063/1.2956706
J. Appl. Phys. 104, 023528 (2008) https://doi.org/10.1063/1.2956743
J. Appl. Phys. 104, 023529 (2008) https://doi.org/10.1063/1.2957057
J. Appl. Phys. 104, 023530 (2008) https://doi.org/10.1063/1.2957073
J. Appl. Phys. 104, 023531 (2008) https://doi.org/10.1063/1.2960340
J. Appl. Phys. 104, 023532 (2008) https://doi.org/10.1063/1.2960465
J. Appl. Phys. 104, 023533 (2008) https://doi.org/10.1063/1.2957082
J. Appl. Phys. 104, 023534 (2008) https://doi.org/10.1063/1.2958329
J. Appl. Phys. 104, 023535 (2008) https://doi.org/10.1063/1.2960504
J. Appl. Phys. 104, 023536 (2008) https://doi.org/10.1063/1.2956688
J. Appl. Phys. 104, 023537 (2008) https://doi.org/10.1063/1.2963696

ELECTRONIC STRUCTURE AND TRANSPORT

J. Appl. Phys. 104, 023701 (2008) https://doi.org/10.1063/1.2956608
J. Appl. Phys. 104, 023702 (2008) https://doi.org/10.1063/1.2955440
J. Appl. Phys. 104, 023703 (2008) https://doi.org/10.1063/1.2956739
J. Appl. Phys. 104, 023704 (2008) https://doi.org/10.1063/1.2956698
J. Appl. Phys. 104, 023705 (2008) https://doi.org/10.1063/1.2956708
J. Appl. Phys. 104, 023706 (2008) https://doi.org/10.1063/1.2957068
J. Appl. Phys. 104, 023707 (2008) https://doi.org/10.1063/1.2952541
J. Appl. Phys. 104, 023708 (2008) https://doi.org/10.1063/1.2956701
J. Appl. Phys. 104, 023709 (2008) https://doi.org/10.1063/1.2956703
J. Appl. Phys. 104, 023710 (2008) https://doi.org/10.1063/1.2957588
J. Appl. Phys. 104, 023711 (2008) https://doi.org/10.1063/1.2959825
J. Appl. Phys. 104, 023712 (2008) https://doi.org/10.1063/1.2957056
J. Appl. Phys. 104, 023713 (2008) https://doi.org/10.1063/1.2959681
J. Appl. Phys. 104, 023714 (2008) https://doi.org/10.1063/1.2959833
J. Appl. Phys. 104, 023715 (2008) https://doi.org/10.1063/1.2960335

MAGNETISM AND SUPERCONDUCTIVITY

J. Appl. Phys. 104, 023901 (2008) https://doi.org/10.1063/1.2955725
J. Appl. Phys. 104, 023902 (2008) https://doi.org/10.1063/1.2955774
J. Appl. Phys. 104, 023903 (2008) https://doi.org/10.1063/1.2956512
J. Appl. Phys. 104, 023904 (2008) https://doi.org/10.1063/1.2956691
J. Appl. Phys. 104, 023905 (2008) https://doi.org/10.1063/1.2956693
J. Appl. Phys. 104, 023906 (2008) https://doi.org/10.1063/1.2956711
J. Appl. Phys. 104, 023907 (2008) https://doi.org/10.1063/1.2957075
J. Appl. Phys. 104, 023908 (2008) https://doi.org/10.1063/1.2957061
J. Appl. Phys. 104, 023909 (2008) https://doi.org/10.1063/1.2957067
J. Appl. Phys. 104, 023910 (2008) https://doi.org/10.1063/1.2957066
J. Appl. Phys. 104, 023911 (2008) https://doi.org/10.1063/1.2959378
J. Appl. Phys. 104, 023912 (2008) https://doi.org/10.1063/1.2959379
J. Appl. Phys. 104, 023913 (2008) https://doi.org/10.1063/1.2959839
J. Appl. Phys. 104, 023914 (2008) https://doi.org/10.1063/1.2959845
J. Appl. Phys. 104, 023915 (2008) https://doi.org/10.1063/1.2960480
J. Appl. Phys. 104, 023916 (2008) https://doi.org/10.1063/1.2960500

DIELECTRICS AND FERROELECTRICITY

J. Appl. Phys. 104, 024101 (2008) https://doi.org/10.1063/1.2956615
J. Appl. Phys. 104, 024102 (2008) https://doi.org/10.1063/1.2956390
J. Appl. Phys. 104, 024103 (2008) https://doi.org/10.1063/1.2956598
J. Appl. Phys. 104, 024104 (2008) https://doi.org/10.1063/1.2956607
J. Appl. Phys. 104, 024105 (2008) https://doi.org/10.1063/1.2948925
J. Appl. Phys. 104, 024106 (2008) https://doi.org/10.1063/1.2949269
J. Appl. Phys. 104, 024107 (2008) https://doi.org/10.1063/1.2956695
J. Appl. Phys. 104, 024108 (2008) https://doi.org/10.1063/1.2957072
J. Appl. Phys. 104, 024109 (2008) https://doi.org/10.1063/1.2957591
J. Appl. Phys. 104, 024110 (2008) https://doi.org/10.1063/1.2956611
J. Appl. Phys. 104, 024111 (2008) https://doi.org/10.1063/1.2956704
J. Appl. Phys. 104, 024112 (2008) https://doi.org/10.1063/1.2957080
J. Appl. Phys. 104, 024113 (2008) https://doi.org/10.1063/1.2959341
J. Appl. Phys. 104, 024114 (2008) https://doi.org/10.1063/1.2956605
J. Appl. Phys. 104, 024115 (2008) https://doi.org/10.1063/1.2959831
J. Appl. Phys. 104, 024116 (2008) https://doi.org/10.1063/1.2959830
J. Appl. Phys. 104, 024117 (2008) https://doi.org/10.1063/1.2960469

NANOSCALE SCIENCE AND DESIGN

J. Appl. Phys. 104, 024301 (2008) https://doi.org/10.1063/1.2956329
J. Appl. Phys. 104, 024302 (2008) https://doi.org/10.1063/1.2952035
J. Appl. Phys. 104, 024303 (2008) https://doi.org/10.1063/1.2952046
J. Appl. Phys. 104, 024304 (2008) https://doi.org/10.1063/1.2953177
J. Appl. Phys. 104, 024305 (2008) https://doi.org/10.1063/1.2951478
J. Appl. Phys. 104, 024306 (2008) https://doi.org/10.1063/1.2956707
J. Appl. Phys. 104, 024307 (2008) https://doi.org/10.1063/1.2957052
J. Appl. Phys. 104, 024308 (2008) https://doi.org/10.1063/1.2953075
J. Appl. Phys. 104, 024309 (2008) https://doi.org/10.1063/1.2955450
J. Appl. Phys. 104, 024310 (2008) https://doi.org/10.1063/1.2955784
J. Appl. Phys. 104, 024311 (2008) https://doi.org/10.1063/1.2957071
J. Appl. Phys. 104, 024312 (2008) https://doi.org/10.1063/1.2957590
J. Appl. Phys. 104, 024313 (2008) https://doi.org/10.1063/1.2959643
J. Appl. Phys. 104, 024314 (2008) https://doi.org/10.1063/1.2956864
J. Appl. Phys. 104, 024315 (2008) https://doi.org/10.1063/1.2957069

DEVICE PHYSICS

J. Appl. Phys. 104, 024501 (2008) https://doi.org/10.1063/1.2940135
J. Appl. Phys. 104, 024502 (2008) https://doi.org/10.1063/1.2956395
J. Appl. Phys. 104, 024503 (2008) https://doi.org/10.1063/1.2956333
J. Appl. Phys. 104, 024504 (2008) https://doi.org/10.1063/1.2956689
J. Appl. Phys. 104, 024505 (2008) https://doi.org/10.1063/1.2951895
J. Appl. Phys. 104, 024506 (2008) https://doi.org/10.1063/1.2956696
J. Appl. Phys. 104, 024507 (2008) https://doi.org/10.1063/1.2952031
J. Appl. Phys. 104, 024508 (2008) https://doi.org/10.1063/1.2955731
J. Appl. Phys. 104, 024509 (2008) https://doi.org/10.1063/1.2958327
J. Appl. Phys. 104, 024510 (2008) https://doi.org/10.1063/1.2959821
J. Appl. Phys. 104, 024511 (2008) https://doi.org/10.1063/1.2959817
J. Appl. Phys. 104, 024512 (2008) https://doi.org/10.1063/1.2957076
J. Appl. Phys. 104, 024513 (2008) https://doi.org/10.1063/1.2953072
J. Appl. Phys. 104, 024514 (2008) https://doi.org/10.1063/1.2957589
J. Appl. Phys. 104, 024515 (2008) https://doi.org/10.1063/1.2959841
J. Appl. Phys. 104, 024516 (2008) https://doi.org/10.1063/1.2942395
J. Appl. Phys. 104, 024517 (2008) https://doi.org/10.1063/1.2957489
J. Appl. Phys. 104, 024518 (2008) https://doi.org/10.1063/1.2952036
J. Appl. Phys. 104, 024519 (2008) https://doi.org/10.1063/1.2957065

APPLIED BIOPHYSICS

J. Appl. Phys. 104, 024701 (2008) https://doi.org/10.1063/1.2954956

INTERDISCIPLINARY AND GENERAL PHYSICS

J. Appl. Phys. 104, 024901 (2008) https://doi.org/10.1063/1.2907445
J. Appl. Phys. 104, 024902 (2008) https://doi.org/10.1063/1.2953089
J. Appl. Phys. 104, 024903 (2008) https://doi.org/10.1063/1.2957078
J. Appl. Phys. 104, 024904 (2008) https://doi.org/10.1063/1.2959832
J. Appl. Phys. 104, 024905 (2008) https://doi.org/10.1063/1.2959840

COMMUNICATIONS

J. Appl. Phys. 104, 026101 (2008) https://doi.org/10.1063/1.2958320
J. Appl. Phys. 104, 026102 (2008) https://doi.org/10.1063/1.2957074
J. Appl. Phys. 104, 026103 (2008) https://doi.org/10.1063/1.2958316
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