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APPLIED PHYSICS REVIEWS—FOCUSED REVIEW

J. Appl. Phys. 104, 111101 (2008) https://doi.org/10.1063/1.2973147

LASERS, OPTICS, AND OPTOELECTRONICS

J. Appl. Phys. 104, 113101 (2008) https://doi.org/10.1063/1.3021103
J. Appl. Phys. 104, 113102 (2008) https://doi.org/10.1063/1.3033518
J. Appl. Phys. 104, 113103 (2008) https://doi.org/10.1063/1.3021449
J. Appl. Phys. 104, 113104 (2008) https://doi.org/10.1063/1.2976303
J. Appl. Phys. 104, 113105 (2008) https://doi.org/10.1063/1.3028268
J. Appl. Phys. 104, 113106 (2008) https://doi.org/10.1063/1.3032354
J. Appl. Phys. 104, 113107 (2008) https://doi.org/10.1063/1.3033516
J. Appl. Phys. 104, 113108 (2008) https://doi.org/10.1063/1.3032937
J. Appl. Phys. 104, 113109 (2008) https://doi.org/10.1063/1.3039213
J. Appl. Phys. 104, 113110 (2008) https://doi.org/10.1063/1.2975969
J. Appl. Phys. 104, 113111 (2008) https://doi.org/10.1063/1.3037234
J. Appl. Phys. 104, 113112 (2008) https://doi.org/10.1063/1.3032897
J. Appl. Phys. 104, 113113 (2008) https://doi.org/10.1063/1.3040555
J. Appl. Phys. 104, 113114 (2008) https://doi.org/10.1063/1.3035843
J. Appl. Phys. 104, 113115 (2008) https://doi.org/10.1063/1.3039799
J. Appl. Phys. 104, 113116 (2008) https://doi.org/10.1063/1.3040030
J. Appl. Phys. 104, 113117 (2008) https://doi.org/10.1063/1.3040691
J. Appl. Phys. 104, 113118 (2008) https://doi.org/10.1063/1.3014035
J. Appl. Phys. 104, 113119 (2008) https://doi.org/10.1063/1.3035942
J. Appl. Phys. 104, 113120 (2008) https://doi.org/10.1063/1.3040692

PLASMAS AND ELECTRICAL DISCHARGES

J. Appl. Phys. 104, 113301 (2008) https://doi.org/10.1063/1.3031527
J. Appl. Phys. 104, 113302 (2008) https://doi.org/10.1063/1.3026529
J. Appl. Phys. 104, 113303 (2008) https://doi.org/10.1063/1.3035838
J. Appl. Phys. 104, 113304 (2008) https://doi.org/10.1063/1.3035850
J. Appl. Phys. 104, 113305 (2008) https://doi.org/10.1063/1.3041647

STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER

J. Appl. Phys. 104, 113501 (2008) https://doi.org/10.1063/1.3031216
J. Appl. Phys. 104, 113502 (2008) https://doi.org/10.1063/1.3031652
J. Appl. Phys. 104, 113503 (2008) https://doi.org/10.1063/1.3031799
J. Appl. Phys. 104, 113504 (2008) https://doi.org/10.1063/1.3032900
J. Appl. Phys. 104, 113505 (2008) https://doi.org/10.1063/1.3009677
J. Appl. Phys. 104, 113506 (2008) https://doi.org/10.1063/1.3033514
J. Appl. Phys. 104, 113507 (2008) https://doi.org/10.1063/1.3021314
J. Appl. Phys. 104, 113508 (2008) https://doi.org/10.1063/1.3021357
J. Appl. Phys. 104, 113509 (2008) https://doi.org/10.1063/1.3028261
J. Appl. Phys. 104, 113510 (2008) https://doi.org/10.1063/1.3021052
J. Appl. Phys. 104, 113511 (2008) https://doi.org/10.1063/1.3033547
J. Appl. Phys. 104, 113512 (2008) https://doi.org/10.1063/1.3033390
J. Appl. Phys. 104, 113513 (2008) https://doi.org/10.1063/1.3028687
J. Appl. Phys. 104, 113514 (2008) https://doi.org/10.1063/1.3039215
J. Appl. Phys. 104, 113515 (2008) https://doi.org/10.1063/1.3039511
J. Appl. Phys. 104, 113516 (2008) https://doi.org/10.1063/1.3033370
J. Appl. Phys. 104, 113517 (2008) https://doi.org/10.1063/1.3033634
J. Appl. Phys. 104, 113518 (2008) https://doi.org/10.1063/1.3035831
J. Appl. Phys. 104, 113519 (2008) https://doi.org/10.1063/1.3039802
J. Appl. Phys. 104, 113520 (2008) https://doi.org/10.1063/1.3040082
J. Appl. Phys. 104, 113521 (2008) https://doi.org/10.1063/1.3031697
J. Appl. Phys. 104, 113522 (2008) https://doi.org/10.1063/1.3032544
J. Appl. Phys. 104, 113523 (2008) https://doi.org/10.1063/1.3021089
J. Appl. Phys. 104, 113524 (2008) https://doi.org/10.1063/1.3033378
J. Appl. Phys. 104, 113525 (2008) https://doi.org/10.1063/1.2980338
J. Appl. Phys. 104, 113526 (2008) https://doi.org/10.1063/1.3033555
J. Appl. Phys. 104, 113527 (2008) https://doi.org/10.1063/1.3040717
J. Appl. Phys. 104, 113528 (2008) https://doi.org/10.1063/1.3040023
J. Appl. Phys. 104, 113529 (2008) https://doi.org/10.1063/1.3040700
J. Appl. Phys. 104, 113530 (2008) https://doi.org/10.1063/1.3040718
J. Appl. Phys. 104, 113531 (2008) https://doi.org/10.1063/1.3041478
J. Appl. Phys. 104, 113532 (2008) https://doi.org/10.1063/1.3040720
J. Appl. Phys. 104, 113533 (2008) https://doi.org/10.1063/1.3041156
J. Appl. Phys. 104, 113534 (2008) https://doi.org/10.1063/1.3041479
J. Appl. Phys. 104, 113535 (2008) https://doi.org/10.1063/1.3041490
J. Appl. Phys. 104, 113536 (2008) https://doi.org/10.1063/1.3032895
J. Appl. Phys. 104, 113537 (2008) https://doi.org/10.1063/1.3041495
J. Appl. Phys. 104, 113538 (2008) https://doi.org/10.1063/1.3033521
J. Appl. Phys. 104, 113539 (2008) https://doi.org/10.1063/1.3021358

ELECTRONIC STRUCTURE AND TRANSPORT

J. Appl. Phys. 104, 113701 (2008) https://doi.org/10.1063/1.3020687
J. Appl. Phys. 104, 113702 (2008) https://doi.org/10.1063/1.3032655
J. Appl. Phys. 104, 113703 (2008) https://doi.org/10.1063/1.3021091
J. Appl. Phys. 104, 113704 (2008) https://doi.org/10.1063/1.3035845
J. Appl. Phys. 104, 113705 (2008) https://doi.org/10.1063/1.3010310
J. Appl. Phys. 104, 113706 (2008) https://doi.org/10.1063/1.3032225
J. Appl. Phys. 104, 113707 (2008) https://doi.org/10.1063/1.3032907
J. Appl. Phys. 104, 113708 (2008) https://doi.org/10.1063/1.3009972
J. Appl. Phys. 104, 113709 (2008) https://doi.org/10.1063/1.3032272
J. Appl. Phys. 104, 113710 (2008) https://doi.org/10.1063/1.3033381
J. Appl. Phys. 104, 113711 (2008) https://doi.org/10.1063/1.3039214
J. Appl. Phys. 104, 113712 (2008) https://doi.org/10.1063/1.3033402
J. Appl. Phys. 104, 113713 (2008) https://doi.org/10.1063/1.3033501
J. Appl. Phys. 104, 113714 (2008) https://doi.org/10.1063/1.3033559
J. Appl. Phys. 104, 113715 (2008) https://doi.org/10.1063/1.3032942
J. Appl. Phys. 104, 113716 (2008) https://doi.org/10.1063/1.3033373
J. Appl. Phys. 104, 113717 (2008) https://doi.org/10.1063/1.3035944
J. Appl. Phys. 104, 113718 (2008) https://doi.org/10.1063/1.3037235
J. Appl. Phys. 104, 113719 (2008) https://doi.org/10.1063/1.3039510
J. Appl. Phys. 104, 113720 (2008) https://doi.org/10.1063/1.3039800
J. Appl. Phys. 104, 113721 (2008) https://doi.org/10.1063/1.3040026
J. Appl. Phys. 104, 113722 (2008) https://doi.org/10.1063/1.3041154
J. Appl. Phys. 104, 113723 (2008) https://doi.org/10.1063/1.3039167
J. Appl. Phys. 104, 113724 (2008) https://doi.org/10.1063/1.3035847

MAGNETISM AND SUPERCONDUCTIVITY

J. Appl. Phys. 104, 113901 (2008) https://doi.org/10.1063/1.3032894
J. Appl. Phys. 104, 113902 (2008) https://doi.org/10.1063/1.2987478
J. Appl. Phys. 104, 113903 (2008) https://doi.org/10.1063/1.3033519
J. Appl. Phys. 104, 113904 (2008) https://doi.org/10.1063/1.3010859
J. Appl. Phys. 104, 113905 (2008) https://doi.org/10.1063/1.3021094
J. Appl. Phys. 104, 113906 (2008) https://doi.org/10.1063/1.3032898
J. Appl. Phys. 104, 113907 (2008) https://doi.org/10.1063/1.3032938
J. Appl. Phys. 104, 113908 (2008) https://doi.org/10.1063/1.3037236
J. Appl. Phys. 104, 113909 (2008) https://doi.org/10.1063/1.3021141
J. Appl. Phys. 104, 113910 (2008) https://doi.org/10.1063/1.3033486
J. Appl. Phys. 104, 113911 (2008) https://doi.org/10.1063/1.3032918
J. Appl. Phys. 104, 113912 (2008) https://doi.org/10.1063/1.2993752
J. Appl. Phys. 104, 113913 (2008) https://doi.org/10.1063/1.3035914
J. Appl. Phys. 104, 113914 (2008) https://doi.org/10.1063/1.3040018
J. Appl. Phys. 104, 113915 (2008) https://doi.org/10.1063/1.3040083
J. Appl. Phys. 104, 113916 (2008) https://doi.org/10.1063/1.3040153
J. Appl. Phys. 104, 113917 (2008) https://doi.org/10.1063/1.3040703
J. Appl. Phys. 104, 113918 (2008) https://doi.org/10.1063/1.3032415
J. Appl. Phys. 104, 113919 (2008) https://doi.org/10.1063/1.3040154
J. Appl. Phys. 104, 113920 (2008) https://doi.org/10.1063/1.3041476
J. Appl. Phys. 104, 113921 (2008) https://doi.org/10.1063/1.3040008
J. Appl. Phys. 104, 113922 (2008) https://doi.org/10.1063/1.3035834

DIELECTRICS AND FERROELECTRICITY

J. Appl. Phys. 104, 114101 (2008) https://doi.org/10.1063/1.3021293
J. Appl. Phys. 104, 114102 (2008) https://doi.org/10.1063/1.3028276
J. Appl. Phys. 104, 114103 (2008) https://doi.org/10.1063/1.3020520
J. Appl. Phys. 104, 114104 (2008) https://doi.org/10.1063/1.3035948
J. Appl. Phys. 104, 114105 (2008) https://doi.org/10.1063/1.3031387
J. Appl. Phys. 104, 114106 (2008) https://doi.org/10.1063/1.2988902
J. Appl. Phys. 104, 114107 (2008) https://doi.org/10.1063/1.3035963
J. Appl. Phys. 104, 114108 (2008) https://doi.org/10.1063/1.3035947
J. Appl. Phys. 104, 114109 (2008) https://doi.org/10.1063/1.3037216
J. Appl. Phys. 104, 114110 (2008) https://doi.org/10.1063/1.3033166
J. Appl. Phys. 104, 114111 (2008) https://doi.org/10.1063/1.3033392
J. Appl. Phys. 104, 114112 (2008) https://doi.org/10.1063/1.3002418
J. Appl. Phys. 104, 114113 (2008) https://doi.org/10.1063/1.3032739
J. Appl. Phys. 104, 114114 (2008) https://doi.org/10.1063/1.3035851
J. Appl. Phys. 104, 114115 (2008) https://doi.org/10.1063/1.3041475

NANOSCALE SCIENCE AND DESIGN

J. Appl. Phys. 104, 114301 (2008) https://doi.org/10.1063/1.3032602
J. Appl. Phys. 104, 114302 (2008) https://doi.org/10.1063/1.3032383
J. Appl. Phys. 104, 114303 (2008) https://doi.org/10.1063/1.3032902
J. Appl. Phys. 104, 114304 (2008) https://doi.org/10.1063/1.3032905
J. Appl. Phys. 104, 114305 (2008) https://doi.org/10.1063/1.3033491
J. Appl. Phys. 104, 114306 (2008) https://doi.org/10.1063/1.3032910
J. Appl. Phys. 104, 114307 (2008) https://doi.org/10.1063/1.3033560
J. Appl. Phys. 104, 114308 (2008) https://doi.org/10.1063/1.3039454
J. Appl. Phys. 104, 114309 (2008) https://doi.org/10.1063/1.3014032
J. Appl. Phys. 104, 114310 (2008) https://doi.org/10.1063/1.3033167
J. Appl. Phys. 104, 114311 (2008) https://doi.org/10.1063/1.3021305
J. Appl. Phys. 104, 114312 (2008) https://doi.org/10.1063/1.3035836
J. Appl. Phys. 104, 114313 (2008) https://doi.org/10.1063/1.3040006
J. Appl. Phys. 104, 114314 (2008) https://doi.org/10.1063/1.3042237
J. Appl. Phys. 104, 114315 (2008) https://doi.org/10.1063/1.3033556

DEVICE PHYSICS

J. Appl. Phys. 104, 114501 (2008) https://doi.org/10.1063/1.3021109
J. Appl. Phys. 104, 114502 (2008) https://doi.org/10.1063/1.3033403
J. Appl. Phys. 104, 114503 (2008) https://doi.org/10.1063/1.3033485
J. Appl. Phys. 104, 114504 (2008) https://doi.org/10.1063/1.3037206
J. Appl. Phys. 104, 114505 (2008) https://doi.org/10.1063/1.3029715
J. Appl. Phys. 104, 114506 (2008) https://doi.org/10.1063/1.3032940
J. Appl. Phys. 104, 114507 (2008) https://doi.org/10.1063/1.3033488
J. Appl. Phys. 104, 114508 (2008) https://doi.org/10.1063/1.3033376
J. Appl. Phys. 104, 114509 (2008) https://doi.org/10.1063/1.3033527
J. Appl. Phys. 104, 114510 (2008) https://doi.org/10.1063/1.3033558
J. Appl. Phys. 104, 114511 (2008) https://doi.org/10.1063/1.2996109
J. Appl. Phys. 104, 114512 (2008) https://doi.org/10.1063/1.3032896
J. Appl. Phys. 104, 114513 (2008) https://doi.org/10.1063/1.3033399
J. Appl. Phys. 104, 114514 (2008) https://doi.org/10.1063/1.3033561
J. Appl. Phys. 104, 114515 (2008) https://doi.org/10.1063/1.3031303
J. Appl. Phys. 104, 114516 (2008) https://doi.org/10.1063/1.3033489
J. Appl. Phys. 104, 114517 (2008) https://doi.org/10.1063/1.3039191