(BSTO/SRO) thin-film varactors were fabricated on (001) substrates and characterized at rf and microwave frequencies of up to 10 GHz in the temperature range of 50–300 K. X-ray analysis reveals epitaxial growth of (001)-oriented BSTO films with extended out-of-plane lattice parameter . The tensile out-of-plane strain of BSTO films results in an out-of-plane component of the relative permittivity . The renormalized Curie-Weiss constant and Curie temperature are and , respectively. An interfacial layer presumably forms at the top electrode with a thickness-to-relative permittivity ratio of and reduces the apparent relative permittivity to . The relative tunability of the varactor (at 10 V dc bias) increases from 40% (295 K) up to 80% (125 K) as the temperature decreases in the whole frequency range. The varactor loss tangent increases with increasing frequency and decreasing temperature (from at 1 MHz and 295 K up to at 10 GHz and 125 K, 0 V dc bias). The extrinsic loss of the BSTO film may be ascribed to charged defects associated with oxygen vacancies, at least in the temperature range of 150–300 K. This type of loss is mainly contributing to the total varactor loss balance in the frequency range of up to 500 MHz. At higher frequencies, the loss due to the SRO electrode series resistance starts to dominate. The commutation quality factor of the BSTO/SRO varactor is about 2000 at frequencies of up to 100 MHz and temperatures of less than 230 K, which is quite acceptable for practical applications.
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1 February 2006
Research Article|
February 10 2006
thin-film varactors on bottom electrode
K. Khamchane;
K. Khamchane
Department of Microtechnology and Nanoscience,
Chalmers University of Technology
, SE-41296 Gothenburg, Sweden
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A. Vorobiev;
A. Vorobiev
a)
Department of Microtechnology and Nanoscience,
Chalmers University of Technology
, SE-41296 Gothenburg, Sweden
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T. Claeson;
T. Claeson
Department of Microtechnology and Nanoscience,
Chalmers University of Technology
, SE-41296 Gothenburg, Sweden
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S. Gevorgian
S. Gevorgian
Department of Microtechnology and Nanoscience,
Chalmers University of Technology
, SE-41296 Gothenburg, Sweden and Microwave and High Speed Electronics Research Center
, Ericsson AB, 431 84 Moelndal, Sweden
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a)
Electronic mail: andrei.vorobyev@mc2.chalmers.se
J. Appl. Phys. 99, 034103 (2006)
Article history
Received:
March 30 2005
Accepted:
December 21 2005
Citation
K. Khamchane, A. Vorobiev, T. Claeson, S. Gevorgian; thin-film varactors on bottom electrode. J. Appl. Phys. 1 February 2006; 99 (3): 034103. https://doi.org/10.1063/1.2169870
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