Comparisons between adhesion hysteresis and friction at nanometer and micrometer length scales were investigated experimentally and theoretically. Nanoscale adhesion hysteresis was measured using the ultrasonic force microscopy (UFM) on mica, calcite, and a few metallic samples (Pt, Au, Cu, Zn, Ti, and Fe). Obtained adhesion hysteresis ranged between and . At the microscale a similar setup with a nanoindenter was used and the same samples were investigated. Adhesion hysteresis measured at the microscale ranged between and . Friction was investigated via lateral force microscopy, as well as by scratch tests done with the nanoindenter. Numerical simulations based on the UFM model as well as established theories of contact mechanics studied qualitative dependencies of adhesion hysteresis on experimental parameters. Quantitative relations between adhesion hysteresis and friction were obtained through an analytic model relying on elastic and adhesive properties of the contact. The model agreed with measurements and simulations.
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1 January 2006
Research Article|
January 13 2006
Adhesion hysteresis and friction at nanometer and micrometer lengths
Robert Szoszkiewicz;
Robert Szoszkiewicz
a)
Georgia Institute of Technology
, School of Physics, 837 State Street, Atlanta, Georgia 30332
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Bharat Bhushan;
Bharat Bhushan
Nanotribology Laboratory for Information Storage and MEMS/NEMS(NLIM),
Ohio State University
, Columbus, Ohio 43210
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Bryan D. Huey;
Bryan D. Huey
Institute of Material Science,
University of Connecticut
, Storrs, Connecticut 06269
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Andrzej J. Kulik;
Andrzej J. Kulik
Institute of Physics of Complex Matter
, EPFL, CH-1015 Lausanne, Switzerland
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Gerard Gremaud
Gerard Gremaud
Institute of Physics of Complex Matter
, EPFL, CH-1015 Lausanne, Switzerland
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a)
Electronic mail: [email protected]
J. Appl. Phys. 99, 014310 (2006)
Article history
Received:
June 24 2005
Accepted:
November 21 2005
Citation
Robert Szoszkiewicz, Bharat Bhushan, Bryan D. Huey, Andrzej J. Kulik, Gerard Gremaud; Adhesion hysteresis and friction at nanometer and micrometer lengths. J. Appl. Phys. 1 January 2006; 99 (1): 014310. https://doi.org/10.1063/1.2159081
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