Experimental results of the nonlinear dynamic response of a piezoelectric high displacement actuator known as thin-layer composite unimorph ferroelectric driver and sensor were compared to a theoretical model, which utilizes the multiple scales method to connect the effective spring constant to higher-order stiffness constants of the piezoelectric layer. This type of actuator has prestress gradients resulting from the manufacturing process that have been reported to play an important role in enhanced actuation. A value of was obtained for the higher-order lead zirconate titanate (PZT) stiffness coefficient, which is higher than other published results for PZT without prestress gradients. Peak resonance displacements over were obtained for even small applied fields. The analysis showed a slight voltage dependence that was not specifically accounted for in the theory. This was confirmed by recasting data from other published results and further confirmed by dc offset studies reported here.
Skip Nav Destination
Article navigation
15 September 2005
Research Article|
September 19 2005
Nonlinear dynamics of piezoelectric high displacement actuators in cantilever mode
Tim Usher;
Tim Usher
a)
Department of Physics,
California State University San Bernardino
, 5500 University Parkway, San Bernardino, California 92407-2397
Search for other works by this author on:
J. Appl. Phys. 98, 064102 (2005)
Article history
Received:
January 07 2005
Accepted:
August 01 2005
Citation
Tim Usher, Alec Sim; Nonlinear dynamics of piezoelectric high displacement actuators in cantilever mode. J. Appl. Phys. 15 September 2005; 98 (6): 064102. https://doi.org/10.1063/1.2041844
Download citation file:
Sign in
Don't already have an account? Register
Sign In
You could not be signed in. Please check your credentials and make sure you have an active account and try again.
Sign in via your Institution
Sign in via your InstitutionPay-Per-View Access
$40.00
Citing articles via
A step-by-step guide to perform x-ray photoelectron spectroscopy
Grzegorz Greczynski, Lars Hultman
High resolution in non-destructive testing: A review
Anish Kumar, Walter Arnold
GaN-based power devices: Physics, reliability, and perspectives
Matteo Meneghini, Carlo De Santi, et al.

