The surface structure of the hydrogen-saturated Si(110) surfaces after wet cleaning is studied on an atomic scale by means of scanning tunneling microscopy. When a surface oxide layer is stripped using a HF-containing solution, the surface consists of nanometer-scaled terraces and atomic steps along various directions. Coupled monohydride lines are formed inside a small terrace, as predicted by infrared spectra. The Si(110) surface after subsequent rinsing for a short period is occupied by a long terrace along the direction in which the ideal structure is formed. Atomic arrangements around step edges are determined in detail based on atomic images and first-principles calculations. A ridge-shaped structure is observed after excess rinsing with water, and infrared spectra indicate that the slope is composed of (111) microfacets. From these results, we present the mechanism underlying the formation of the hydrogen-terminated Si(110) surfaces during wet cleaning processes.
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15 November 2005
Research Article|
November 29 2005
Hydrogen termination of Si(110) surfaces upon wet cleaning revealed by highly resolved scanning tunneling microscopy
Kenta Arima;
Kenta Arima
a)
Department of Precision Science and Technology, Graduate School of Engineering,
Osaka University
, 2-1, Yamadaoka, Suita, Osaka 565-0871, Japan
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Jun Katoh;
Jun Katoh
Research Center for Ultra-Precision Science and Technology, Graduate School of Engineering,
Osaka University
, 2-1, Yamadaoka, Suita, Osaka 565-0871, Japan
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Shinya Horie;
Shinya Horie
Research Center for Ultra-Precision Science and Technology, Graduate School of Engineering,
Osaka University
, 2-1, Yamadaoka, Suita, Osaka 565-0871, Japan
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Katsuyoshi Endo;
Katsuyoshi Endo
Research Center for Ultra-Precision Science and Technology, Graduate School of Engineering,
Osaka University
, 2-1, Yamadaoka, Suita, Osaka 565-0871, Japan
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Tomoya Ono;
Tomoya Ono
Department of Precision Science and Technology, Graduate School of Engineering,
Osaka University
, 2-1, Yamadaoka, Suita, Osaka 565-0871, Japan
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Shigetoshi Sugawa;
Shigetoshi Sugawa
Department of Management of Science and Technology, Graduate School of Engineering,
Tohoku University
, Aza Aoba 6-6-10, Aramaki, Aoba-ku, Sendai, Miyagi 980-8579, Japan
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Hiroshi Akahori;
Hiroshi Akahori
New Industry Creation Hatchery Center,
Tohoku University
, Aza Aoba 6-6-10, Aramaki, Aoba-ku, Sendai, Miyagi 980-8579, Japan
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Akinobu Teramoto;
Akinobu Teramoto
New Industry Creation Hatchery Center,
Tohoku University
, Aza Aoba 6-6-10, Aramaki, Aoba-ku, Sendai, Miyagi 980-8579, Japan
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Tadahiro Ohmi
Tadahiro Ohmi
New Industry Creation Hatchery Center,
Tohoku University
, Aza Aoba 6-6-10, Aramaki, Aoba-ku, Sendai, Miyagi 980-8579, Japan
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a)
Electronic mail: arima@prec.eng.osaka-u.ac.jp
J. Appl. Phys. 98, 103525 (2005)
Article history
Received:
June 20 2005
Accepted:
October 17 2005
Citation
Kenta Arima, Jun Katoh, Shinya Horie, Katsuyoshi Endo, Tomoya Ono, Shigetoshi Sugawa, Hiroshi Akahori, Akinobu Teramoto, Tadahiro Ohmi; Hydrogen termination of Si(110) surfaces upon wet cleaning revealed by highly resolved scanning tunneling microscopy. J. Appl. Phys. 15 November 2005; 98 (10): 103525. https://doi.org/10.1063/1.2136214
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