An alternative approach to the so-called “lift-off” technology is presented, in which a solar cell absorber film is detached from a Mo-coated glass substrate. The proposed lift-off takes advantage of an interfacial layer, acting as a sacrificial layer, which forms at the rear contact during the growth of the film. No additional processing step is thus required to proceed with the lift-off. The lift-off was carried out in ultrahigh vacuum for quality assessment, and the rear and top surfaces were characterized by means of surface-sensitive techniques, namely, Kelvin probe force microscopy and photoelectron spectroscopy. The cleanness of the rear surface was confirmed by the absence of Mo remnants, thus demonstrating the suitability of the proposed method for further processing of the absorber film onto alternative substrates. In addition, a quantitative analysis of surface photovoltage, doping concentration, and interface charge at grain boundaries on the absorber’s rear surface is presented, exploiting the convenience of the procedure for characterization purposes. Preliminary results regarding the device performance and identification of limiting factors are reported.
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1 May 2005
Research Article|
April 22 2005
Lift-off process and rear-side characterization of chalcopyrite thin films and solar cells Available to Purchase
D. Fuertes Marrón;
D. Fuertes Marrón
a)
Department of Solar Energy,
Hahn–Meitner Institut
, Glienicker Strasse 100, 14109 Berlin, Germany
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A. Meeder;
A. Meeder
b)
Department of Solar Energy,
Hahn–Meitner Institut
, Glienicker Strasse 100, 14109 Berlin, Germany
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S. Sadewasser;
S. Sadewasser
Department of Solar Energy,
Hahn–Meitner Institut
, Glienicker Strasse 100, 14109 Berlin, Germany
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R. Würz;
R. Würz
Department of Solar Energy,
Hahn–Meitner Institut
, Glienicker Strasse 100, 14109 Berlin, Germany
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C. A. Kaufmann;
C. A. Kaufmann
Department of Solar Energy,
Hahn–Meitner Institut
, Glienicker Strasse 100, 14109 Berlin, Germany
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Th. Glatzel;
Th. Glatzel
Department of Solar Energy,
Hahn–Meitner Institut
, Glienicker Strasse 100, 14109 Berlin, Germany
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Th. Schedel-Niedrig;
Th. Schedel-Niedrig
Department of Solar Energy,
Hahn–Meitner Institut
, Glienicker Strasse 100, 14109 Berlin, Germany
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M. Ch. Lux-Steiner
M. Ch. Lux-Steiner
Department of Solar Energy,
Hahn–Meitner Institut
, Glienicker Strasse 100, 14109 Berlin, Germany
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D. Fuertes Marrón
a)
Department of Solar Energy,
Hahn–Meitner Institut
, Glienicker Strasse 100, 14109 Berlin, Germany
A. Meeder
b)
Department of Solar Energy,
Hahn–Meitner Institut
, Glienicker Strasse 100, 14109 Berlin, Germany
S. Sadewasser
Department of Solar Energy,
Hahn–Meitner Institut
, Glienicker Strasse 100, 14109 Berlin, Germany
R. Würz
Department of Solar Energy,
Hahn–Meitner Institut
, Glienicker Strasse 100, 14109 Berlin, Germany
C. A. Kaufmann
Department of Solar Energy,
Hahn–Meitner Institut
, Glienicker Strasse 100, 14109 Berlin, Germany
Th. Glatzel
Department of Solar Energy,
Hahn–Meitner Institut
, Glienicker Strasse 100, 14109 Berlin, Germany
Th. Schedel-Niedrig
Department of Solar Energy,
Hahn–Meitner Institut
, Glienicker Strasse 100, 14109 Berlin, Germany
M. Ch. Lux-Steiner
Department of Solar Energy,
Hahn–Meitner Institut
, Glienicker Strasse 100, 14109 Berlin, Germanya)
Author to whom correspondence should be addressed; electronic mail: [email protected]
b)
Present address: Sulfurcell GmbH, Barbara McClintock Str. 11, 12489 Berlin, Germany.
J. Appl. Phys. 97, 094915 (2005)
Article history
Received:
October 01 2004
Accepted:
February 24 2005
Citation
D. Fuertes Marrón, A. Meeder, S. Sadewasser, R. Würz, C. A. Kaufmann, Th. Glatzel, Th. Schedel-Niedrig, M. Ch. Lux-Steiner; Lift-off process and rear-side characterization of chalcopyrite thin films and solar cells. J. Appl. Phys. 1 May 2005; 97 (9): 094915. https://doi.org/10.1063/1.1891274
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