Piezoresponse force microscopy (PFM) is applied to image ferroelastic formed c domains in a single crystal ferroelectric barium titanate bulk material. A simple model and an analytical approach are presented, which provides a basis to understand the complex tip-surface interactions responsible for the image contrast in PFM. In particular, the measured amplitude of the piezoresponse out-of-plane surface displacements of a domain is compared with theoretical results based upon a three-dimensional Green’s function solution. The electric field distribution in the tip-surface contact is determined using image-charge calculations for a spherical tip separated by a thin water layer from a mechanically isotropic and electrically anisotropic dielectric half plane.
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1 July 2004
Research Article|
July 01 2004
Modeling and measurement of surface displacements in bulk material in piezoresponse force microscopy
F. Felten;
F. Felten
Advanced Ceramics Group, Technical University of Hamburg-Harburg, 21073 Hamburg, Germany
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G. A. Schneider;
G. A. Schneider
Advanced Ceramics Group, Technical University of Hamburg-Harburg, 21073 Hamburg, Germany
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J. Muñoz Saldaña;
J. Muñoz Saldaña
Centro de Investigación y de Estudios Avanzados del IPN, Unidad Querétaro, Libramiento Norponiente No. 2000, Fraccionamiento Real de Juriquilla, Querétaro 76230, Mexico
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S. V. Kalinin
S. V. Kalinin
Oak Ridge National Laboratory, Condensed Matter Sciences Division, Oak Ridge, Tennessee 37831
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J. Appl. Phys. 96, 563–568 (2004)
Article history
Received:
December 22 2003
Accepted:
April 10 2004
Citation
F. Felten, G. A. Schneider, J. Muñoz Saldaña, S. V. Kalinin; Modeling and measurement of surface displacements in bulk material in piezoresponse force microscopy. J. Appl. Phys. 1 July 2004; 96 (1): 563–568. https://doi.org/10.1063/1.1758316
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