In this article we investigate the spurious excitation of compressional waves by thickness-shear-mode resonators, which are commonly used for chemical sensing and viscosity sensing. In particular, we consider the excitation mechanism due to the nonuniform shear displacement present at the sensitive surface of the resonator. To illustrate the basic mechanism we analytically develop a general solution for a two-dimensional model describing the displacement and the pressure distribution in the liquid obtained in terms of Fourier integrals. We discuss these solutions and derive a useful approximation for the far field representing said compressional modes. We finally illustrate the results considering a practical example and associated numerical results.
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1 May 2004
Research Article|
May 01 2004
A two-dimensional analysis of spurious compressional wave excitation by thickness-shear-mode resonators
Roman Beigelbeck;
Roman Beigelbeck
Institute of Sensor and Actuator Systems, Vienna University of Technology, Gusshausstrasse 27/366, A-1040 Vienna, Austria
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Bernhard Jakoby
Bernhard Jakoby
Institute of Sensor and Actuator Systems, Vienna University of Technology, Gusshausstrasse 27/366, A-1040 Vienna, Austria
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J. Appl. Phys. 95, 4989–4995 (2004)
Article history
Received:
September 11 2003
Accepted:
February 13 2004
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Citation
Roman Beigelbeck, Bernhard Jakoby; A two-dimensional analysis of spurious compressional wave excitation by thickness-shear-mode resonators. J. Appl. Phys. 1 May 2004; 95 (9): 4989–4995. https://doi.org/10.1063/1.1697637
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