A Schottky diode type sample with InAs quantum dots (QDs) embedded in the intrinsic GaAs region between the Schottky contact and the n-doped GaAs-back contact was used to investigate the electron transport into and through InAs QDs. According to a simple leverage law the QD ground state resonance shifts to higher gate voltages when the thickness of the tunneling barrier between the QDs and the Schottky contact is reduced from to Additionally, the transition from a pure capacitive to a predominant conductive signal of the QD ground state is observed. The gate voltage offset between the charging and the tunneling signal of the s-shell is explained by QDs of different size dominating the ohmic and the capacitive traces, respectively. This interpretation is confirmed by different Coulomb blockade energies as well as different confinement energies of the QD ground state determined from both types of signal.
Skip Nav Destination
Article navigation
15 May 2004
Research Article|
May 15 2004
Capacitance and tunneling spectroscopy of InAs quantum dots
K. H. Schmidt;
K. H. Schmidt
Werkstoffe und Nanoelektronik, Ruhr-Universität Bochum, D-44780 Bochum, Germany
Search for other works by this author on:
C. Bock;
C. Bock
Werkstoffe und Nanoelektronik, Ruhr-Universität Bochum, D-44780 Bochum, Germany
Search for other works by this author on:
M. Versen;
M. Versen
Werkstoffe und Nanoelektronik, Ruhr-Universität Bochum, D-44780 Bochum, Germany
Search for other works by this author on:
U. Kunze;
U. Kunze
Werkstoffe und Nanoelektronik, Ruhr-Universität Bochum, D-44780 Bochum, Germany
Search for other works by this author on:
D. Reuter;
D. Reuter
Angewandte Festkörperphysik, Ruhr-Universität Bochum, D-44780 Bochum, Germany
Search for other works by this author on:
A. D. Wieck
A. D. Wieck
Angewandte Festkörperphysik, Ruhr-Universität Bochum, D-44780 Bochum, Germany
Search for other works by this author on:
J. Appl. Phys. 95, 5715–5721 (2004)
Article history
Received:
November 26 2003
Accepted:
February 18 2004
Citation
K. H. Schmidt, C. Bock, M. Versen, U. Kunze, D. Reuter, A. D. Wieck; Capacitance and tunneling spectroscopy of InAs quantum dots. J. Appl. Phys. 15 May 2004; 95 (10): 5715–5721. https://doi.org/10.1063/1.1703827
Download citation file:
Pay-Per-View Access
$40.00
Sign In
You could not be signed in. Please check your credentials and make sure you have an active account and try again.
Citing articles via
A step-by-step guide to perform x-ray photoelectron spectroscopy
Grzegorz Greczynski, Lars Hultman
Scaling effects on the microstructure and thermomechanical response of through silicon vias (TSVs)
Shuhang Lyu, Thomas Beechem, et al.
Related Content
Highly tunable, high-throughput nanolithography based on strained regioregular conducting polymer films
Appl. Phys. Lett. (July 2006)