Epitaxy of oxide materials on silicon (Si) substrates is of great interest for future functional devices using the large variety of physical properties of the oxides as ferroelectricity, ferromagnetism, or superconductivity. Recently, materials with high spin polarization of the charge carriers have become interesting for semiconductor-oxide hybrid devices in spin electronics. Here, we report on pulsed laser deposition of magnetite (Fe3O4) on Si(001) substrates cleaned by an in situ laser beam high temperature treatment. After depositing a double buffer layer of titanium nitride and magnesium oxide (MgO), a high quality epitaxial magnetite layer can be grown as verified by reflection high energy electron diffraction intensity oscillations and high resolution x-ray diffraction.

1.
Z.
Yu
et al.,
J. Vac. Sci. Technol. B
18
,
2139
(
2000
).
2.
S.
Datta
and
B.
Das
,
Appl. Phys. Lett.
56
,
665
(
1990
).
3.
J.
Kikkawa
and
D. D.
Awschalom
,
Nature (London)
397
,
139
(
1999
).
4.
R.
Fiederling
,
M.
Keim
,
G.
Reusher
,
W.
Ossau
,
G.
Schmidt
,
A.
Waag
, and
L.
Molemkamp
,
Nature (London)
402
,
787
(
1999
).
5.
Y.
Ohno
,
D. K.
Young
,
B.
Beschoten
,
F.
Matsukura
,
H.
Ohno
, and
D. D.
Awschalom
,
Nature (London)
402
,
790
(
1999
).
6.
A.
Gupta
and
J. Z.
Sun
,
J. Magn. Magn. Mater.
24–43
,
200
(
1999
).
7.
J. B.
Philipp
,
J.
Klein
,
D.
Reisinger
,
M.
Schonecke
,
A.
Marx
,
A.
Erb
,
L.
Alff
, and
R.
Gross
,
Appl. Phys. Lett.
79
,
3654
(
2001
).
8.
G.
Schmidt
,
D.
Ferrand
,
L. W.
Molemkamp
,
A. T.
Filip
, and
B. J.
Van Wees
,
Phys. Rev. B
62
,
4790
(
2000
).
9.
E.
Rashba
,
Phys. Rev. B
62
,
R16267
(
2000
).
10.
A.
Fert
and
H.
Jaffrès
,
Phys. Rev. B
64
,
184420
(
2001
).
11.
W. L.
Zhou
et al.,
J. Appl. Phys.
89
,
7398
(
2001
).
12.
D.
Kumar
et al.,
Appl. Phys. Lett.
78
,
1098
(
2001
).
13.
R.
Gross
et al.,
Proc. SPIE
4058
,
278
(
2000
).
14.
J.
Klein
,
C.
Höfener
,
L.
Alff
, and
R.
Gross
,
J. Magn. Magn. Mater.
211
,
9
(
2000
);
see also
J.
Klein
,
C.
Höfener
,
L.
Alff
, and
R.
Gross
,
Supercond. Sci. Technol.
12
,
1023
(
1999
);
and
J.
Klein
,
C.
Höfener
,
L.
Alff
, and
R.
Gross
,
Phys. Status Solidi A
189
,
617
(
2002
).
15.
G. J. H. M.
Rijnders
,
G.
Koster
,
D. H. A.
Blank
, and
H.
Rogalla
,
Appl. Phys. Lett.
70
,
1888
(
1997
).
16.
S.
Ohashi
,
M.
Lippmaa
,
N.
Nakagawa
,
H.
Nagasawa
,
H.
Koinuma
, and
M.
Kawasaki
,
Rev. Sci. Instrum.
70
,
178
(
1999
).
17.
R.
Chowdury
,
X.
Chen
, and
J.
Narayan
,
Appl. Phys. Lett.
64
,
1236
(
1994
).
18.
P. R.
Willmott
,
R.
Timm
, and
J. R.
Huber
,
Appl. Surf. Sci.
127–129
,
105
(
1998
).
19.
D.
Reisinger
,
B.
Blass
,
J.
Klein
,
J. B.
Philipp
,
M.
Schonecke
,
A.
Erb
,
L.
Alff
, and
R.
Gross
, cond-mat/0208495;
Appl. Phys. A: Mater. Sci. Process. (in press).
20.
Bruker AXS Windows RefSim simulation software (based on dynamical scattering theory).
This content is only available via PDF.
You do not currently have access to this content.