Recent advances in the theory and experimental realization of ferromagnetic semiconductors give hope that a new generation of microelectronic devices based on the spin degree of freedom of the electron can be developed. This review focuses primarily on promising candidate materials (such as GaN, GaP and ZnO) in which there is already a technology base and a fairly good understanding of the basic electrical and optical properties. The introduction of Mn into these and other materials under the right conditions is found to produce ferromagnetism near or above room temperature. There are a number of other potential dopant ions that could be employed (such as Fe, Ni, Co, Cr) as suggested by theory [see, for example, Sato and Katayama-Yoshida, Jpn. J. Appl. Phys., Part 2 39, L555 (2000)]. Growth of these ferromagnetic materials by thin film techniques, such as molecular beam epitaxy or pulsed laser deposition, provides excellent control of the dopant concentration and the ability to grow single-phase layers. The mechanism for the observed magnetic behavior is complex and appears to depend on a number of factors, including Mn–Mn spacing, and carrier density and type. For example, in a simple Ruderman–Kittel–Kasuya–Yosida carrier-mediated exchange mechanism, the free-carrier/Mn ion interaction can be either ferromagnetic or antiferromagnetic depending on the separation of the Mn ions. Potential applications for ferromagnetic semiconductors and oxides include electrically controlled magnetic sensors and actuators, high-density ultralow-power memory and logic, spin-polarized light emitters for optical encoding, advanced optical switches and modulators and devices with integrated magnetic, electronic and optical functionality.
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1 January 2003
Review Article|
January 01 2003
Wide band gap ferromagnetic semiconductors and oxides
S. J. Pearton;
S. J. Pearton
Department of Materials Science and Engineering, University of Florida, Gainesville, Florida 32611
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C. R. Abernathy;
C. R. Abernathy
Department of Materials Science and Engineering, University of Florida, Gainesville, Florida 32611
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M. E. Overberg;
M. E. Overberg
Department of Materials Science and Engineering, University of Florida, Gainesville, Florida 32611
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G. T. Thaler;
G. T. Thaler
Department of Materials Science and Engineering, University of Florida, Gainesville, Florida 32611
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D. P. Norton;
D. P. Norton
Department of Materials Science and Engineering, University of Florida, Gainesville, Florida 32611
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N. Theodoropoulou;
N. Theodoropoulou
Department of Physics, University of Florida, Gainesville, Florida 32611
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A. F. Hebard;
A. F. Hebard
Department of Physics, University of Florida, Gainesville, Florida 32611
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Y. D. Park;
Y. D. Park
Center for Strongly Correlated Materials Research, Seoul National University, Seoul 151-747, Korea
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F. Ren;
F. Ren
Department of Chemical Engineering, University of Florida, Gainesville, Florida 32611
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J. Kim;
J. Kim
Department of Chemical Engineering, University of Florida, Gainesville, Florida 32611
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L. A. Boatner
L. A. Boatner
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37813
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S. J. Pearton
C. R. Abernathy
M. E. Overberg
G. T. Thaler
D. P. Norton
N. Theodoropoulou
A. F. Hebard
Y. D. Park
F. Ren
J. Kim
L. A. Boatner
Department of Materials Science and Engineering, University of Florida, Gainesville, Florida 32611
J. Appl. Phys. 93, 1–13 (2003)
Article history
Received:
March 07 2002
Accepted:
May 03 2002
Citation
S. J. Pearton, C. R. Abernathy, M. E. Overberg, G. T. Thaler, D. P. Norton, N. Theodoropoulou, A. F. Hebard, Y. D. Park, F. Ren, J. Kim, L. A. Boatner; Wide band gap ferromagnetic semiconductors and oxides. J. Appl. Phys. 1 January 2003; 93 (1): 1–13. https://doi.org/10.1063/1.1517164
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