The optical constants of unintentionally doped lattice matched to InP have been measured at 300 K using spectral ellipsometry in the range of 0.4 to 5.1 eV. The spectra displayed distinct structures associated with critical points at (direct gap), spin-orbit split component, spin-orbit split feature, as well as The experimental data over the entire measured spectral range (after oxide removal) has been fit using the Holden model dielectric function [Holden et al., Phys. Rev. B 56, 4037 (1997)], plus a Kramers–Kronig consistent correction, described in this work, that improves the fitting at low energies. This extended model is based on the electronic energy-band structure near these critical points plus excitonic and band-to-band Coulomb-enhancement effects at and the doublet. In addition to evaluating the energies of these various band-to-band critical points, information about the binding energy of the two-dimensional exciton related to the critical points was obtained. The value of was in good agreement with effective theory. The ability to evaluate has important ramifications for first-principles band-structure calculations that include exciton effects at and [M. Rohlfing and S. G. Louie, Phys. Rev. Lett. 81, 2312 (1998); S. Albrecht et al., Phys. Rev. Lett. 80, 4510 (1998)].
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15 November 2002
Research Article|
November 15 2002
Optical constants of Experiment and modeling
Martı́n Muñoz;
Martı́n Muñoz
Department of Physics
New York Center for Advanced Technology in Ultrafast Photonic Materials and Applications, Brooklyn College of the City University of New York, Brooklyn, New York 11210
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Todd M. Holden;
Todd M. Holden
Department of Physics
New York Center for Advanced Technology in Ultrafast Photonic Materials and Applications, Brooklyn College of the City University of New York, Brooklyn, New York 11210
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Fred H. Pollak;
Fred H. Pollak
Department of Physics
New York Center for Advanced Technology in Ultrafast Photonic Materials and Applications, Brooklyn College of the City University of New York, Brooklyn, New York 11210
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Mathias Kahn;
Mathias Kahn
Department of Electrical Engineering, Technion-Israel Institute of Technology, Haifa 32000, Israel
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Dan Ritter;
Dan Ritter
Department of Electrical Engineering, Technion-Israel Institute of Technology, Haifa 32000, Israel
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Leeor Kronik;
Leeor Kronik
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, Minnesota 55455
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Guy M. Cohen
Guy M. Cohen
IBM T. J. Watson Research Center, Route 134/P.O. Box 218, Yorktown Heights, New York 10598
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J. Appl. Phys. 92, 5878–5885 (2002)
Article history
Received:
July 08 2002
Accepted:
August 28 2002
Citation
Martı́n Muñoz, Todd M. Holden, Fred H. Pollak, Mathias Kahn, Dan Ritter, Leeor Kronik, Guy M. Cohen; Optical constants of Experiment and modeling. J. Appl. Phys. 15 November 2002; 92 (10): 5878–5885. https://doi.org/10.1063/1.1515374
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