Distributed Bragg reflectors (DBRs) based on ZnCdSe and ZnCdMgSe quarter wave layers have been grown on InP (001) substrates by molecular beam epitaxy. Their reflectivity maxima were controlled by the individual thicknesses of constituent layers, and were adjusted in the range of 615–500 nm, covering the red, green, and blue-green regions of the visible spectrum. The crystal quality of the structures was assessed by double crystal x-ray diffraction measurements. Reflectivity as high as 95% was achieved for the DBR structures that consisted of 16 periods. Theoretical calculations, based on the transfer matrix method, predict that a reflectivity above 99% can be achieved by increasing the number of periods to between 20 and 26.

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