The yield stress of magnetorheological (MR) fluids depends on the induced solid structure. Since thick columns have a yield stress much higher than a single-chain structure, we improve the yield stress of MR fluids by changing the fluid microstructure. Immediately after a magnetic field is applied, we compress the MR fluid along the field direction. Scanning electron microscopy images show that particle chains are pushed together to form thick columns. The shear force measured after the compression shows that the structure-enhanced static yield stress can reach as high as 800 kPa under a moderate magnetic field, while the same MR fluid has a yield stress of 80 kPa without compression. This improved yield stress increases with the magnetic field and compression pressure and has an upper limit well above 800 kPa. The method may also be useful for electrorheological fluids.
Skip Nav Destination
Article navigation
1 March 2000
Research Article|
March 01 2000
Structure-enhanced yield stress of magnetorheological fluids
X. Tang;
X. Tang
Department of Physics, Southern Illinois University, Carbondale, Illinois 62901-4401
Search for other works by this author on:
X. Zhang;
X. Zhang
Department of Physics, Southern Illinois University, Carbondale, Illinois 62901-4401
Search for other works by this author on:
R. Tao;
R. Tao
Department of Physics, Southern Illinois University, Carbondale, Illinois 62901-4401
Search for other works by this author on:
Yiming Rong
Yiming Rong
Department of Mechanical Engineering, Worcester Polytechnic Institute, Worcester, Massachusetts 01609-2280
Search for other works by this author on:
J. Appl. Phys. 87, 2634–2638 (2000)
Article history
Received:
April 27 1999
Accepted:
November 19 1999
Citation
X. Tang, X. Zhang, R. Tao, Yiming Rong; Structure-enhanced yield stress of magnetorheological fluids. J. Appl. Phys. 1 March 2000; 87 (5): 2634–2638. https://doi.org/10.1063/1.372229
Download citation file:
Pay-Per-View Access
$40.00
Sign In
You could not be signed in. Please check your credentials and make sure you have an active account and try again.
Citing articles via
A step-by-step guide to perform x-ray photoelectron spectroscopy
Grzegorz Greczynski, Lars Hultman
Piezoelectric thin films and their applications in MEMS: A review
Jinpeng Liu, Hua Tan, et al.
Tutorial: Simulating modern magnetic material systems in mumax3
Jonas J. Joos, Pedram Bassirian, et al.
Related Content
Study on the mechanism of the squeeze-strengthen effect in magnetorheological fluids
J. Appl. Phys. (August 2004)
Generalized rheology of active materials
J. Appl. Phys. (December 2000)
Structure evolution in electrorheological and magnetorheological suspensions from a continuum perspective
J. Appl. Phys. (May 2003)
Particle–particle interactions in electrorheological fluids based on surface conducting particles
J. Appl. Phys. (December 1999)
Mechanical property of electrorheological fluid under step compression
J. Appl. Phys. (December 2002)