The distance between sample and probe in a scanning near-field optical microscope is regulated via tracing the shear-force on the tip which is glued to a tuning fork piezo. A lock-in technique is used. We demonstrate that the bandwidth of the control loop is increased if not only amplitude or phase, but a favorable combination of both is used as feedback signal. The enhancement of bandwidth is connected with a reduction of signal-to-noise ratio. The optimum combination of both, bandwidth and signal-to-noise ratio, can be adjusted purely electronically to the specific needs of an experiment. A theoretical model is developed that discloses the relation between the mechanical and electrical properties of the combination of tuning fork and fiber tip. The frequency response of the shear-force detection system is calculated with a numerical simulation based on this model. Experimental frequency response curves are well fitted by these simulations. Our results are especially important for low-temperature scanning microscopy, where the bandwidth enhancement is essential for obtaining a reasonable scanning speed.
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1 July 1999
Research Article|
July 01 1999
Bandwidth enhancement of a shear-force-controlled distance regulation in near-field microscopy
M. Lippitz;
M. Lippitz
Fachbereich Physik und Wissenschaftliches Zentrum für Materialwissenschaften der Philipps-Universität, Renthof 5, D-35032 Marburg, Germany
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M. Schüttler;
M. Schüttler
Fachbereich Physik und Wissenschaftliches Zentrum für Materialwissenschaften der Philipps-Universität, Renthof 5, D-35032 Marburg, Germany
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H. Giessen;
H. Giessen
Fachbereich Physik und Wissenschaftliches Zentrum für Materialwissenschaften der Philipps-Universität, Renthof 5, D-35032 Marburg, Germany
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M. Born;
M. Born
Fachbereich Physik und Wissenschaftliches Zentrum für Materialwissenschaften der Philipps-Universität, Renthof 5, D-35032 Marburg, Germany
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W. W. Rühle
W. W. Rühle
Fachbereich Physik und Wissenschaftliches Zentrum für Materialwissenschaften der Philipps-Universität, Renthof 5, D-35032 Marburg, Germany
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J. Appl. Phys. 86, 100–106 (1999)
Article history
Received:
October 16 1998
Accepted:
March 25 1999
Citation
M. Lippitz, M. Schüttler, H. Giessen, M. Born, W. W. Rühle; Bandwidth enhancement of a shear-force-controlled distance regulation in near-field microscopy. J. Appl. Phys. 1 July 1999; 86 (1): 100–106. https://doi.org/10.1063/1.370705
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