The magnetic microstructure of thin films is studied using Lorentz transmission electron microscopy (TEM). The zero-field-cooled magnetic stripe structure shows one-to-one correlation with the crystal domain structure and is used to identify the uniaxial magnetic anisotropy of these films, consistent with results on single domain films. The anisotropy is shown to be primarily magnetocrystalline in nature with the b axis as the easy axis. Lorentz TEM also yields quantitative information about the domain structure and domain wall resistivity, and allows for in situ observation of domain wall formation and dynamic response to an applied field.
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