We explored degradation in electron-beam-pumped laser structures by combining cathodoluminescence (CL) measurements in a scanning electron microscope with transmission electron microscopy. The rate of degradation, measured as the decrease of the emitted CL intensity under electron bombardment, depends critically on the threading dislocation density and on the strain in the quantum well. Degradation occurs via the formation of dark spot defects, which are related to bombardment-induced networks of dislocation loops in the quantum well. These degradation defects often initiate where threading dislocations cross the quantum well. We propose a self-supporting dislocation climb mechanism activated by nonradiative recombination to explain the formation and propagation of the degradation defects.
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1 August 1998
Research Article|
August 01 1998
Combined transmission electron microscopy and cathodoluminescence studies of degradation in electron-beam-pumped blue-green lasers Available to Purchase
Jean-Marc Bonard;
Jean-Marc Bonard
Institut de Micro- et Optoélectronique, Département de Physique, Ecole Polytechnique Fédérale, CH-1015 Lausanne, Switzerland
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Jean-Daniel Ganière;
Jean-Daniel Ganière
Institut de Micro- et Optoélectronique, Département de Physique, Ecole Polytechnique Fédérale, CH-1015 Lausanne, Switzerland
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Lia Vanzetti;
Lia Vanzetti
Laboratorio Nazionale TASC-INFM, Area di Ricerca, Padriciano 99, I-34012 Trieste, Italy
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Jens J. Paggel;
Jens J. Paggel
Laboratorio Nazionale TASC-INFM, Area di Ricerca, Padriciano 99, I-34012 Trieste, Italy
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Lucia Sorba;
Lucia Sorba
Laboratorio Nazionale TASC-INFM, Area di Ricerca, Padriciano 99, I-34012 Trieste, Italy
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Alfonso Franciosi;
Alfonso Franciosi
Laboratorio Nazionale TASC-INFM, Area di Ricerca, Padriciano 99, I-34012 Trieste, Italy
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Denis Hervé;
Denis Hervé
LETI (CEA-Technologies Avancées), Département Optronique, 17 rue des Martyrs, F-38054 Grenoble Cédex 9, France
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Engin Molva
Engin Molva
LETI (CEA-Technologies Avancées), Département Optronique, 17 rue des Martyrs, F-38054 Grenoble Cédex 9, France
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Jean-Marc Bonard
Institut de Micro- et Optoélectronique, Département de Physique, Ecole Polytechnique Fédérale, CH-1015 Lausanne, Switzerland
Jean-Daniel Ganière
Institut de Micro- et Optoélectronique, Département de Physique, Ecole Polytechnique Fédérale, CH-1015 Lausanne, Switzerland
Lia Vanzetti
Laboratorio Nazionale TASC-INFM, Area di Ricerca, Padriciano 99, I-34012 Trieste, Italy
Jens J. Paggel
Laboratorio Nazionale TASC-INFM, Area di Ricerca, Padriciano 99, I-34012 Trieste, Italy
Lucia Sorba
Laboratorio Nazionale TASC-INFM, Area di Ricerca, Padriciano 99, I-34012 Trieste, Italy
Alfonso Franciosi
Laboratorio Nazionale TASC-INFM, Area di Ricerca, Padriciano 99, I-34012 Trieste, Italy
Denis Hervé
LETI (CEA-Technologies Avancées), Département Optronique, 17 rue des Martyrs, F-38054 Grenoble Cédex 9, France
Engin Molva
LETI (CEA-Technologies Avancées), Département Optronique, 17 rue des Martyrs, F-38054 Grenoble Cédex 9, France
J. Appl. Phys. 84, 1263–1273 (1998)
Article history
Received:
December 15 1997
Accepted:
April 17 1998
Citation
Jean-Marc Bonard, Jean-Daniel Ganière, Lia Vanzetti, Jens J. Paggel, Lucia Sorba, Alfonso Franciosi, Denis Hervé, Engin Molva; Combined transmission electron microscopy and cathodoluminescence studies of degradation in electron-beam-pumped blue-green lasers. J. Appl. Phys. 1 August 1998; 84 (3): 1263–1273. https://doi.org/10.1063/1.368193
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