The linear morphological instability of a line of film on a substrate has been examined for contact angles between 0 and π. The base state of the line is an infinitely long cylinder with cross‐sectional shape a segment of a circle. We assume that mass flows by diffusion along the film surface and that local equilibrium holds. We find that for non‐zero contact angles there is a finite range of perturbation wavenumbers in the axial direction which correspond to instability and will potentially lead to agglomeration of the line of film. All unstable perturbations are of the varicose (sausage) type. The presence of the substrate is stabilizing; the range of unstable wavelengths is always less than that of a freely‐suspended circular cylinder with the same volume and decreases to zero width at zero contact angle. The maximum growth rate of the instability varies strongly with the contact angle and approaches zero as the contact angle approaches zero. Our results agree qualitatively with the experimentally observed wavelength and growth rates of the instability.
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15 May 1996
Research Article|
May 15 1996
Capillary instabilities in solid thin films: Lines
Matthew S. McCallum;
Matthew S. McCallum
Department of Materials Science and Department of Engineering Sciences and Applied Mathematics, McCormick School of Engineering and Applied Science, Northwestern University, Evanston, Illinois 60208
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Peter W. Voorhees;
Peter W. Voorhees
Department of Materials Science, McCormick School of Engineering and Applied Science, Northwestern University, Evanston, Illinois 60208
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Michael J. Miksis;
Michael J. Miksis
Department of Engineering Sciences and Applied Mathematics, McCormick School of Engineering and Applied Science, Northwestern University, Evanston, Illinois 60208
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Stephen H. Davis;
Stephen H. Davis
Department of Engineering Sciences and Applied Mathematics, McCormick School of Engineering and Applied Science, Northwestern University, Evanston, Illinois 60208
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Harris Wong
Harris Wong
Department of Materials Science and Department of Engineering Sciences and Applied Mathematics, McCormick School of Engineering and Applied Science, Northwestern University, Evanston, Illinois 60208
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Journal of Applied Physics 79, 7604–7611 (1996)
Article history
Received:
November 15 1995
Accepted:
February 02 1996
Citation
Matthew S. McCallum, Peter W. Voorhees, Michael J. Miksis, Stephen H. Davis, Harris Wong; Capillary instabilities in solid thin films: Lines. Journal of Applied Physics 15 May 1996; 79 (10): 7604–7611. https://doi.org/10.1063/1.362343
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