Diamond and carbonaceous films grown in a microwave assisted plasma reactor have been characterized by x‐ray diffraction, scanning electron microscopy, and Raman spectroscopy. This study is mainly focused on the identification of the different carbonaceous compounds which can coexist with the diamond depending on the synthesis parameters. Selective etching reactions and the excitation wavelength dependence of Raman cross sections of the different carbon species reveal that the broad and poorly structured Raman spectra in the 1100–1700 cm−1 region contain six components that arise from three different carbonaceous species: (i) one species is graphitic and is identified from the components at about 1350 and 1590 cm−1 which are resonantly enhanced as compared to the other components when the excitation energy is lowered from 3 to 2 eV. (ii) The second species is associated with the two broad bands at 1350 and 1550 cm−1 and is attributed to amorphous diamond‐like carbon (a‐C:H); both bands are resonantly enhanced by excitation energies in the range from 2.41 to 3.53 eV. These bands do not shift with exciting energy. (iii) The third species is associated with a band centered at about 1470 cm−1 and a weak band at 1150 cm−1. This 1470 cm−1 band overlaps with the 1550 cm−1 band of the diamond‐like component, resulting in an apparent frequency down‐shift when the incident photon energy decreases below the resonant enhancement range of the 1550 cm−1 band. Possible models for the structure of the third species are discussed.
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15 September 1994
Research Article|
September 15 1994
Analysis of the structure of multi‐component carbon films by resonant Raman scattering
B. Marcus;
B. Marcus
Institut National Polytechnique de Grenoble, ENS d’Electrochimie et d’Electrométallurgie de Grenoble, Laboratoire Science des Surfaces et Matériaux Carbonés URA CNRS 413, Domaine Universitaire, BP 75, F 38402 Saint‐Martin D’Heres, Cedex, France
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L. Fayette;
L. Fayette
Institut National Polytechnique de Grenoble, ENS d’Electrochimie et d’Electrométallurgie de Grenoble, Laboratoire Science des Surfaces et Matériaux Carbonés URA CNRS 413, Domaine Universitaire, BP 75, F 38402 Saint‐Martin D’Heres, Cedex, France
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M. Mermoux;
M. Mermoux
Institut National Polytechnique de Grenoble, ENS d’Electrochimie et d’Electrométallurgie de Grenoble, Laboratoire Science des Surfaces et Matériaux Carbonés URA CNRS 413, Domaine Universitaire, BP 75, F 38402 Saint‐Martin D’Heres, Cedex, France
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L. Abello;
L. Abello
Institut National Polytechnique de Grenoble, ENS d’Electrochimie et d’Electrométallurgie de Grenoble, Laboratoire Science des Surfaces et Matériaux Carbonés URA CNRS 413, Domaine Universitaire, BP 75, F 38402 Saint‐Martin D’Heres, Cedex, France
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G. Lucazeau
G. Lucazeau
Institut National Polytechnique de Grenoble, ENS d’Electrochimie et d’Electrométallurgie de Grenoble, Laboratoire Science des Surfaces et Matériaux Carbonés URA CNRS 413, Domaine Universitaire, BP 75, F 38402 Saint‐Martin D’Heres, Cedex, France
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J. Appl. Phys. 76, 3463–3470 (1994)
Article history
Received:
August 10 1993
Accepted:
June 09 1994
Citation
B. Marcus, L. Fayette, M. Mermoux, L. Abello, G. Lucazeau; Analysis of the structure of multi‐component carbon films by resonant Raman scattering. J. Appl. Phys. 15 September 1994; 76 (6): 3463–3470. https://doi.org/10.1063/1.357476
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