Band structures of n‐i‐n‐i doping superlattices are found using a self‐consistent calculation based on the envelope function formalism. The modulation potentials, the charge density distributions, the dispersion relationships, and the occupation of the subbands in the n‐i‐n‐i superlattices are computed and their dependence on temperature and the structural parameters of the superlattices are studied. It is found that the modulation potentials of n‐i‐n‐i doping superlattices are weak, and quantum effects are, therefore, also weak. The density of states in n‐i‐n‐i superlattices can be adjusted by varying the structural parameters of the superlattices. As a result, the n‐i‐n‐i doping superlattices behave like uniformly doped semiconductors with an adjustable density of states. The density of states is found to be temperature dependent. Electron mobilities of the n‐i‐n‐i doping superlattices are also computed. It is found that both impurity scattering processes that are observed in uniform lightly doped semiconductor and heavily doped semiconductor can coexist in the n‐i‐n‐i doping superlattices.
Skip Nav Destination
,
,
Article navigation
15 March 1993
Research Article|
March 15 1993
Electronic properties of n‐i‐n‐i doping superlattices
C. M. Tan;
C. M. Tan
Department of Electrical Engineering, University of Toronto, Toronto, Ontario M5S 1A4, Canada
Search for other works by this author on:
J. M. Xu;
J. M. Xu
Department of Electrical Engineering, University of Toronto, Toronto, Ontario M5S 1A4, Canada
Search for other works by this author on:
S. Zukotynski
S. Zukotynski
Department of Electrical Engineering, University of Toronto, Toronto, Ontario M5S 1A4, Canada
Search for other works by this author on:
C. M. Tan
J. M. Xu
S. Zukotynski
Department of Electrical Engineering, University of Toronto, Toronto, Ontario M5S 1A4, Canada
J. Appl. Phys. 73, 2921–2933 (1993)
Article history
Received:
April 16 1992
Accepted:
November 11 1992
Citation
C. M. Tan, J. M. Xu, S. Zukotynski; Electronic properties of n‐i‐n‐i doping superlattices. J. Appl. Phys. 15 March 1993; 73 (6): 2921–2933. https://doi.org/10.1063/1.353023
Download citation file:
Pay-Per-View Access
$40.00
Sign In
You could not be signed in. Please check your credentials and make sure you have an active account and try again.
Citing articles via
A step-by-step guide to perform x-ray photoelectron spectroscopy
Grzegorz Greczynski, Lars Hultman
Piezoelectric thin films and their applications in MEMS: A review
Jinpeng Liu, Hua Tan, et al.
Decoding diffraction and spectroscopy data with machine learning: A tutorial
D. Vizoso, R. Dingreville
Related Content
Investigation of trap emission kinetics in metal‐oxide‐semiconductor capacitors using a pump‐probe charge integrating technique
J. Appl. Phys. (March 1994)
Pump‐probe charge integrating technique: A study of trap emission kinetics in silicon dioxide
Appl. Phys. Lett. (June 1993)
Photoluminescence of deep levels in ion‐implanted AlxGa1−xAs
Appl. Phys. Lett. (April 1991)
Direct determination of praseodymium valence in Pr2(CoxFe1−x)14B
J. Appl. Phys. (July 1992)
Electro‐optic phenomena in gelatin‐based poled polymer
Appl. Phys. Lett. (July 1992)