The dependence of the excitonic lifetime on the well width in InGaAs/InP (unstrained), InGaAs/GaAs, and InGaAsP/InP strained quantum well heterostructures is investigated by time‐resolved photoluminescence spectroscopy. We show that the main contribution to the lifetime variation comes from the change of the exciton binding energy. In the strained InGaAs/GaAs wells, the widest wells have a shorter lifetime than expected. We attribute this to the onset of plastic relaxation.

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