Thin films of LiyV2O5 (0<y<1) were made by reactive dc magnetron sputtering of V followed by electrochemical treatment in LiClO4. X‐ray diffractometry showed an orthorhombic structure that varied from nanocrystalline (n‐X ) for unheated substrates to polycrystalline (p‐X ) for substrates at 180 °C. Optical absorption was measured at 0.3<λ<2.5 μm. The semiconductor bandgap lay fixed at ∼0.5 μm for p‐X LiyV2O5 and appeared blue‐shifted in proportion with y for n‐X Liy V2O5. At λ>0.5 μm there are absorption peaks associated with V4+ ions both for p‐X and n‐X materials, and a broad absorption feature for p‐X Liy V2O5 that is tentatively ascribed to electron hopping in the crystallographic b direction. The absorption goes up for increased y, as expected from the higher V4+ density.
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1 March 1991
Research Article|
March 01 1991
Structure and optical absorption of LiyV2O5 thin films
A. Talledo;
A. Talledo
Physics Department, Chalmers University of Technology and University of Gothenburg, S‐412 96 Gothenburg, Sweden
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A. M. Andersson;
A. M. Andersson
Physics Department, Chalmers University of Technology and University of Gothenburg, S‐412 96 Gothenburg, Sweden
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C. G. Granqvist
C. G. Granqvist
Physics Department, Chalmers University of Technology and University of Gothenburg, S‐412 96 Gothenburg, Sweden
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A. Talledo
A. M. Andersson
C. G. Granqvist
Physics Department, Chalmers University of Technology and University of Gothenburg, S‐412 96 Gothenburg, Sweden
J. Appl. Phys. 69, 3261–3265 (1991)
Article history
Received:
August 31 1990
Accepted:
November 13 1990
Citation
A. Talledo, A. M. Andersson, C. G. Granqvist; Structure and optical absorption of LiyV2O5 thin films. J. Appl. Phys. 1 March 1991; 69 (5): 3261–3265. https://doi.org/10.1063/1.348546
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