The effects of several microelectronic processing sequences on the high‐frequency surface resistance of the high‐temperature superconducting thin films in the TlCaBaCuO system have been examined. These processes include an acid etch, Br/alcohol etches, positive and negative photoresist sequences, and exposure to de‐ionized water. The surface resistance decreases during the Br etch, remains constant during the negative photoresist process, and increases moderately during the positive photoresist sequence and on exposure to water. The surface resistance increases dramatically on exposure to the acid solution as might be expected from other work. The effects of extended exposures to de‐ionized water and to Br etches on surface resistance are also presented.
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15 June 1991
Research Article|
June 15 1991
The effects of processing sequences on the microwave surface resistance of TlCaBaCuO Available to Purchase
J. S. Martens;
J. S. Martens
Sandia National Laboratories, Department 1140, Albuquerque, New Mexico 87185
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T. E. Zipperian;
T. E. Zipperian
Sandia National Laboratories, Department 1140, Albuquerque, New Mexico 87185
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D. S. Ginley;
D. S. Ginley
Sandia National Laboratories, Department 1140, Albuquerque, New Mexico 87185
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V. M. Hietala;
V. M. Hietala
Sandia National Laboratories, Department 1140, Albuquerque, New Mexico 87185
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C. P. Tigges;
C. P. Tigges
Sandia National Laboratories, Department 1140, Albuquerque, New Mexico 87185
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T. A. Plut
T. A. Plut
Sandia National Laboratories, Department 1140, Albuquerque, New Mexico 87185
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J. S. Martens
T. E. Zipperian
D. S. Ginley
V. M. Hietala
C. P. Tigges
T. A. Plut
Sandia National Laboratories, Department 1140, Albuquerque, New Mexico 87185
J. Appl. Phys. 69, 8268–8271 (1991)
Article history
Received:
February 08 1991
Accepted:
March 15 1991
Citation
J. S. Martens, T. E. Zipperian, D. S. Ginley, V. M. Hietala, C. P. Tigges, T. A. Plut; The effects of processing sequences on the microwave surface resistance of TlCaBaCuO. J. Appl. Phys. 15 June 1991; 69 (12): 8268–8271. https://doi.org/10.1063/1.347434
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