We have observed finite size effects in thin films (20 Å<L<1000 Å) of CuMn with concentrations of 4%, 7%, and 13.5% Mn. In order to have measurable magnetization the samples are produced in the form of multilayers with silicon or copper interlayers. The interlayers are sufficiently thick (tSi =70 Å; tCu =300 Å) so that there are no observable interactions between the CuMn layers. The samples are characterized structurally by low‐angle x‐ray diffraction, imaging, and x‐ray fluorescence using a scanning transmission electron microscope. The metallic films are also characterized by measuring the electrical resistivity of both multilayer and single‐layer CuMn samples. The temperature Tg of the peak in the dc susceptibility shifts with film thickness L as (T0gTg)/T0gL−λ for all concentrations and for both Si and Cu interlayers. The results for 4% Mn will be discussed in detail and compared with previously published data on 7% Mn.

1.
M. N. Barber, in Phase Transitions and Critical Phenomena, edited by C. Domb and J. L. Lebowitz (Academic, New York, 1983), Vol. 8, p. 145.
2.
K.
Binder
and
A. P.
Young
,
Rev. Mod. Phys.
58
,
801
(
1986
).
3.
L. P.
Levy
and
A. T.
Ogielski
,
Phys. Rev. Lett.
57
,
3288
(
1986
).
4.
G. G.
Kenning
,
J. M.
Slaughter
, and
J. A.
Cowen
,
Phys. Rev. Lett.
59
,
2596
(
1987
).
5.
L. J.
van der Pauw
,
Philips Res. Rep.
13
,
1
(
1958
).
6.
E. H.
Sondheimer
,
Adv. Phys.
1
,
1
(
1952
).
7.
J. Bass, in Landoldt‐Bornstein, edited by K. H. Hellwege and J. L. Olsen (Springer, Berlin, 1982), Vol. 15, p. 1.
8.
D. S.
Fisher
and
D. A.
Huse
,
Phys. Rev. B
36
,
8937
(
1987
).
This content is only available via PDF.
You do not currently have access to this content.