The effect of primary beam current and electron spot size on the Auger image resolution and signal‐to‐noise ratio (S/N) have been determined for field emission and thermionic emission sources. It is demonstrated that by use of a FE source and nA primary beam currents, an Auger image resolution of less than 1000 Å can be obtained. The major limitation to Auger spatial resolution is attributed to backscattered electrons. A LaB6 source is clearly superior to FE sources at primary beam currents of greater than 1×10−8 A.
REFERENCES
1.
N. C.
MacDonald
and J. R.
Waldrop
, Appl. Phys. Lett.
19
, 315
(1971
).2.
N. C. MacDonald, Scanning Electron Microscopy 1971, edited by Om Johari (IIT Research Institute, Chicago, 1971), p. 89.
3.
W. R. Bottoms, Scanning Electron Microscopy 1972, edited by Om Johari (IIT Research Institute, Chicago, 1972), p. 182.
4.
A. Christou, Scanning Electron Microscopy 1975, edited by Om Johari (IIT Research Institute, Chicago, 1975), p. 149.
5.
E. K. Brandis, F. W. Anderson, and R. Hoover, in Ref. 2, p. 505.
6.
7.
8.
A. V.
Crewe
, J.
Wall
, and L. M.
Welter
, J. Appl. Phys.
39
, 5861
(1968
).9.
M. E. Haine and V. E. Cosslett, Proc. Third Int. Conf. Electron Microscopy, London 1954, edited by R. Ross (Royal Microscopy Society, London, 1956), pp. 639–644.
10.
A. N. Broers, Proc. Fifth Int. Conf. on Electron and Ion Beam Science and Technology, 1972, edited by R. A. Bakish (Am. Vacuum Society, Houston, 1972), pp. 3–25.
11.
12.
13.
14.
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© 1976 American Institute of Physics.
1976
American Institute of Physics
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