A method for measuring the width of domain walls by Lorentz electron microscopy is presented and applied to the case of a single−crystal iron film. The method consists of measuring the domain wall image width at a number of defocusing distances and fitting the resulting curve to a theoretical curve of image width versus defocusing distance using the wall width and a parameter which is a function of the deviation of the beam as variables. The appearance of the wall images and the measured wall widths indicate that domain walls in single−crystal iron films around 1000 Å thick are 180 ° asymmetric and 90 ° symmetric or asymmetric types.
REFERENCES
1.
Harrison W.
Fuller
and Murray E.
Hale
, J. Appl. Phys.
31
, 238
(1960
).2.
3.
4.
5.
6.
7.
8.
9.
10.
11.
12.
R. H. Wade, in Electron Microscopy in Materials Science, edited by H. Valdre (Academic, New York, 1971), p. 680.
13.
D. Wohlleben, in Electron Microscopy in Materials Science, edited by H. Valdre (Academic, New York, 1971), p. 713.
14.
15.
16.
C. G.
Harrison
and K. D.
Leaver
, Phys. Status Solidi A
15
, 415
(1973
).17.
18.
C. G.
Harrison
and K. D.
Leaver
, Phys. Status Solidi A
12
, 413
(1972
).19.
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© 1975 American Institute of Physics.
1975
American Institute of Physics
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