The contrast in field ion microscope (FIM) images due to [110] symmetric tilt boundaries in a bcc lattice was systematically investigated for misorientations up to 26° by computer image simulation. In low‐angle grain boundaries there are three contrast effects: dislocation spirals, cusps in plane edges, and zone line displacement. The way in which those contrast effects develop with increasing tilt angle is discussed and illustrated with image simulations. An important result is that under favorable conditions contrast due to the boundary dislocations could still be resolved in the simulation of the high‐angle 26° boundary.

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