The detailed balance method of deriving the radiative‐recombination coefficient in semiconductors from the absorption curve is strictly applicable only when thermal quasiequilibrium exists for the carriers within each band. It is shown here that in many cases when the bands tail into the gap, the carriers are not in thermal equilibrium within the tail, even quite near the band edge, and that the detailed balance method requires modification. A simplified model, that of a regional bandgap variation, is suggested as an approximation to the complex band‐tailing situation. It is applied to measurements of photoluminescence and absorption in n‐type GaAs, of varying degrees of degeneracy, and values of the recombination constants at 296° and 77°K are derived. They are of the same magnitude as those in ideal material with no tailing. An uncertainty arises in degenerate material since it is not clear whether the reduced values of Burstein shift observed are entirely attributable to band shrinkage. The contribution of the deeper tail states to the luminescence often appears to be approximately independent of the separation of the state from the band edge.
Skip Nav Destination
Article navigation
December 1969
Research Article|
December 01 1969
Radiative Recombination and Equilibrium between Near‐Band‐Edge Tail States in n‐Type GaAs Available to Purchase
P. D. Southgate
P. D. Southgate
RCA Laboratories, Princeton, New Jersey 08540
Search for other works by this author on:
P. D. Southgate
RCA Laboratories, Princeton, New Jersey 08540
J. Appl. Phys. 40, 5333–5342 (1969)
Article history
Received:
May 28 1969
Citation
P. D. Southgate; Radiative Recombination and Equilibrium between Near‐Band‐Edge Tail States in n‐Type GaAs. J. Appl. Phys. 1 December 1969; 40 (13): 5333–5342. https://doi.org/10.1063/1.1657392
Download citation file:
Pay-Per-View Access
$40.00
Sign In
You could not be signed in. Please check your credentials and make sure you have an active account and try again.
Citing articles via
A step-by-step guide to perform x-ray photoelectron spectroscopy
Grzegorz Greczynski, Lars Hultman
Tutorial: Simulating modern magnetic material systems in mumax3
Jonas J. Joos, Pedram Bassirian, et al.
Piezoelectric thin films and their applications in MEMS: A review
Jinpeng Liu, Hua Tan, et al.
Related Content
Electroluminescent Gallium Arsenide Diodes with Negative Resistance
J. Appl. Phys. (August 1964)
Auger Recombination in GaAs
J. Appl. Phys. (December 1968)
Empirical determination of the energy band gap narrowing in p+ silicon heavily doped with boron
J. Appl. Phys. (November 2014)
Radiation efficiency of heavily doped bulk n -InP semiconductor
J. Appl. Phys. (July 2010)
Conduction Bands in In1−xAlxP
J. Appl. Phys. (September 1970)