This paper is designed to supplement the existing extensive literature on the conductivity of a randomly inhomogeneous medium, by treating the effects of inhomogeneities on piezoelectric, galvanomagnetic, and thermoelectric measurements. The scale of the inhomogeneities is supposed small compared with the dimensions of the specimen being measured, but large compared with mean free path, Debye length, etc. Formulas for all the effects are derived which are asymptotically exact in the limit of small fractional fluctuations in the local conductivity, etc. Comparison with other approximations and application to various exactly soluble cases show that these formulas are often roughly valid for quite sizable fluctuations. For material which, if uniform, would show a high field saturation of transverse magnetoresistance, the presence of appreciable inhomogeneities in the Hall constant will cause the magnetoresistance to increase indefinitely with field. This effect is due to the current distortions arising from the large and fluctuating Hall fields. For the special case of an isolated inclusion, these distortions are shown to extend, at high fields, to distances in the direction of the magnetic field which are many times the diameter of the inclusion. Under some conditions it appears that even the random distribution of impurities in a semiconductor can give rise to perceptible fluctuations on a scale large enough for concepts of macroscopic conduction to be applicable. Since fluctuations of even smaller scale are still larger, the total effect of fluctuations cannot be properly treated by the present methods; however, when the macroscopic part of the fluctuations is large, conventional impurity‐scattering theories must be inadequate. Applications to polycrystalline metals and semiconductors are discussed briefly.

1.
The experimental studies which have suggested to us the need for careful consideration of these perturbing factors include:
F. J.
Morin
,
T. H.
Geballe
, and
C.
Herring
,
Phys. Rev.
105
,
525
(
1957
) (piezoresistance);
C.
Herring
,
T. H.
Geballe
, and
J. E.
Kunzler
,
Phys. Rev.
111
,
36
(
1958
),
C.
Herring
,
T. H.
Geballe
, and
J. E.
Kunzler
,
Bell System Tech. J.
38
,
657
(
1959
) (thermomagnetic effects). The latter paper gives the most detailed discussion.
2.
I.
Isenberg
,
B. R.
Russell
, and
R. F.
Green
,
Rev. Sci. Inst.
19
,
685
(
1948
);
R. F.
Wick
,
J. Appl. Phys.
25
,
748
(
1956
);
H. J.
Lippmann
and
F.
Kuhrt
,
Z. Naturforschung
13a
,
462
(
1958
);
R. F.
Brown
,
Proc. Phys. Soc. (London)
71
,
500
(
1958
);
N. E.
Alekseevski
,
N. B.
Brandt
, and
T. I.
Kostina
,
J. Exptl. Theoret. Phys. (U.S.S.R.)
34
,
1339
(
1958
)
[translation:
Soviet Phys. JETP
7
,
924
(
1958
)].
3.
A concise summary of the various formulas and a list of the major references has been given by
J. A.
Reynolds
and
J. M.
Hough
,
Proc. Phys. Soc. (London)
B70
,
769
(
1957
).
4.
J.
Volger
,
Phys. Rev.
79
,
1023
(
1950
);
H.
Juretschke
,
R.
Landauer
, and
J. A.
Swanson
,
J. Appl. Phys.
27
,
838
(
1936
).
5.
S. V.
Ayrapetyants
,
J. Tech. Phys. (U.S.S.R.)
27
,
478
(
1957
)
[English translation:
S. V.
Ayrapetyants
,
Soviet Phys.‐Tech. Phys.
2
,
429
(
1958
)];
S. V.
Ayrapetyants
and
M. S.
Bresler
,
J. Tech. Phys. (U.S.S.R.)
28
,
1934
(
1958
)
[English translation:
Soviet Phys.‐Tech. Phys.
3
,
1778
(
1958
)].
6.
W. F.
Brown
, Jr.
,
J. Chem. Phys.
23
,
1514
(
1955
).
7.
A.
Nedoluha
,
Z. Physik
148
,
248
(
1957
).
8.
V. I.
Odelevski
,
J. Tech. Phys. (U. S.S. R.)
21
,
667
,
678
(
1951
).
9.
R.
Landauer
,
J. Appl. Phys.
23
,
779
(
1952
).
10.
See, for example, the probe profiles reported by W. P. Slichter and J. A. Burton, in Transistor Technology (D. Van Nostrand Company, Inc., Princeton, New Jersey, 1958), Vol. 1, Sec. 6.4.
11.
W. T.
Read
,
Phil. Mag.
45
,
775
,
1119
(
1954
);
W. T.
Read
,
46
,
111
(
1955
); ,
Philos. Mag.
R. A.
Logan
,
G. L.
Pearson
, and
D. A.
Kleinman
,
J. Appl. Phys.
30
,
885
(
1959
).
12.
A recent paper by
S. V.
Ayrapetyants
,
J. Tech. Phys. (U.S.S.R.)
28
,
1913
(
1958
)
[English translation:
Soviet Phys.‐Tech. Phys.
3
,
1758
(
1958
)], has independently called attention to the fact that purely random fluctuations in the impurity distribution in strongly compensated semiconductors can become quite appreciable over distances large enough to be treated macroscopically. Quantitative comparison of our estimates with his is impossible, since his expression (7), whose attainment of a value of order unity is supposed to signify sizable carrier fluctuations, does not seem to be dimensionless.
13.
T. H. Geballe and J. E. Kunzler (personal communication).
14.
F.
Seilz
,
Phys. Rev.
79
,
372
(
1950
).
15.
R. W.
Keyes
,
Phys. Rev.
109
,
43
(
1958
).
16.
See, for example,
C.
Herring
and
E.
Vogt
,
Phys. Rev.
101
,
944
(
1950
), Eqs. (16), (18), (20).
17.
J. M.
Ziman
,
Phil. Mag.
3
,
1117
(
1958
);
I. M.
Lifshits
and
V. G.
Peschanski
,
J. Exptl. Theoret. Phys. (U.S.S.R.)
35
,
1251
(
1958
)
[English translation:
Soviet Phys. JETP
8
,
875
(
1959
)].
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