The fast-emerging diverse applications using a variety of magnetic/non-magnetic heterostructure ultra-thin films warrant the sensitive characterization of the electrical, optical, and magnetic properties of the interface. As a practical alternate to the conventional magneto-optic Kerr effect (MOKE) method, we propose and demonstrate the spin-Hall effect of the light (SHEL)-based MOKE method with competitive sensitivity and scope for further improvement. The SHEL-MOKE technique is a versatile surface characterization tool for studying materials’ magnetic and dielectric ordering, which are extracted from the variations to the phase-polarization characteristics of a focused beam of light reflected at the interface, as a function of the applied magnetic field. Using this technique, we measure the magnetic field dependent complex Kerr angle and the coercivity in ultra-thin films of permalloy (Py) and at molybdenum disulfide (MoS)—permalloy (MSPy) hetero-structure interfaces. A comprehensive theoretical model and simulation data are provided to strengthen the potential of this simple non-invasive optical method. The theoretical model is subsequently applied to extract the optical conductivity of non-magnetic ultra-thin layers of MoS.
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High-sensitivity characterization of ultra-thin atomic layers using spin-Hall effect of light
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21 August 2022
Research Article|
August 16 2022
High-sensitivity characterization of ultra-thin atomic layers using spin-Hall effect of light
Janmey J. Panda
;
Janmey J. Panda
(Data curation, Methodology, Writing – original draft)
1
Tata Institute of Fundamental Research—Hyderabad
, Sy. No 36/P Serilingampally Mandal, Gopanpally Village, Hyderabad 500046, India
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Krishna R. Sahoo
;
Krishna R. Sahoo
(Data curation, Methodology, Writing – original draft)
1
Tata Institute of Fundamental Research—Hyderabad
, Sy. No 36/P Serilingampally Mandal, Gopanpally Village, Hyderabad 500046, India
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Aparna Praturi;
Aparna Praturi
(Data curation, Writing – original draft)
1
Tata Institute of Fundamental Research—Hyderabad
, Sy. No 36/P Serilingampally Mandal, Gopanpally Village, Hyderabad 500046, India
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Ashique Lal;
Ashique Lal
(Data curation, Methodology)
1
Tata Institute of Fundamental Research—Hyderabad
, Sy. No 36/P Serilingampally Mandal, Gopanpally Village, Hyderabad 500046, India
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Nirmal K. Viswanathan
;
Nirmal K. Viswanathan
a)
(Conceptualization, Funding acquisition, Writing – original draft)
2
School of Physics, University of Hyderabad
, Hyderabad 500046, Telangana, India
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Tharangattu N. Narayanan
;
Tharangattu N. Narayanan
b)
(Conceptualization, Funding acquisition, Methodology, Supervision, Writing – review & editing)
1
Tata Institute of Fundamental Research—Hyderabad
, Sy. No 36/P Serilingampally Mandal, Gopanpally Village, Hyderabad 500046, India
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G. Rajalakshmi
G. Rajalakshmi
c)
(Conceptualization, Funding acquisition, Methodology, Supervision, Writing – review & editing)
1
Tata Institute of Fundamental Research—Hyderabad
, Sy. No 36/P Serilingampally Mandal, Gopanpally Village, Hyderabad 500046, India
c)Author to whom correspondence should be addressed: raji@tifrh.res.in
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a)
Electronic mail: nirmalsp@uohyd.ac.in
b)
Electronic mail: tnn@tifrh.res.in
c)Author to whom correspondence should be addressed: raji@tifrh.res.in
J. Appl. Phys. 132, 075302 (2022)
Article history
Received:
June 09 2022
Accepted:
July 27 2022
Citation
Janmey J. Panda, Krishna R. Sahoo, Aparna Praturi, Ashique Lal, Nirmal K. Viswanathan, Tharangattu N. Narayanan, G. Rajalakshmi; High-sensitivity characterization of ultra-thin atomic layers using spin-Hall effect of light. J. Appl. Phys. 21 August 2022; 132 (7): 075302. https://doi.org/10.1063/5.0102355
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