High throughput nanoindentation techniques can provide rapid materials screening and property mapping and can span millimeter length scales and up to 106 data points. To facilitate rapid sorting of these data into similar groups, a necessary task for establishing structure–property relationships, use of an unsupervised machine learning analysis called clustering has grown in popularity. Here, a method is proposed and tested that evaluates the uncertainty associated with various clustering algorithms for an example high entropy alloy data set and explores the effect of the number of data points in a second Damascus steel data set. The proposed method utilizes the bootstrapping method of Efron to resample a modeled probability distribution function based upon the original data, which allows the uncertainty related to the clustering to be evaluated in contrast to the classical standard error on the mean calculations. For the Damascus, it was found that results data from a 104 point subsample are comparable to those from the full 106 set while representing a significant reduction in data acquisition.
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14 November 2022
Research Article|
November 08 2022
Automated analysis method for high throughput nanoindentation data with quantitative uncertainty
Special Collection:
Advances in Multi-Scale Mechanical Characterization
Bernard R. Becker;
Bernard R. Becker
(Conceptualization, Formal analysis, Investigation, Methodology)
1
Bruker Nano Surfaces & Metrology
, 9625 West 76th St., Eden Prairie, Minnesota 554344, USA
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Eric D. Hintsala;
Eric D. Hintsala
(Conceptualization, Methodology, Validation, Writing – original draft, Writing – review & editing)
1
Bruker Nano Surfaces & Metrology
, 9625 West 76th St., Eden Prairie, Minnesota 554344, USA
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Benjamin Stadnick;
Benjamin Stadnick
(Investigation, Software)
1
Bruker Nano Surfaces & Metrology
, 9625 West 76th St., Eden Prairie, Minnesota 554344, USA
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Ude D. Hangen;
Ude D. Hangen
(Investigation, Methodology)
2
Bruker Nano GmbH
, Dennewartstraße 25, 52068 Aachen, Germany
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Douglas D. Stauffer
Douglas D. Stauffer
a)
(Investigation, Project administration, Supervision, Writing – review & editing)
1
Bruker Nano Surfaces & Metrology
, 9625 West 76th St., Eden Prairie, Minnesota 554344, USA
a)Author to whom correspondence should be addressed: douglas.stauffer@bruker.com
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a)Author to whom correspondence should be addressed: douglas.stauffer@bruker.com
Note: This paper is part of the Special Topic on Advances in Multi-Scale Mechanical Characterization.
J. Appl. Phys. 132, 185101 (2022)
Article history
Received:
May 09 2022
Accepted:
September 15 2022
Citation
Bernard R. Becker, Eric D. Hintsala, Benjamin Stadnick, Ude D. Hangen, Douglas D. Stauffer; Automated analysis method for high throughput nanoindentation data with quantitative uncertainty. J. Appl. Phys. 14 November 2022; 132 (18): 185101. https://doi.org/10.1063/5.0098493
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