Laser-shock compression experiments at 3rd and 4th generation light sources generally employ phase plates, which are inserted into the beamline to achieve a repeatable intensity distribution at the focal plane. Here, the laser intensity profile is characterized by a high-contrast, high-frequency laser speckle. Without sufficient smoothing, these laser non-uniformities can translate to a significant pressure distribution within the sample layer and can affect data interpretation in x-ray diffraction experiments. Here, we use a combination of one- and two-dimensional velocity interferometry to directly measure the extent to which spatial frequencies within the laser focal spot intensity pattern are smoothed out during propagation within the laser plasma and a polyimide ablator. We find that the use of thicker polyimide layers results in spatially smoother shock fronts, with the greatest degree of smoothing associated with the highest spatial frequencies. Focal spots with the smallest initial speckle separation produce the most rapid smoothing. Laser systems that employ smoothing by spectral dispersion techniques to rapidly modulate the focal plane intensity distribution are shown to be the most effective ones in producing a spatially smooth shock front. We show that a simple transport model combined with the known polyimide Hugoniot adequately describes the extent of shock smoothness as a function of polyimide thickness. Our results provide a description of spatial structure smoothing across a shock front, which can be used to design targets on x-ray free electron laser facilities.
Skip Nav Destination
Measurement of shock roughness due to phase plate speckle imprinting relevant for x-ray diffraction experiments on 3rd and 4th generation light sources
Article navigation
7 November 2022
Research Article|
November 01 2022
Measurement of shock roughness due to phase plate speckle imprinting relevant for x-ray diffraction experiments on 3rd and 4th generation light sources
Martin G. Gorman
;
Martin G. Gorman
a)
(Data curation, Methodology, Writing – original draft, Writing – review & editing)
1
Lawrence Livermore National Laboratory
, P. O. Box 808, Livermore, California 94550, USA
a)Author to whom correspondence should be addressed: gorman11@llnl.gov
Search for other works by this author on:
Suzanne J. Ali
;
Suzanne J. Ali
(Conceptualization, Data curation, Formal analysis, Methodology, Writing – original draft, Writing – review & editing)
1
Lawrence Livermore National Laboratory
, P. O. Box 808, Livermore, California 94550, USA
Search for other works by this author on:
Peter M. Celliers
;
Peter M. Celliers
(Conceptualization, Software, Visualization, Writing – original draft, Writing – review & editing)
1
Lawrence Livermore National Laboratory
, P. O. Box 808, Livermore, California 94550, USA
Search for other works by this author on:
Jonathan L. Peebles
;
Jonathan L. Peebles
(Data curation, Formal analysis, Methodology)
2
Laboratory for Laser Energetics, University of Rochester
, Rochester, New York 14623-1299, USA
Search for other works by this author on:
David J. Erskine
;
David J. Erskine
(Formal analysis, Methodology)
1
Lawrence Livermore National Laboratory
, P. O. Box 808, Livermore, California 94550, USA
Search for other works by this author on:
James M. McNaney
;
James M. McNaney
(Conceptualization, Methodology, Writing – review & editing)
1
Lawrence Livermore National Laboratory
, P. O. Box 808, Livermore, California 94550, USA
Search for other works by this author on:
Jon H. Eggert
;
Jon H. Eggert
(Conceptualization, Methodology, Visualization, Writing – review & editing)
1
Lawrence Livermore National Laboratory
, P. O. Box 808, Livermore, California 94550, USA
Search for other works by this author on:
Raymond F. Smith
Raymond F. Smith
(Conceptualization, Data curation, Formal analysis, Writing – original draft, Writing – review & editing)
1
Lawrence Livermore National Laboratory
, P. O. Box 808, Livermore, California 94550, USA
Search for other works by this author on:
a)Author to whom correspondence should be addressed: gorman11@llnl.gov
J. Appl. Phys. 132, 175902 (2022)
Article history
Received:
August 02 2022
Accepted:
September 30 2022
Citation
Martin G. Gorman, Suzanne J. Ali, Peter M. Celliers, Jonathan L. Peebles, David J. Erskine, James M. McNaney, Jon H. Eggert, Raymond F. Smith; Measurement of shock roughness due to phase plate speckle imprinting relevant for x-ray diffraction experiments on 3rd and 4th generation light sources. J. Appl. Phys. 7 November 2022; 132 (17): 175902. https://doi.org/10.1063/5.0117905
Download citation file:
Sign in
Don't already have an account? Register
Sign In
You could not be signed in. Please check your credentials and make sure you have an active account and try again.
Could not validate captcha. Please try again.
Sign in via your Institution
Sign in via your InstitutionPay-Per-View Access
$40.00
Citing articles via
Related Content
Structures for mounting reed switches near the busbars of electrical installations with remote control of their position
AIP Conference Proceedings (March 2021)
Recovery of metastable dense Bi synthesized by shock compression
Appl. Phys. Lett. (March 2019)
Experimental study of laser penetration in overdense plasmas at relativistic intensities. II: Explosion of thin foils by laser driven fast electrons
Physics of Plasmas (June 1999)
Time-resolved resonant elastic soft x-ray scattering at Pohang Accelerator Laboratory X-ray Free Electron Laser
Rev. Sci. Instrum. (August 2020)
Development of slurry targets for high repetition-rate x-ray free electron laser experiments
J. Appl. Phys. (June 2022)