Glassy carbon substrates were implanted with 100 keV platinum ions. The implanted samples were analyzed using cross-sectional transmission electron microscopy (TEM) and x-ray photoelectron spectroscopy. Ion beam sputtering significantly affected the depth profile during platinum-ion implantation. Cross-sectional TEM revealed that the implanted platinum atoms were in the amorphous state and did not aggregate. Chemical state analysis of the platinum-ion-implanted glassy carbon substrates suggested that lattice defects in the substrates owing to the platinum-ion implantation caused the platinum–carbon interaction with electron transfer from platinum to carbon.
Morphology and chemical state of platinum ions implanted into glassy carbon substrates
Tetsuya Kimata, Sho Kato, Tomohiro Kobayashi, Shunya Yamamoto, Tetsuya Yamaki, Takayuki Terai; Morphology and chemical state of platinum ions implanted into glassy carbon substrates. J. Appl. Phys. 7 November 2022; 132 (17): 175303. https://doi.org/10.1063/5.0103520
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