Electromagnetically induced transparency (EIT) is a phenomenon that can provide strong and robust interfacing between optical signals and quantum coherence of electronic spins. In its archetypical form, mainly explored with atomic media, it uses a (near-)homogeneous ensemble of three-level systems, in which two low-energy spin-1/2 levels are coupled to a common optically excited state. We investigate the implementation of EIT with c-axis divacancy color centers in silicon carbide. While this material has attractive properties for quantum device technologies with near-IR optics, implementing EIT is complicated by the inhomogeneous broadening of the optical transitions throughout the ensemble and the presence of multiple ground-state levels. These may lead to darkening of the ensemble upon resonant optical excitation. Here, we show that EIT can be established with high visibility also in this material platform upon careful design of the measurement geometry. Comparison of our experimental results with a model based on the Lindblad equations indicates that we can create coherences between different sets of two levels all-optically in these systems, with potential impact for RF-free quantum sensing applications. Our work provides an understanding of EIT in multi-level systems with significant inhomogeneities, and our considerations are valid for a wide array of defects in semiconductors.
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7 March 2022
Research Article|
March 03 2022
Electromagnetically induced transparency in inhomogeneously broadened divacancy defect ensembles in SiC
Special Collection:
Defects in Semiconductors 2022
Olger V. Zwier;
Olger V. Zwier
1
Zernike Institute for Advanced Materials, University of Groningen
, NL-9474AG Groningen, The Netherlands
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Tom Bosma
;
Tom Bosma
1
Zernike Institute for Advanced Materials, University of Groningen
, NL-9474AG Groningen, The Netherlands
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Carmem M. Gilardoni
;
Carmem M. Gilardoni
a)
1
Zernike Institute for Advanced Materials, University of Groningen
, NL-9474AG Groningen, The Netherlands
a)Author to whom correspondence should be addressed: c.maia.gilardoni@rug.nl
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Xu Yang;
Xu Yang
1
Zernike Institute for Advanced Materials, University of Groningen
, NL-9474AG Groningen, The Netherlands
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Alexander R. Onur;
Alexander R. Onur
1
Zernike Institute for Advanced Materials, University of Groningen
, NL-9474AG Groningen, The Netherlands
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Takeshi Ohshima
;
Takeshi Ohshima
2
National Institutes for Quantum Science and Technology
, 1233 Watanuki, Takasaki, Gunma 370-1292, Japan
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Nguyen T. Son
;
Nguyen T. Son
3
Department of Physics, Chemistry and Biology, Linköping University
, S-581 83 Linköping, Sweden
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Caspar H. van der Wal
Caspar H. van der Wal
1
Zernike Institute for Advanced Materials, University of Groningen
, NL-9474AG Groningen, The Netherlands
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a)Author to whom correspondence should be addressed: c.maia.gilardoni@rug.nl
Note: This paper is part of the Special Topic on Defects in Semiconductors.
J. Appl. Phys. 131, 094401 (2022)
Article history
Received:
October 30 2021
Accepted:
February 06 2022
Citation
Olger V. Zwier, Tom Bosma, Carmem M. Gilardoni, Xu Yang, Alexander R. Onur, Takeshi Ohshima, Nguyen T. Son, Caspar H. van der Wal; Electromagnetically induced transparency in inhomogeneously broadened divacancy defect ensembles in SiC. J. Appl. Phys. 7 March 2022; 131 (9): 094401. https://doi.org/10.1063/5.0077112
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