The domain switching dynamics in a relaxor ferroelectric lanthanum-modified lead zirconate titanate thin film with 12 mol. % La was investigated by time-resolved x-ray diffraction. While most frequently epitaxial thin films are investigated, the present work reports results on a polycrystalline thin film. Asymmetric butterfly loops of the strain as a function of the applied electric field evidenced a built-in electric field oriented toward the thin film–substrate interface. The piezoelectric coefficient d33 (in the film reference frame) diminishes with the increasing frequency of an applied AC electric field. From the strain transient during the application of positive-up negative-down voltage pulse sequences with frequencies of up to 100 kHz, characteristic times of the order of 100–200 ns were determined for these relaxor ferroelectric thin films. While switching times ranging from the picosecond to the millisecond range are reported in the literature for different materials, these characteristic switching times are comparable to epitaxial lead zirconate titanate thin films of various compositions despite the polycrystallinity of the present thin film. However, the evidenced built-in electric field significantly influences the switching behavior for different polarities.
REFERENCES
1.
L. W.
Martin
and A. M.
Rappe
, “Thin-film ferroelectric materials and their applications
,” Nat. Rev. Mater.
2
, 16087
(2017
). 2.
D.
Damjanovic
and R. E.
Newnham
, “Electrostrictive and piezoelectric materials for actuator applications
,” J. Intell. Mater. Syst. Struct.
3
, 190
–208
(1992
). 3.
D.
Damjanovic
, “Hysteresis in piezoelectric and ferroelectric materials
,” Sci. Hysteresis
3
, 337
–465
(2006
). 4.
B.
Noheda
, D. E.
Cox
, G.
Shirane
, J. A.
Gonzalo
, L. E.
Cross
, and S.-E.
Park
, “A monoclinic ferroelectric phase in the Pb(Zr1-xTix)O3 solid solution
,” Appl. Phys. Lett.
74
, 2059
(1999
). 5.
B.
Noheda
, J. A.
Gonzalo
, L. E.
Cross
, R.
Guo
, S.-E.
Park
, D. E.
Cox
, and G.
Shirane
, “Tetragonal-to-monoclinic phase transition in a ferroelectric perovskite: The structure of PbZr0.52Ti0.48O3
,” Phys. Rev. B
61
, 8687
(2000
). 6.
B.
Sahoo
and P. K.
Panda
, “Effect of lanthanum, neodymium on piezoelectric, dielectric and ferroelectric properties of PZT
,” J. Adv. Ceram.
2
, 37
–41
(2013
). 7.
Q.
Zou
, H.
Ruda
, B.
Yacobi
, and M.
Farrell
, “Microstructural characterization of donor-doped lead zirconate titanate films prepared by sol-gel processing
,” Thin Solid Films
402
, 65
–70
(2002
). 8.
S.
Aggarwal
and R.
Ramesh
, “Point defect chemistry of metal oxide heterostructures
,” Annu. Rev. Mater. Sci.
28
, 463
(1998
). 9.
M. E.
Lines
and A. M.
Glass
, Principles and Applications of Ferroelectrics and Related Materials
(Clarendon
, Oxford
, 1977
).10.
G.
Burns
and F. H.
Dacol
, “Crystalline ferroelectrics with glassy polarization behaviour
,” Phys. Rev. B
28
, 2527
–2530
(1983
). 11.
L. E.
Cross
, “Relaxor ferroelectrics
,” Ferroelectrics
76
, 241
–267
(2011
). 12.
R. E.
Cohen
, “Relaxors go critical
,” Nature
441
, 941
–942
(2006
). 13.
H.
Fu
and R. E.
Cohen
, “Polarization rotation mechanism for ultrahigh electrochemical response in single-crystal piezoelectrics
,” Nature
403
, 281
(2000
). 14.
S.-E.
Park
and T. R.
Shrout
, “Ultrahigh strain and piezoelectric behavior in relaxor based ferroelectric single crystals
,” J. Appl. Phys.
82
, 1804
–1811
(1997
). 15.
A.
Kholkin
, A.
Morozovska
, D.
Kiselev
, I.
Bdikin
, B.
Rodriguez
, P.
Wu
, A.
Bokov
, Z.-G.
Ye
, B.
Dkhil
, L.-Q.
Chen
, M.
Kosec
, and S. V.
Kalinin
, “Surface domain structure and mesoscopic phase transition in relaxor ferroelectrics
,” Adv. Funct. Mater.
21
, 1977
(2011
). 16.
G. H.
Haertling
, “Ferroelectric ceramics history and technology
,” J. Am. Ceram. Soc.
82
, 797
(1999
). 17.
P.
Poosanaas
and K.
Uchino
, “Photostrictive effect in lanthanum-modified lead zirconate titanate ceramics near the morphotropic phase boundary
,” Mater. Chem. Phys.
61
, 36
(1999
). 18.
A. L.
Kholkin
, Ch.
Wütchrich
, D. V.
Taylor
, and N.
Setter
, “Interferometric measurements of electric field-induced displacements in piezoelectric thin films
,” Rev. Sci. Instrum.
67
, 1935
(1996
). 19.
J.
Young
, P.
Chen
, R. J.
Sichel
, S. J.
Callori
, J.
Sinsheimer
, E. M.
Dufresne
, M.
Dawber
, and P. G.
Evans
, “Nanosecond dynamics of ferroelectric/dielectric superlattices
,” Phys. Rev. Lett.
107
, 055501
(2011
). 20.
S.
Gorfman
, H.
Simons
, T.
Iamsasri
, S.
Prasertpalichat
, D. P.
Cann
, H.
Choe
, U.
Pietsch
, Y.
Watter
, and J. L.
Jones
, “Simultaneous resonant x-ray diffraction measurement of polarization inversion and lattice strain in polycrystalline ferroelectrics
,” Sci. Rep.
6
, 20829
(2016
). 21.
A.
Pramanick
, D.
Damjanovic
, J. E.
Daniels
, J. C.
Nino
, and J. L.
Jones
, “Origins of electro-mechanical coupling in polycrystalline ferroelectrics during subcoercive electrical loading
,” J. Am. Ceram. Soc.
94
, 293
–309
(2011
). 22.
S.
Gorfman
, O.
Schmidt
, V.
Tsirelson
, M.
Ziolkowski
, and U.
Pietsch
, “Crystallography under external electric field
,” Z. Anorg. Allg. Chem.
639
, 1953
–1962
(2013
). 23.
J.
Wooldridge
, S.
Ryding
, S.
Brown
, T. L.
Burnett
, M. G.
Cain
, R.
Cernik
, R.
Hino
, M.
Stewart
, and P.
Thompson
, “Simultaneous measurement of x-ray diffraction and ferroelectric polarization data as a function of applied electric field and frequency
,” J. Synchrotron Radiat.
19
, 710
(2012
). 24.
K.
Nguyen
, E.
Bellec
, E.
Zatterin
, G.
Le Rhum
, P.
Gergaud
, and N.
Vaxelaire
, “Structural insights of electrical aging in PZT thin films as revealed by in situ biasing x-ray diffraction
,” Materials
14
, 4500
(2021
). 25.
C.
Kwamen
, M.
Rössle
, W.
Leitenberger
, M.
Alexe
, and M.
Bargheer
, “Time-resolved x-ray diffraction study of the structural dynamics in an epitaxial ferroelectric thin Pb(Zr0.2Ti0.8)O3 film induced by sub-coercive fields
,” Appl. Phys. Lett.
114
, 162907
(2019
). 26.
C. M.
Fancher
, H.
Choe
, S.
Gorman
, H.
Simons
, C. C.
Chung
, M.
Ziolkowski
, S.
Prasertpalichat
, D. P.
Cann
, and J. L.
Jones
, “Effect of alloying BaTiO3 with BiZn1/2Ti1/2O3 on polarization reversal
,” Appl. Phys. Lett.
117
, 042907
(2020
). 27.
A.
Davydok
, T. W.
Cornelius
, C.
Mocuta
, E. C.
Lima
, E. B.
Araùjo
, and O.
Thomas
, “In situ x-ray diffraction studies on the piezoelectric response of PZT thin films
,” Thin Solid Films
603
, 29
–33
(2016
). 28.
K. S.
Lee
, Y. K.
Kim
, S.
Baik
, J.
Kim
, and II. S.
Jung
, “In situ observation of ferroelectric 90°-domain switching in epitaxial Pb(Zr,Ti)O3 thin films by synchrotron x-ray diffraction
,” Appl. Phys. Lett.
79
, 2444
(2001
). 29.
I.
Baturin
, N.
Menou
, V.
Shur
, C.
Muller
, D.
Kuznetsov
, J.-L.
Hodeau
, and A.
Sternberg
, “Influence of irradiation on the switching behavior in PZT thin films
,” Mater. Sci. Eng. B
120
, 141
–145
(2005
). 30.
J. L.
Cao
, K.
Zhang
, A.
Solbach
, Z.
Yue
, H. H.
Wang
, Yu.
Chen
, and U.
Klemradt
, “In situ x-ray reflectivity study of imprint in ferroelectric thin films
,” Mater. Sci. Forum
687
, 292
–296
(2011
). 31.
C.
Kwamen
, M.
Rössle
, M.
Reinhardt
, W.
Leitenberger
, F.
Zamponi
, M.
Alexe
, and M.
Bargheer
, “Simultaneous dynamic characterization of charge and structural motion during ferroelectric switching
,” Phys. Rev. B
96
, 134105
(2017
). 32.
T. W.
Cornelius
, C.
Moctua
, S.
Escoubas
, L. R. M.
Lima
, E. B.
Araújo
, A. L.
Kholkin
, and O.
Thomas
, “Piezoelectric properties of Pb1–xLax(Zr0.52Ti0.48)O3 thin films studied by in situ x-ray diffraction
,” Materials
13
, 3338
(2020
). 33.
M.
Rössle
, W.
Leitenberger
, M.
Reinhardt
, A.
Koç
, J.
Pudell
, C.
Kwamen
, and M.
Bargheer
, “The time-resolved hard x-ray diffraction endstation KMC-3 XPP at BESSY II
,” J. Synchrotron Radiat.
28
, 948
–960
(2021
). 34.
N.
Setter
, D.
Damjanovic
, L.
Eng
, G.
Fox
, S.
Gevorgian
, S.
Hong
, A.
Kingon
, H.
Kohlstedt
, N. Y.
Park
, G. B.
Stephenson
, I.
Stolitchnov
, A. K.
Taganstev
, D. V.
Taylor
, T.
Yamada
, and S.
Streiffer
, “Ferroelectric thin films: Review of materials, properties, and applications
,” J. Appl. Phys.
100
, 051606
(2006
). 35.
T. K.
Song
, Y. W.
So
, D. J.
Kim
, J. Y.
Jo
, and T. W.
Noh
, “Ferroelectric switching dynamics and pulse-switching polarization measurements
,” Integr. Ferroelectr.
78
, 191
–197
(2006
). 36.
J. F.
Scott
et al., “Switching kinetics of lead zirconate titanate submicron thin-film memories
,” J. Appl. Phys.
64
, 787
–792
(1988
). 37.
V. Ya.
Shur
et al., “Switching kinetics in epitaxial PZT thin films
,” Microelectron. Eng.
29
, 153
–157
(1995
). 38.
Y. W.
So
, D. J.
Kim
, T. W.
Noh
, J.-G.
Yoon
, and T. K.
Song
, “Polarization switching kinetics of epitaxial Pb(Zr0.4Ti0.6)O3 thin films
,” Appl. Phys. Lett.
86
, 092905
(2005
). 39.
A.
Gruverman
, B. J.
Rodriguez
, C.
Dehoff
, J. D.
Waldrep
, A. I.
Kingon
, R. J.
Nemanich
, and J. S.
Cross
, “Direct studies of domain switching dynamics in thin film ferroelectric capacitors
,” Appl. Phys. Lett.
87
, 082902
(2005
). 40.
A. K.
Tagantsev
, I.
Stolichnov
, N.
Setter
, J. S.
Cross
, and M.
Tsukada
, “Non-Kolmogorov-Avrami switching kinetics in ferroelectric thin films
,” Phys. Rev. B
66
, 214109
(2002
). 41.
W. J.
Merz
, J. Phys. Rev.
95
, 690
(1954
). © 2022 Author(s). Published under an exclusive license by AIP Publishing.
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